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Author :
Publisher :
ISBN 13 :
Total Pages : 800 pages
Book Rating : 4.F/5 ( download)
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author : Peter W. Hawkes
Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)
Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author : United States. National Bureau of Standards. Technical Information and Publications Division
Publisher :
ISBN 13 :
Total Pages : 788 pages
Book Rating : 4.3/5 (91 download)
Download or read book Catalog of National Bureau of Standards Publications, 1966-1976: Key word index written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 788 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher : ASM International
ISBN 13 : 0871707691
Total Pages : 160 pages
Book Rating : 4.8/5 (717 download)
Download or read book Microelectronic Failure Analysis written by and published by ASM International. This book was released on 2002-01-01 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 788 pages
Book Rating : 4.:/5 (31 download)
Download or read book Catalog of National Bureau of Standards Publications, 1966-1976 written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 788 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 548 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 544 pages
Book Rating : 4.:/5 (318 download)
Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1974 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 746 pages
Book Rating : 4.:/5 (31 download)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1977 with total page 746 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A.G Cullis
Publisher : CRC Press
ISBN 13 : 1482268698
Total Pages : 775 pages
Book Rating : 4.4/5 (822 download)
Download or read book Microscopy of Semiconducting Materials written by A.G Cullis and published by CRC Press. This book was released on 2000-01-01 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigat
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 540 pages
Book Rating : 4.:/5 (42 download)
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 742 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications of the National Bureau of Standards, 1976 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 490 pages
Book Rating : 4.3/5 (91 download)
Download or read book Scanning Electron Microscopy written by and published by . This book was released on 1985 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 536 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications of the National Bureau of Standards, 1974 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alain Claverie
Publisher : John Wiley & Sons
ISBN 13 : 1118579054
Total Pages : 280 pages
Book Rating : 4.1/5 (185 download)
Download or read book Transmission Electron Microscopy in Micro-nanoelectronics written by Alain Claverie and published by John Wiley & Sons. This book was released on 2013-01-29 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. This book presents in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientists and process engineers have to face to develop or optimize semiconductor layers and devices. Several of these techniques are based on electron holography; others take advantage of the possibility of focusing intense beams within nanoprobes. Strain measurements and mappings, dopant activation and segregation, interfacial reactions at the nanoscale, defect identification and specimen preparation by FIB are among the topics presented in this book. After a brief presentation of the underlying theory, each technique is illustrated through examples from the lab or fab.
Author : United States. National Bureau of Standards. Technical Information and Publications Division
Publisher :
ISBN 13 :
Total Pages : 804 pages
Book Rating : 4.3/5 (91 download)
Download or read book Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1 Citations and abstracts. v. 2. pt. 1. Key word index (A through L). v. 2. pt. 2. Key word index (M through Z) written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ludwig Reimer
Publisher : Springer
ISBN 13 : 3662135620
Total Pages : 476 pages
Book Rating : 4.6/5 (621 download)
Download or read book Scanning Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a counterpart to Transmission Electron Microscopy (Vol. 36 of this Springer Series in Optical Sciences) . The book evolved from lectures delivered at the University of Münster and from a German text entitled Raster-Elektronenmikroskopie (Springer-Verlag), published in collaboration with my colleague Gerhard Pfefferkorn. In the introductory chapter, the principles of the SEM and of electron specimen interactions are described, the most important imaging modes and their associated contrast are summarized, and general aspects of eiemental analysis by x-ray and Auger electron emission are discussed. The electron gun and electron optics are discussed in Chap. 2 in order to show how an electron probe of small diameter can be formed, how the elec tron beam can be blanked at high frequencies for time-resolving exper iments and what problems have tobe taken into account when focusing.
