Reliable Integrated Circuits Design And Test At Sub 45nm Technologies

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Embedded Systems: Design, Analysis and Verification

Author : Gunar Schirner
Publisher : Springer
ISBN 13 : 3642388531
Total Pages : 368 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Embedded Systems: Design, Analysis and Verification by : Gunar Schirner

Download or read book Embedded Systems: Design, Analysis and Verification written by Gunar Schirner and published by Springer. This book was released on 2013-06-13 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, held in Paderborn, Germany, in June 2013. The 22 full revised papers presented together with 8 short papers were carefully reviewed and selected from 42 submissions. The papers have been organized in the following topical sections: design methodologies; non-functional aspects of embedded systems; verification; performance analysis; real-time systems; embedded system applications; and real-time aspects in distributed systems. The book also includes a special chapter dedicated to the BMBF funded ARAMIS project on Automotive, Railway and Avionics Multicore Systems.

VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 792 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Circuit Design for Reliability

Author : Ricardo Reis
Publisher : Springer
ISBN 13 : 1461440785
Total Pages : 271 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Circuit Design for Reliability by : Ricardo Reis

Download or read book Circuit Design for Reliability written by Ricardo Reis and published by Springer. This book was released on 2014-11-08 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

VLSI Design and Test

Author : Manoj Singh Gaur
Publisher : Springer
ISBN 13 : 3642420249
Total Pages : 403 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis VLSI Design and Test by : Manoj Singh Gaur

Download or read book VLSI Design and Test written by Manoj Singh Gaur and published by Springer. This book was released on 2013-12-13 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Author : Rodrigo Possamai Bastos
Publisher : Springer Nature
ISBN 13 : 303029353X
Total Pages : 187 pages
Book Rating : 4.0/5 (32 download)

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Book Synopsis On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits by : Rodrigo Possamai Bastos

Download or read book On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits written by Rodrigo Possamai Bastos and published by Springer Nature. This book was released on 2019-09-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.

Predictive Technology Model for Robust Nanoelectronic Design

Author : Yu Cao
Publisher : Springer Science & Business Media
ISBN 13 : 1461404452
Total Pages : 186 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Predictive Technology Model for Robust Nanoelectronic Design by : Yu Cao

Download or read book Predictive Technology Model for Robust Nanoelectronic Design written by Yu Cao and published by Springer Science & Business Media. This book was released on 2011-07-12 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Lifetime Reliability-aware Design of Integrated Circuits

Author : Mohsen Raji
Publisher : Springer Nature
ISBN 13 : 3031153456
Total Pages : 113 pages
Book Rating : 4.0/5 (311 download)

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Book Synopsis Lifetime Reliability-aware Design of Integrated Circuits by : Mohsen Raji

Download or read book Lifetime Reliability-aware Design of Integrated Circuits written by Mohsen Raji and published by Springer Nature. This book was released on 2022-11-16 with total page 113 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.

Device Circuit Co-Design Issues in FETs

Author : Shubham Tayal
Publisher : CRC Press
ISBN 13 : 1000926427
Total Pages : 280 pages
Book Rating : 4.0/5 (9 download)

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Book Synopsis Device Circuit Co-Design Issues in FETs by : Shubham Tayal

Download or read book Device Circuit Co-Design Issues in FETs written by Shubham Tayal and published by CRC Press. This book was released on 2023-08-22 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of emerging semiconductor devices and their applications in electronic circuits, which form the foundation of electronic devices. Device Circuit Co-Design Issues in FETs provides readers with a better understanding of the ever-growing field of low-power electronic devices and their applications in the wireless, biosensing, and circuit domains. The book brings researchers and engineers from various disciplines of the VLSI domain together to tackle the emerging challenges in the field of engineering and applications of advanced low-power devices in an effort to improve the performance of these technologies. The chapters examine the challenges and scope of FinFET device circuits, 3D FETs, and advanced FET for circuit applications. The book also discusses low-power memory design, neuromorphic computing, and issues related to thermal reliability. The authors provide a good understanding of device physics and circuits, and discuss transistors based on the new channel/dielectric materials and device architectures to achieve low-power dissipation and ultra-high switching speeds to fulfill the requirements of the semiconductor industry. This book is intended for students, researchers, and professionals in the field of semiconductor devices and nanodevices, as well as those working on device-circuit co-design issues.

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis

Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030905
Total Pages : 372 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis by : ASM International

Download or read book ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2007-01-01 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session

Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition

Author :
Publisher : ScholarlyEditions
ISBN 13 : 1490109900
Total Pages : 647 pages
Book Rating : 4.4/5 (91 download)

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Book Synopsis Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition by :

Download or read book Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition written by and published by ScholarlyEditions. This book was released on 2013-05-01 with total page 647 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition is a ScholarlyEditions™ book that delivers timely, authoritative, and comprehensive information about Computer Security. The editors have built Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Computer Security in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

ISTFA 2011

Author :
Publisher : ASM International
ISBN 13 : 1615038507
Total Pages : 479 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis ISTFA 2011 by :

Download or read book ISTFA 2011 written by and published by ASM International. This book was released on 2011 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology

Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254611
Total Pages : 798 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology by : Luciano Lavagno

Download or read book Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology written by Luciano Lavagno and published by CRC Press. This book was released on 2017-02-03 with total page 798 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology thoroughly examines real-time logic (RTL) to GDSII (a file format used to transfer data of semiconductor physical layout) design flow, analog/mixed signal design, physical verification, and technology computer-aided design (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability (DFM) at the nanoscale, power supply network design and analysis, design modeling, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on 3D circuit integration and clock design Offering improved depth and modernity, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Integrated Circuit and System Design: Power and Timing Modeling, Optimization and Simulation

Author : José Monteiro
Publisher : Springer Science & Business Media
ISBN 13 : 3642118011
Total Pages : 380 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Integrated Circuit and System Design: Power and Timing Modeling, Optimization and Simulation by : José Monteiro

Download or read book Integrated Circuit and System Design: Power and Timing Modeling, Optimization and Simulation written by José Monteiro and published by Springer Science & Business Media. This book was released on 2010-02-18 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the thoroughly refereed post-conference proceedings of 19th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2009, featuring Integrated Circuit and System Design, held in Delft, The Netherlands during September 9-11, 2009. The 26 revised full papers and 10 revised poster papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on variability & statistical timing, circuit level techniques, power management, low power circuits & technology, system level techniques, power & timing optimization techniques, self-timed circuits, low power circuit analysis & optimization, and low power design studies.

Solid State Circuits Technologies

Author : Jacobus Swart
Publisher : BoD – Books on Demand
ISBN 13 : 9533070455
Total Pages : 476 pages
Book Rating : 4.5/5 (33 download)

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Book Synopsis Solid State Circuits Technologies by : Jacobus Swart

Download or read book Solid State Circuits Technologies written by Jacobus Swart and published by BoD – Books on Demand. This book was released on 2010-01-01 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book.

Physical Design for 3D Integrated Circuits

Author : Aida Todri-Sanial
Publisher : CRC Press
ISBN 13 : 1351830198
Total Pages : 409 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Physical Design for 3D Integrated Circuits by : Aida Todri-Sanial

Download or read book Physical Design for 3D Integrated Circuits written by Aida Todri-Sanial and published by CRC Press. This book was released on 2017-12-19 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physical Design for 3D Integrated Circuits reveals how to effectively and optimally design 3D integrated circuits (ICs). It also analyzes the design tools for 3D circuits while exploiting the benefits of 3D technology. The book begins by offering an overview of physical design challenges with respect to conventional 2D circuits, and then each chapter delivers an in-depth look at a specific physical design topic. This comprehensive reference: Contains extensive coverage of the physical design of 2.5D/3D ICs and monolithic 3D ICs Supplies state-of-the-art solutions for challenges unique to 3D circuit design Features contributions from renowned experts in their respective fields Physical Design for 3D Integrated Circuits provides a single, convenient source of cutting-edge information for those pursuing 2.5D/3D technology.

Managing Temperature Effects in Nanoscale Adaptive Systems

Author : David Wolpert
Publisher : Springer Science & Business Media
ISBN 13 : 1461407486
Total Pages : 192 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Managing Temperature Effects in Nanoscale Adaptive Systems by : David Wolpert

Download or read book Managing Temperature Effects in Nanoscale Adaptive Systems written by David Wolpert and published by Springer Science & Business Media. This book was released on 2011-08-31 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

Author : ASM International
Publisher : ASM International
ISBN 13 : 1627081518
Total Pages : 666 pages
Book Rating : 4.6/5 (27 download)

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Book Synopsis ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by : ASM International

Download or read book ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2017-12-01 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.