Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

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Publisher : The Electrochemical Society
ISBN 13 : 9781566771368
Total Pages : 366 pages
Book Rating : 4.7/5 (713 download)

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Book Synopsis Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing by : M. Meyyappan

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Proceedings of the Symposium Om Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

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Publisher : The Electrochemical Society
ISBN 13 : 9781566770965
Total Pages : 644 pages
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Book Synopsis Proceedings of the Symposium Om Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing by : M. Meyyappan

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Recent Advances in Data Mining of Enterprise Data

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Publisher : World Scientific
ISBN 13 : 981277985X
Total Pages : 816 pages
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Book Synopsis Recent Advances in Data Mining of Enterprise Data by : Thunshun Warren Liao

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Proceedings of the Symposia on Electrochemical Processing in ULSI Fabrication I

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Publisher :
ISBN 13 :
Total Pages : 290 pages
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Book Synopsis Proceedings of the Symposia on Electrochemical Processing in ULSI Fabrication I by : Electrochemical Society. Dielectric Science and Technology Division

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Fundamental Gas-phase and Surface Chemistry of Vapor-phase Deposition II and Process Control, Diagnostics and Modeling in Semiconductor Manufacturing IV

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Publisher : The Electrochemical Society
ISBN 13 : 9781566773195
Total Pages : 526 pages
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The Cumulative Book Index

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ISBN 13 :
Total Pages : 2348 pages
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Proceedings of the Eleventh International Symposium on Plasma Processing

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Publisher : The Electrochemical Society
ISBN 13 : 9781566771641
Total Pages : 740 pages
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Book Synopsis Proceedings of the Eleventh International Symposium on Plasma Processing by : Electrochemical Society. Dielectric Science and Technology Division

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Encyclopedia of Plasma Technology - Two Volume Set

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Publisher : CRC Press
ISBN 13 : 1351204939
Total Pages : 3082 pages
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Book Synopsis Encyclopedia of Plasma Technology - Two Volume Set by : J. Leon Shohet

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National Semiconductor Metrology Program

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ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis National Semiconductor Metrology Program by : National Institute of Standards and Technology (U.S.)

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National Semiconductor Metrology Program

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ISBN 13 :
Total Pages : 160 pages
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Book Synopsis National Semiconductor Metrology Program by : National Semiconductor Metrology Program (U.S.)

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Semiconductor Manufacturing: Meeting the Challenges of the Global Marketplace

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Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780780343818
Total Pages : 504 pages
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Book Synopsis Semiconductor Manufacturing: Meeting the Challenges of the Global Marketplace by : Institute of Electrical and Electronics Engineers

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National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

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ISBN 13 :
Total Pages : 160 pages
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American Book Publishing Record Cumulative 1998

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ISBN 13 : 9780835240871
Total Pages : 1312 pages
Book Rating : 4.2/5 (48 download)

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Book Synopsis American Book Publishing Record Cumulative 1998 by : R R Bowker Publishing

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Chemical Abstracts

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ISBN 13 :
Total Pages : 2710 pages
Book Rating : 4.3/5 (91 download)

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Advances in Neural Networks -- ISNN 2010

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Publisher : Springer Science & Business Media
ISBN 13 : 3642133177
Total Pages : 670 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Advances in Neural Networks -- ISNN 2010 by : James Kwok

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Fuzzy Systems and Knowledge Discovery

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Publisher : Springer Science & Business Media
ISBN 13 : 3540283315
Total Pages : 1354 pages
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Book Synopsis Fuzzy Systems and Knowledge Discovery by : Lipo Wang

Download or read book Fuzzy Systems and Knowledge Discovery written by Lipo Wang and published by Springer Science & Business Media. This book was released on 2005-08-17 with total page 1354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book and its sister volume, LNAI 3613 and 3614, constitute the proce- ings of the Second International Conference on Fuzzy Systems and Knowledge Discovery (FSKD 2005), jointly held with the First International Conference on Natural Computation (ICNC 2005, LNCS 3610, 3611, and 3612) from - gust 27–29, 2005 in Changsha, Hunan, China. FSKD 2005 successfully attracted 1249 submissions from 32 countries/regions (the joint ICNC-FSKD 2005 received 3136 submissions). After rigorous reviews, 333 high-quality papers, i. e. , 206 long papers and 127 short papers, were included in the FSKD 2005 proceedings, r- resenting an acceptance rate of 26. 7%. The ICNC-FSKD 2005 conference featured the most up-to-date research - sults in computational algorithms inspired from nature, including biological, e- logical, and physical systems. It is an exciting and emerging interdisciplinary area in which a wide range of techniques and methods are being studied for dealing with large, complex, and dynamic problems. The joint conferences also promoted cross-fertilization over these exciting and yet closely-related areas, which had a signi?cant impact on the advancement of these important technologies. Speci?c areas included computation with words, fuzzy computation, granular com- tation, neural computation, quantum computation, evolutionary computation, DNA computation, chemical computation, information processing in cells and tissues, molecular computation, arti?cial life, swarm intelligence, ants colony, arti?cial immune systems, etc. , with innovative applications to knowledge d- covery, ?nance, operations research, and more.

Proceedings, Rensselaer's Second International Conference on Computer Integrated Manufacturing

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Publisher :
ISBN 13 :
Total Pages : 622 pages
Book Rating : 4.3/5 (91 download)

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