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Optical Characterization Of Thin Metallic And Semiconducting Films In The Far Infrared
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Book Synopsis Optical Characterization of Thin Metallic and Semiconducting Films in the Far Infrared by : Mark Stuart Durschlag
Download or read book Optical Characterization of Thin Metallic and Semiconducting Films in the Far Infrared written by Mark Stuart Durschlag and published by . This book was released on 1981 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Investigation of Electro-optical Properties of Thin Metallic and Semiconducting Films by : Jared Wooddell Haslett
Download or read book Investigation of Electro-optical Properties of Thin Metallic and Semiconducting Films written by Jared Wooddell Haslett and published by . This book was released on 1955 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Optical Characterization of Thin Solid Films by : Olaf Stenzel
Download or read book Optical Characterization of Thin Solid Films written by Olaf Stenzel and published by Springer. This book was released on 2018-03-09 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Book Synopsis Optical Characterization of Semiconductors by : Sidney Perkowitz
Download or read book Optical Characterization of Semiconductors written by Sidney Perkowitz and published by Elsevier. This book was released on 2012-12-02 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories
Book Synopsis Journal of Current Laser Abstracts by :
Download or read book Journal of Current Laser Abstracts written by and published by . This book was released on 1982 with total page 810 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Optical Characterization of Very Thin Films by : Mohammad Reza Behfrooz
Download or read book Optical Characterization of Very Thin Films written by Mohammad Reza Behfrooz and published by . This book was released on 1973 with total page 65 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis American Doctoral Dissertations by :
Download or read book American Doctoral Dissertations written by and published by . This book was released on 1995 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Metal Based Thin Films for Electronics by : Klaus Wetzig
Download or read book Metal Based Thin Films for Electronics written by Klaus Wetzig and published by John Wiley & Sons. This book was released on 2006-03-06 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers, such as metallization and barrier layers for microelectronics, magnetoresistive layers for GMR and TMR, sensor and resistance layers. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, and can also be recommended for advanced studies in materials science, analytics, surface and solid state science.
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Optical Characterization of Thin Films, and Determination of Four Unknown Optical Parameters by : Mohammad Reza Behfrooz
Download or read book Optical Characterization of Thin Films, and Determination of Four Unknown Optical Parameters written by Mohammad Reza Behfrooz and published by . This book was released on 1975 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :University of Illinois at Urbana-Champaign. Office of Engineering Publications Publisher : ISBN 13 : Total Pages :324 pages Book Rating :4.:/5 (31 download)
Book Synopsis The Summary of Engineering Research by : University of Illinois at Urbana-Champaign. Office of Engineering Publications
Download or read book The Summary of Engineering Research written by University of Illinois at Urbana-Champaign. Office of Engineering Publications and published by . This book was released on 1982 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications by : United States. National Bureau of Standards
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1986 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello
Download or read book In Situ Real-Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Book Synopsis The Physical Properties of Thin Metal Films by : G.P. Zhigal'skii
Download or read book The Physical Properties of Thin Metal Films written by G.P. Zhigal'skii and published by CRC Press. This book was released on 2003-07-10 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Book Synopsis The Growth of Columnar Thin Films and Their Characterization Within the Visible and Near Infrared Spectral Bands by : Benjamin David Booso
Download or read book The Growth of Columnar Thin Films and Their Characterization Within the Visible and Near Infrared Spectral Bands written by Benjamin David Booso and published by . This book was released on 2010 with total page 173 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seven series of thin films encompassing metallic, dielectric, and semiconductor materials were deposited onto a substrate by means of electron-beam evaporation. Tilting the substrate at an oblique angle relative to the evaporant source causes an atomic shadowing effect to occur at adjacent deposition locations and results in the growth of a columnar morphology. Scanning electron micrographs for each series validate a film structure and porosity that varies with substrate tilt angle. Angle resolved spectroscopic ellipsometry reveals the anisotropic nature of the different series and determines the optical properties utilizing a best model fit calculation. In some instances, the optical properties of the columnar thin film and its bulk material differ significantly.
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1986 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:
