Rad-Hard Semiconductor Memories

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Publisher :
ISBN 13 : 9788770043779
Total Pages : 0 pages
Book Rating : 4.0/5 (437 download)

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Book Synopsis Rad-Hard Semiconductor Memories by : Cristiano Calligaro

Download or read book Rad-Hard Semiconductor Memories written by Cristiano Calligaro and published by . This book was released on 2024-10-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components. Technical topics discussed in the book include: ¿ Radiation effects on semiconductor components (TID, SEE)¿ Radiation Hardening by Design (RHBD) Techniques¿ Rad-hard SRAMs¿ Rad-hard PROMs¿ Rad-hard Flash NVMs¿ Rad-hard ReRAMs¿ Rad-hard emerging technologies

Radiation Effects on Embedded Systems

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Publisher : Springer Science & Business Media
ISBN 13 : 140205646X
Total Pages : 273 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Radiation Effects on Embedded Systems by : Raoul Velazco

Download or read book Radiation Effects on Embedded Systems written by Raoul Velazco and published by Springer Science & Business Media. This book was released on 2007-06-19 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.

Rad-hard Semiconductor Memories

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Publisher : CRC Press
ISBN 13 : 1000793060
Total Pages : 417 pages
Book Rating : 4.0/5 (7 download)

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Book Synopsis Rad-hard Semiconductor Memories by : Cristiano Calligaro

Download or read book Rad-hard Semiconductor Memories written by Cristiano Calligaro and published by CRC Press. This book was released on 2022-09-01 with total page 417 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components. Technical topics discussed in the book include:  Radiation effects on semiconductor components (TID, SEE) Radiation Hardening by Design (RHBD) Techniques Rad-hard SRAMs Rad-hard PROMs Rad-hard Flash NVMs Rad-hard ReRAMs Rad-hard emerging technologies

Radiation Tolerant Electronics

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Publisher : MDPI
ISBN 13 : 3039212796
Total Pages : 210 pages
Book Rating : 4.0/5 (392 download)

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Book Synopsis Radiation Tolerant Electronics by : Paul Leroux

Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Radiation Hardening by Design (RHBD) Analog Integrated Circuits

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Publisher :
ISBN 13 : 9788770224192
Total Pages : pages
Book Rating : 4.2/5 (241 download)

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Book Synopsis Radiation Hardening by Design (RHBD) Analog Integrated Circuits by : Umberto Gatti

Download or read book Radiation Hardening by Design (RHBD) Analog Integrated Circuits written by Umberto Gatti and published by . This book was released on 2021-10-31 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is intended for researchers and professionals interested in understanding how to design and make a preliminary characterization of Radiation Hardened (rad-hard) analog and mixed-signal circuits, exploiting standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes. It starts with an introductory overview of the effects of radiation in space and harsh environments with a specific focus on analog circuits to enable the reader to understand why specific design solutions are adopted to mitigate hard/soft errors. The following four Chapters are devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components applied to Operational Amplifiers, Voltage References, Analog-to-Digital (ADC) and Digital-to-Analog (DAC) converters. Each Chapter is organized with a first part which recalls the basic working principles of such circuit and a second part which describes the main RHBD techniques proposed in the literature to make them resilient to radiation. The approach follows a top-down scheme starting from RHBD at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and finishing at layout level (how to shape a layout to mitigate radiation effects). The last-but-one Chapter is devoted to a special class of analog circuit, the dosimeters, which are gaining importance in space, health and nuclear applications. By leveraging the characteristic of a Flash-memory cell, a re-usable dosimeter is described which includes the sensitive element itself, the analog interface and the process of characterization. The last part is an overview of the strategies adopted for the testing of analog and mixed-signal circuits. In particular, it will focus also on the measurement campaigns performed by the Authors aiming for the characterization of developed rad-hard components under total dose (TID) and single-events (SEE). Technical topics discussed in the book include: - Radiation effects on semiconductor components (TID, SEE) - Radiation Hardening by Design (RHBD) Techniques - Rad-hard Operational Amplifiers - Rad-hard Voltage References - Rad-hard ADC - Rad-hard DAC - Rad-hard Special Circuits - Testing Strategies

Computer Memory and Data Storage

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Publisher : BoD – Books on Demand
ISBN 13 : 1803555882
Total Pages : 86 pages
Book Rating : 4.8/5 (35 download)

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Book Synopsis Computer Memory and Data Storage by : Azam Seyedi

Download or read book Computer Memory and Data Storage written by Azam Seyedi and published by BoD – Books on Demand. This book was released on 2024-01-10 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computer Memory and Data Storage presents a comprehensive exploration of the intricacies of memory design, delving into the challenges and advanced techniques involved in optimizing power consumption, performance, reliability, and data integrity. The chapters provide a complete understanding of modern memory technologies, ranging from radiation-hardened memory for space applications to diverse memory designs and their trade-offs.

Extreme Environment Electronics

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Publisher : CRC Press
ISBN 13 : 1351832808
Total Pages : 1044 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Extreme Environment Electronics by : John D. Cressler

Download or read book Extreme Environment Electronics written by John D. Cressler and published by CRC Press. This book was released on 2017-12-19 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt: Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Extreme-temperature and Harsh-environment Electronics

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Publisher :
ISBN 13 : 9780750311571
Total Pages : 0 pages
Book Rating : 4.3/5 (115 download)

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Book Synopsis Extreme-temperature and Harsh-environment Electronics by : Vinod Kumar Khanna

Download or read book Extreme-temperature and Harsh-environment Electronics written by Vinod Kumar Khanna and published by . This book was released on 2017 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Electronic devices and circuits are employed by a range of industries in testing conditions from extremes of high- or low-temperature, in chemically corrosive environments, subject to shock and vibration or exposure to radiation. This book describes the diverse measures necessary to make electronics capable of coping with such situations as well as to gainfully exploit any new phenomena that take place only under these conditions."--Prové de l'editor.

VLSI Design and Test

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Publisher : Springer
ISBN 13 : 9813297670
Total Pages : 782 pages
Book Rating : 4.8/5 (132 download)

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Book Synopsis VLSI Design and Test by : Anirban Sengupta

Download or read book VLSI Design and Test written by Anirban Sengupta and published by Springer. This book was released on 2019-08-17 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Scientific and Technical Aerospace Reports

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Publisher :
ISBN 13 :
Total Pages : 1038 pages
Book Rating : 4.:/5 (319 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 1038 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Microcircuit Reliability Bibliography

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Publisher :
ISBN 13 :
Total Pages : 412 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Microcircuit Reliability Bibliography by :

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

VLSI-SoC: Technology Advancement on SoC Design

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Publisher : Springer Nature
ISBN 13 : 3031168186
Total Pages : 275 pages
Book Rating : 4.0/5 (311 download)

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Book Synopsis VLSI-SoC: Technology Advancement on SoC Design by : Victor Grimblatt

Download or read book VLSI-SoC: Technology Advancement on SoC Design written by Victor Grimblatt and published by Springer Nature. This book was released on 2022-09-28 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, held in Singapore, in October 2021*. The 12 full papers included in this volume were carefully reviewed and selected from the 44 papers (out of 75 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like low-power design of RF, analog and mixed-signal circuits, EDA tools for the synthesis and verification of heterogenous SoCs, accelerators for cryptography and deep learning and on-chip Interconnection system, reliability and testing, and integration of 3D-ICs. *The conference was held virtually.

Microelectronics, Circuits and Systems

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Publisher : Springer Nature
ISBN 13 : 9811615705
Total Pages : 251 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Microelectronics, Circuits and Systems by : Abhijit Biswas

Download or read book Microelectronics, Circuits and Systems written by Abhijit Biswas and published by Springer Nature. This book was released on 2021-08-03 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a collection of peer-reviewed articles from the 7th International Conference on Microelectronics, Circuits, and Systems – Micro 2020. The volume covers the latest development and emerging research topics of material sciences, devices, microelectronics, circuits, nanotechnology, system design and testing, simulation, sensors, photovoltaics, optoelectronics, and its different applications. This book also deals with several tools and techniques to match the theme of the conference. It will be a valuable resource for researchers, professionals, Ph.D. scholars, undergraduate and postgraduate students working in Electronics, Microelectronics, Electrical, and Computer Engineering.

Space Systems Architecture for Resource Utilization

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Publisher : Cambridge Scholars Publishing
ISBN 13 : 1527568342
Total Pages : 279 pages
Book Rating : 4.5/5 (275 download)

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Book Synopsis Space Systems Architecture for Resource Utilization by : Peter J. Schubert

Download or read book Space Systems Architecture for Resource Utilization written by Peter J. Schubert and published by Cambridge Scholars Publishing. This book was released on 2021-04-15 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: Space resources will transform human enterprise. This practical workbook is a comprehensive treatment, packed with unique exercises, and offers an invaluable guide for start-ups, students, and space enthusiasts, who will find insights to strengthen and deepen their own capabilities. Systems are complex and architectures tie them together, requiring technical understanding, and so much more. This book will show the reader how to start a space business, appeal to legislators, interact with regulators, engage the public, and to coordinate diverse, international teams. It will allow them to gain the confidence to build, live, work, and move about in space.

Radiation Effects in Semiconductors

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Publisher : CRC Press
ISBN 13 : 1439826951
Total Pages : 432 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Radiation Effects in Semiconductors by : Krzysztof Iniewski

Download or read book Radiation Effects in Semiconductors written by Krzysztof Iniewski and published by CRC Press. This book was released on 2018-09-03 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

Transforming Reconfigurable Systems: A Festschrift Celebrating The 60th Birthday Of Professor Peter Cheung

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Author :
Publisher : World Scientific
ISBN 13 : 1783266988
Total Pages : 282 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis Transforming Reconfigurable Systems: A Festschrift Celebrating The 60th Birthday Of Professor Peter Cheung by : Wayne Luk

Download or read book Transforming Reconfigurable Systems: A Festschrift Celebrating The 60th Birthday Of Professor Peter Cheung written by Wayne Luk and published by World Scientific. This book was released on 2015-02-26 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the last three decades, Professor Peter Cheung has made significant contributions to a variety of areas, such as analogue and digital computer-aided design tools, high-level synthesis and hardware/software codesign, low-power and high-performance circuit architectures for signal and image processing, and mixed-signal integrated-circuit design.However, the area that has attracted his greatest attention is reconfigurable systems and their design, and his work has contributed to the transformation of this important and exciting discipline. This festschrift contains a unique collection of technical papers based on presentations at a workshop at Imperial College London in May 2013 celebrating Professor Cheung's 60th birthday. Renowned researchers who have been inspired and motivated by his outstanding research in the area of reconfigurable systems are brought together from across the globe to offer their latest research in reconfigurable systems. Professor Cheung has devoted much of his professional career to Imperial College London, and has served with distinction as the Head of Department of Electrical and Electronic Engineering for several years. His outstanding capability and his loyalty to Imperial College and the Department of Electrical and Electronic Engineering are legendary. Professor Cheung has made tremendous strides in ensuring excellence in both research and teaching, and in establishing sound governance and strong financial endowment; but above all, he has made his department a wonderful place in which to work and study.

Latchup in CMOS Technology

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Publisher : Springer Science & Business Media
ISBN 13 : 9780898382150
Total Pages : 270 pages
Book Rating : 4.3/5 (821 download)

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Book Synopsis Latchup in CMOS Technology by : R.R. Troutman

Download or read book Latchup in CMOS Technology written by R.R. Troutman and published by Springer Science & Business Media. This book was released on 1986-04-30 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Why a book on Iatchup? Latchup has been, and continues to be, a potentially serious CMOS reliability concern. This concern is becoming more widespread with the ascendency of CMOS as the dominant VLSI technology, particularly as parasitic bipolar characteristics continue to improve at ever smaller dimensions on silicon wafers with ever lower defect densities. Although many successful parts have been marketed, latchup solutions have often been ad hoc. Although latchup avoidance techniques have been previously itemized, there has been little quantitative evaluation of prior latchup fixes. What is needed is a more general, more systematic treatment of the latchup problem. Because of the wide variety of CMOS technologies and the long term interest in latchup, some overall guiding principles are needed. Appreciating the variety of possible triggering mechanisms is key to a real understanding of latchup. This work reviews the origin of each and its effect on the parasitic structure. Each triggering mechanism is classified according to a new taxonomy.