RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

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Author :
Publisher : Springer Nature
ISBN 13 : 3030777758
Total Pages : 173 pages
Book Rating : 4.0/5 (37 download)

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Book Synopsis RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors by : Keith A. Jenkins

Download or read book RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors written by Keith A. Jenkins and published by Springer Nature. This book was released on 2021-12-15 with total page 173 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs. Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understand the relationship between these measurements and traditional, conventional DC characteristics.

Radio Frequency Transistors

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Author :
Publisher : Newnes
ISBN 13 : 0750672811
Total Pages : 317 pages
Book Rating : 4.7/5 (56 download)

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Book Synopsis Radio Frequency Transistors by : Norman Dye

Download or read book Radio Frequency Transistors written by Norman Dye and published by Newnes. This book was released on 2001 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: This newly revised edition adds two entirely new chapters, one of LDMOS high power RF transistors and how they differ from bipolars, and TMOS FETs, etc. as well as another chapter on designing high power RF amplifiers using LDMOS.

A Time Domain Method of Measuring Transistor Parameters for Complete Small Signal Characterization Up to 1 Gc

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Publisher :
ISBN 13 :
Total Pages : 96 pages
Book Rating : 4.:/5 (227 download)

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Book Synopsis A Time Domain Method of Measuring Transistor Parameters for Complete Small Signal Characterization Up to 1 Gc by : Frank Richard Davis

Download or read book A Time Domain Method of Measuring Transistor Parameters for Complete Small Signal Characterization Up to 1 Gc written by Frank Richard Davis and published by . This book was released on 1965 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes a method of measuring transistor small signal parameters over a wide frequency range using time domain techniques. A sampling oscilloscope and tunnel diode pulse generator are used to obtain five times response curves from the transistor which is inserted into a 50 ohm coaxial air-dielectric transmission line. A digital computer is used to perform frequency spectrum analysis on the curves, and to calculate the open and short circuit parameters for complete characterization of the transistor. The hybrid parameters of an RC network and three transistors were measured and compared with measurements made in the frequency domain. Good agreement was obtained between methods up to 500 Mc with reduced accuracy to 1 Gc. (Author).

Technical Abstract Bulletin

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Publisher :
ISBN 13 :
Total Pages : 484 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Technical Abstract Bulletin by :

Download or read book Technical Abstract Bulletin written by and published by . This book was released on 1978 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Modeling and Characterization of RF and Microwave Power FETs

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Publisher :
ISBN 13 : 9780511374852
Total Pages : 362 pages
Book Rating : 4.3/5 (748 download)

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Book Synopsis Modeling and Characterization of RF and Microwave Power FETs by : Peter H. Aaen

Download or read book Modeling and Characterization of RF and Microwave Power FETs written by Peter H. Aaen and published by . This book was released on 2007 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Electromagnetic Compatibility, 1979

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Publisher :
ISBN 13 :
Total Pages : 624 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Electromagnetic Compatibility, 1979 by : Tomáš Dvořák

Download or read book Electromagnetic Compatibility, 1979 written by Tomáš Dvořák and published by . This book was released on 1979 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt:

RF and Microwave Power Amplifier Design

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Publisher : McGraw Hill Professional
ISBN 13 : 0071782990
Total Pages : 433 pages
Book Rating : 4.0/5 (717 download)

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Book Synopsis RF and Microwave Power Amplifier Design by : Andrei Grebennikov

Download or read book RF and Microwave Power Amplifier Design written by Andrei Grebennikov and published by McGraw Hill Professional. This book was released on 2004-09-15 with total page 433 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a rigorous tutorial on radio frequency and microwave power amplifier design, teaching the circuit design techniques that form the microelectronic backbones of modern wireless communications systems. Suitable for self-study, corporate training, or Senior/Graduate classroom use, the book combines analytical calculations and computer-aided design techniques to arm electronic engineers with every possible method to improve their designs and shorten their design time cycles.

International Aerospace Abstracts

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Publisher :
ISBN 13 :
Total Pages : 974 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis International Aerospace Abstracts by :

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1999 with total page 974 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scientific and Technical Aerospace Reports

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Publisher :
ISBN 13 :
Total Pages : 702 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fundamentals of Semiconductor Manufacturing and Process Control

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Publisher : John Wiley & Sons
ISBN 13 : 0471790273
Total Pages : 428 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Fundamentals of Semiconductor Manufacturing and Process Control by : Gary S. May

Download or read book Fundamentals of Semiconductor Manufacturing and Process Control written by Gary S. May and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.

Chemical Abstracts

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Publisher :
ISBN 13 :
Total Pages : 2540 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Chemical Abstracts by :

Download or read book Chemical Abstracts written by and published by . This book was released on 2002 with total page 2540 pages. Available in PDF, EPUB and Kindle. Book excerpt:

CMOS

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Publisher : CRC Press
ISBN 13 : 1351832018
Total Pages : 589 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis CMOS by : Angelo Rivetti

Download or read book CMOS written by Angelo Rivetti and published by CRC Press. This book was released on 2018-09-03 with total page 589 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS: Front-End Electronics for Radiation Sensors offers a comprehensive introduction to integrated front-end electronics for radiation detectors, focusing on devices that capture individual particles or photons and are used in nuclear and high energy physics, space instrumentation, medical physics, homeland security, and related fields. Emphasizing practical design and implementation, this book: Covers the fundamental principles of signal processing for radiation detectors Discusses the relevant analog building blocks used in the front-end electronics Employs systematically weak and moderate inversion regimes in circuit analysis Makes complex topics such as noise and circuit-weighting functions more accessible Includes numerical examples where appropriate CMOS: Front-End Electronics for Radiation Sensors provides specialized knowledge previously obtained only through the study of multiple technical and scientific papers. It is an ideal text for students of physics and electronics engineering, as well as a useful reference for experienced practitioners.

Semiconductor Material and Device Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Current Research in Britain

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Publisher :
ISBN 13 :
Total Pages : 1234 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Current Research in Britain by :

Download or read book Current Research in Britain written by and published by . This book was released on 1985 with total page 1234 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Index to Theses with Abstracts Accepted for Higher Degrees by the Universities of Great Britain and Ireland and the Council for National Academic Awards

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Publisher :
ISBN 13 :
Total Pages : 356 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Index to Theses with Abstracts Accepted for Higher Degrees by the Universities of Great Britain and Ireland and the Council for National Academic Awards by :

Download or read book Index to Theses with Abstracts Accepted for Higher Degrees by the Universities of Great Britain and Ireland and the Council for National Academic Awards written by and published by . This book was released on 2005 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Detector Systems

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Publisher : OUP Oxford
ISBN 13 : 0191523658
Total Pages : 513 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis Semiconductor Detector Systems by : Helmuth Spieler

Download or read book Semiconductor Detector Systems written by Helmuth Spieler and published by OUP Oxford. This book was released on 2005-08-25 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor sensors patterned at the micron scale combined with custom-designed integrated circuits have revolutionized semiconductor radiation detector systems. Designs covering many square meters with millions of signal channels are now commonplace in high-energy physics and the technology is finding its way into many other fields, ranging from astrophysics to experiments at synchrotron light sources and medical imaging. This book is the first to present a comprehensive discussion of the many facets of highly integrated semiconductor detector systems, covering sensors, signal processing, transistors and circuits, low-noise electronics, and radiation effects. The diversity of design approaches is illustrated in a chapter describing systems in high-energy physics, astronomy, and astrophysics. Finally a chapter "Why things don't work" discusses common pitfalls. Profusely illustrated, this book provides a unique reference in a key area of modern science.

Transistor Level Modeling for Analog/RF IC Design

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Publisher : Springer Science & Business Media
ISBN 13 : 1402045565
Total Pages : 298 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Transistor Level Modeling for Analog/RF IC Design by : Wladyslaw Grabinski

Download or read book Transistor Level Modeling for Analog/RF IC Design written by Wladyslaw Grabinski and published by Springer Science & Business Media. This book was released on 2006-07-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor modeling. The variety of subjects and the high quality of content of this volume make it a reference document for researchers and users of MOSFET devices and models. The book can be recommended to everyone who is involved in compact model developments, numerical TCAD modeling, parameter extraction, space-level simulation or model standardization. The book will appeal equally to PhD students who want to understand the ins and outs of MOSFETs as well as to modeling designers working in the analog and high-frequency areas.