Reliability of Electronic Components

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3642585051
Total Pages : 547 pages
Book Rating : 4.6/5 (425 download)

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Book Synopsis Reliability of Electronic Components by : Titu I. Bajenescu

Download or read book Reliability of Electronic Components written by Titu I. Bajenescu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 547 pages. Available in PDF, EPUB and Kindle. Book excerpt: This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

Design for Excellence in Electronics Manufacturing

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1119109388
Total Pages : 400 pages
Book Rating : 4.1/5 (191 download)

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Book Synopsis Design for Excellence in Electronics Manufacturing by : Cheryl Tulkoff

Download or read book Design for Excellence in Electronics Manufacturing written by Cheryl Tulkoff and published by John Wiley & Sons. This book was released on 2021-03-22 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: An authoritative guide to optimizing design for manufacturability and reliability from a team of experts Design for Excellence in Electronics Manufacturing is a comprehensive, state-of-the-art book that covers design and reliability of electronics. The authors—noted experts on the topic—explain how using the DfX concepts of design for reliability, design for manufacturability, design for environment, design for testability, and more, reduce research and development costs and decrease time to market and allow companies to confidently issue warranty coverage. By employing the concepts outlined in Design for Excellence in Electronics Manufacturing, engineers and managers can increase customer satisfaction, market share, and long-term profits. In addition, the authors describe the best practices regarding product design and show how the practices can be adapted for different manufacturing processes, suppliers, use environments, and reliability expectations. This important book: Contains a comprehensive review of the design and reliability of electronics Covers a range of topics: establishing a reliability program, design for the use environment, design for manufacturability, and more Includes technical information on electronic packaging, discrete components, and assembly processes Shows how aspects of electronics can fail under different environmental stresses Written for reliability engineers, electronics engineers, design engineers, component engineers, and others, Design for Excellence in Electronics Manufacturing is a comprehensive book that reveals how to get product design right the first time.

Reliability and Failure of Electronic Materials and Devices

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Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Reliability and Failure of Electronic Materials and Devices by : Milton Ohring

Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Reliable Design of Electronic Equipment

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Author :
Publisher : Springer
ISBN 13 : 3319091115
Total Pages : 156 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Reliable Design of Electronic Equipment by : Dhanasekharan Natarajan

Download or read book Reliable Design of Electronic Equipment written by Dhanasekharan Natarajan and published by Springer. This book was released on 2014-08-02 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains reliability techniques with examples from electronics design for the benefit of engineers. It presents the application of de-rating, FMEA, overstress analyses and reliability improvement tests for designing reliable electronic equipment. Adequate information is provided for designing computerized reliability database system to support the application of the techniques by designers. Pedantic terms and the associated mathematics of reliability engineering discipline are excluded for the benefit of comprehensiveness and practical applications. This book offers excellent support for electrical and electronics engineering students and professionals, bridging academic curriculum with industrial expectations.

Next Generation HALT and HASS

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Publisher : John Wiley & Sons
ISBN 13 : 111870021X
Total Pages : 296 pages
Book Rating : 4.1/5 (187 download)

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Book Synopsis Next Generation HALT and HASS by : Kirk A. Gray

Download or read book Next Generation HALT and HASS written by Kirk A. Gray and published by John Wiley & Sons. This book was released on 2016-03-11 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.

Practical Reliability Of Electronic Equipment And Products

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Author :
Publisher : CRC Press
ISBN 13 : 9780203909089
Total Pages : 472 pages
Book Rating : 4.9/5 (9 download)

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Book Synopsis Practical Reliability Of Electronic Equipment And Products by : Eugene R. Hnatek

Download or read book Practical Reliability Of Electronic Equipment And Products written by Eugene R. Hnatek and published by CRC Press. This book was released on 2002-10-25 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.

Quality Control Applications

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Publisher : Springer Science & Business Media
ISBN 13 : 1447129660
Total Pages : 328 pages
Book Rating : 4.4/5 (471 download)

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Book Synopsis Quality Control Applications by : Dimitris N. Chorafas

Download or read book Quality Control Applications written by Dimitris N. Chorafas and published by Springer Science & Business Media. This book was released on 2012-08-16 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quality control is a constant priority in electrical, mechanical, aeronautical, and nuclear engineering – as well as in the vast domain of electronics, from home appliances to computers and telecommunications. Quality Control Applications provides guidance and valuable insight into quality control policies; their methods, their implementation, constant observation and associated technical audits. What has previously been a mostly mathematical topic is translated here for engineers concerned with the practical implementation of quality control. Once the fundamentals of quality control are established, Quality Control Applications goes on to develop this knowledge and explain how to apply it in the most effective way. Techniques are described and supported using relevant, real-life, case studies to provide detail and clarity for those without a mathematical background. Among the many practical examples, two case studies dramatize the importance of quality assurance: A shot-by-shot analysis of the errors made in the Fukushima Daiichi nuclear disaster; and the engineering failure with new technology due to the absence of quality control in an alternative energy project. This clear and comprehensive approach makes Quality Control Applications an essential reference for those studying engineering as well industry professionals involved in quality control across product and system design.

Handbook Reliability Engineering

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Publisher :
ISBN 13 :
Total Pages : 370 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Handbook Reliability Engineering by : United States. Bureau of Naval Weapons

Download or read book Handbook Reliability Engineering written by United States. Bureau of Naval Weapons and published by . This book was released on 1964 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Integrated Circuit Quality and Reliability

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Author :
Publisher : CRC Press
ISBN 13 : 1482277719
Total Pages : 809 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Integrated Circuit Quality and Reliability by : Eugene R. Hnatek

Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek and published by CRC Press. This book was released on 2018-10-03 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

NASA Technical Note

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Publisher :
ISBN 13 :
Total Pages : 736 pages
Book Rating : 4.:/5 (319 download)

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Book Synopsis NASA Technical Note by :

Download or read book NASA Technical Note written by and published by . This book was released on 1964 with total page 736 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Environmental Testing Techniques for Electronics and Materials

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Publisher : Elsevier
ISBN 13 : 1483135918
Total Pages : 473 pages
Book Rating : 4.4/5 (831 download)

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Book Synopsis Environmental Testing Techniques for Electronics and Materials by : Geoffrey W. A. Dummer

Download or read book Environmental Testing Techniques for Electronics and Materials written by Geoffrey W. A. Dummer and published by Elsevier. This book was released on 2013-10-22 with total page 473 pages. Available in PDF, EPUB and Kindle. Book excerpt: Environmental Testing Techniques for Electronics and Materials reviews environmental testing techniques for evaluating the performance of electronic equipment, components, and materials. Environmental test planning, test methods, and instrumentation are described, along with the general environmental conditions under which equipment must operate. This book is comprised of 15 chapters and begins by explaining why environmental testing is necessary and describing the environment in which electronics must operate. The next chapter considers how an environmental test plan is designed; the methods for the environmental testing of components and materials; instrumentation and control of test chambers; shock and vibration test instrumentation; and requirements for specification writing. The reader is then introduced to factors that might affect the reliability of equipment, including high humidity environment; galvanic corrosion problems; high- and low-temperature environments; mechanical and associated hazards; transport hazards; and long-term storage. Problems posed by high altitude and space environments, nuclear radiation, and acoustic noise are also discussed. The final chapter is devoted to environmental protection techniques and looks at the effects of climatic environments on radio interference as well as the effects of the environment on the human operator. This monograph will be of value to materials scientists and electronics engineers as well as those engaged in the design, development, and production of professional and military equipment.

Reliability Abstracts and Technical Reviews

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Publisher :
ISBN 13 :
Total Pages : 556 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Reliability Abstracts and Technical Reviews by :

Download or read book Reliability Abstracts and Technical Reviews written by and published by . This book was released on 1966 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Failure Analysis

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Publisher : John Wiley & Sons
ISBN 13 : 1119990009
Total Pages : 372 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Failure Analysis by : Marius Bazu

Download or read book Failure Analysis written by Marius Bazu and published by John Wiley & Sons. This book was released on 2011-03-08 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.

Journal of the Electronics Division, American Society for Quality Control

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Author :
Publisher :
ISBN 13 :
Total Pages : 150 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Journal of the Electronics Division, American Society for Quality Control by : American Society for Quality Control. Electronics Division

Download or read book Journal of the Electronics Division, American Society for Quality Control written by American Society for Quality Control. Electronics Division and published by . This book was released on 1962 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:

NEL Reliability Bibliography

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Publisher :
ISBN 13 :
Total Pages : 508 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis NEL Reliability Bibliography by : United States. Navy. Electronics Laboratory

Download or read book NEL Reliability Bibliography written by United States. Navy. Electronics Laboratory and published by . This book was released on 1956 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt:

AI Techniques for Reliability Prediction for Electronic Components

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Author :
Publisher : IGI Global
ISBN 13 : 1799814661
Total Pages : 330 pages
Book Rating : 4.7/5 (998 download)

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Book Synopsis AI Techniques for Reliability Prediction for Electronic Components by : Bhargava, Cherry

Download or read book AI Techniques for Reliability Prediction for Electronic Components written by Bhargava, Cherry and published by IGI Global. This book was released on 2019-12-06 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.

Reliability Technology

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1119991366
Total Pages : 420 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Reliability Technology by : Norman Pascoe

Download or read book Reliability Technology written by Norman Pascoe and published by John Wiley & Sons. This book was released on 2011-03-08 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: A unique book that describes the practical processes necessary to achieve failure free equipment performance, for quality and reliability engineers, design, manufacturing process and environmental test engineers. This book studies the essential requirements for successful product life cycle management. It identifies key contributors to failure in product life cycle management and particular emphasis is placed upon the importance of thorough Manufacturing Process Capability reviews for both in-house and outsourced manufacturing strategies. The readers? attention is also drawn to the many hazards to which a new product is exposed from the commencement of manufacture through to end of life disposal. Revolutionary in focus, as it describes how to achieve failure free performance rather than how to predict an acceptable performance failure rate (reliability technology rather than reliability engineering) Author has over 40 years experience in the field, and the text is based on classroom tested notes from the reliability technology course he taught at Massachusetts Institute of Technology (MIT), USA Contains graphical interpretations of mathematical models together with diagrams, tables of physical constants, case studies and unique worked examples