Practical Scanning Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1461344220
Total Pages : 598 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Practical Scanning Electron Microscopy by : Joseph Goldstein

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Current Catalog

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Publisher :
ISBN 13 :
Total Pages : 1068 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Current Catalog by : National Library of Medicine (U.S.)

Download or read book Current Catalog written by National Library of Medicine (U.S.) and published by . This book was released on 1982 with total page 1068 pages. Available in PDF, EPUB and Kindle. Book excerpt: First multi-year cumulation covers six years: 1965-70.

NBS Special Publication

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Publisher :
ISBN 13 :
Total Pages : 726 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis NBS Special Publication by :

Download or read book NBS Special Publication written by and published by . This book was released on 1977 with total page 726 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Methods in Microbiology

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Publisher : Academic Press
ISBN 13 : 0080860370
Total Pages : 301 pages
Book Rating : 4.0/5 (88 download)

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Book Synopsis Methods in Microbiology by :

Download or read book Methods in Microbiology written by and published by Academic Press. This book was released on 1973-10-10 with total page 301 pages. Available in PDF, EPUB and Kindle. Book excerpt: Methods in Microbiology

Electron Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 3527614559
Total Pages : 527 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Electron Microscopy by : S. Amelinckx

Download or read book Electron Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 527 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Microcircuit Reliability Bibliography

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Publisher :
ISBN 13 :
Total Pages : 412 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Microcircuit Reliability Bibliography by :

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Microscopy for Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 0387396209
Total Pages : 533 pages
Book Rating : 4.3/5 (873 download)

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Book Synopsis Scanning Microscopy for Nanotechnology by : Weilie Zhou

Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Characterization of Solid Surfaces

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Publisher : Springer Science & Business Media
ISBN 13 : 1461344905
Total Pages : 675 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Characterization of Solid Surfaces by : Philip F. Kane

Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

Progress in Transmission Electron Microscopy 1

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540676805
Total Pages : 400 pages
Book Rating : 4.6/5 (768 download)

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Book Synopsis Progress in Transmission Electron Microscopy 1 by : Xiao-Feng Zhang

Download or read book Progress in Transmission Electron Microscopy 1 written by Xiao-Feng Zhang and published by Springer Science & Business Media. This book was released on 2001-10-18 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Advances in Food Research

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Publisher : Academic Press
ISBN 13 : 0080567673
Total Pages : 375 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Advances in Food Research by :

Download or read book Advances in Food Research written by and published by Academic Press. This book was released on 1976-07-09 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Food Research

ERDA Research Abstracts

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Publisher :
ISBN 13 :
Total Pages : 716 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis ERDA Research Abstracts by : United States. Energy Research and Development Administration

Download or read book ERDA Research Abstracts written by United States. Energy Research and Development Administration and published by . This book was released on 1976 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Energy Research Abstracts

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Publisher :
ISBN 13 :
Total Pages : 780 pages
Book Rating : 4.3/5 (129 download)

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Book Synopsis Energy Research Abstracts by :

Download or read book Energy Research Abstracts written by and published by . This book was released on 1985 with total page 780 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Measurement Technology

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Publisher :
ISBN 13 :
Total Pages : 332 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Semiconductor Measurement Technology by : Institute for Applied Technology (U.S.). Electronic Technology Division

Download or read book Semiconductor Measurement Technology written by Institute for Applied Technology (U.S.). Electronic Technology Division and published by . This book was released on 1973 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Measurement Technology Combined Quarterly Report, October 1, 1973, to March 31, 1974

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Publisher :
ISBN 13 :
Total Pages : 108 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Semiconductor Measurement Technology Combined Quarterly Report, October 1, 1973, to March 31, 1974 by : W. Murray Bullis

Download or read book Semiconductor Measurement Technology Combined Quarterly Report, October 1, 1973, to March 31, 1974 written by W. Murray Bullis and published by . This book was released on 1974 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-Ray Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1461399661
Total Pages : 582 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Advances in X-Ray Analysis by : Charles Barrett

Download or read book Advances in X-Ray Analysis written by Charles Barrett and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

The Physics of Micro/Nano-Fabrication

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Publisher : Springer Science & Business Media
ISBN 13 : 1475767757
Total Pages : 661 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis The Physics of Micro/Nano-Fabrication by : Ivor Brodie

Download or read book The Physics of Micro/Nano-Fabrication written by Ivor Brodie and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 661 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this revised and expanded edition, the authors provide a comprehensive overview of the tools, technologies, and physical models needed to understand, build, and analyze microdevices. Students, specialists within the field, and researchers in related fields will appreciate their unified presentation and extensive references.

Ion Implantation Into Metals

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Publisher : Elsevier
ISBN 13 : 1483280187
Total Pages : 385 pages
Book Rating : 4.4/5 (832 download)

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Book Synopsis Ion Implantation Into Metals by : V. Ashworth

Download or read book Ion Implantation Into Metals written by V. Ashworth and published by Elsevier. This book was released on 2016-04-20 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ion Implantation into Metals presents the proceedings of the 3rd International Conference on the Modification of Surface Properties of Metals by Ion Implantation, held at UMIST, Manchester, UK on June 23-26, 1981. The book includes papers on aqueous corrosion of ion-implanted iron; the mechanical properties and high temperature oxidation behavior in aqueous corrosion; and the potential of ion beam processing in this field of materials science and engineering. The text also presents papers on the important scientific progress in metal physics and related subjects.