Metrology And Diagnostic Techniques For Nanoelectronics

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Metrology and Diagnostic Techniques for Nanoelectronics

Author : Zhiyong Ma
Publisher : CRC Press
ISBN 13 : 1351733958
Total Pages : 1454 pages
Book Rating : 4.3/5 (517 download)

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Book Synopsis Metrology and Diagnostic Techniques for Nanoelectronics by : Zhiyong Ma

Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 1454 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Electrical Atomic Force Microscopy for Nanoelectronics

Author : Umberto Celano
Publisher : Springer
ISBN 13 : 3030156125
Total Pages : 408 pages
Book Rating : 4.0/5 (31 download)

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Book Synopsis Electrical Atomic Force Microscopy for Nanoelectronics by : Umberto Celano

Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Measurement Techniques for Radio Frequency Nanoelectronics

Author : T. Mitch Wallis
Publisher : Cambridge University Press
ISBN 13 : 1108326315
Total Pages : 329 pages
Book Rating : 4.1/5 (83 download)

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Book Synopsis Measurement Techniques for Radio Frequency Nanoelectronics by : T. Mitch Wallis

Download or read book Measurement Techniques for Radio Frequency Nanoelectronics written by T. Mitch Wallis and published by Cambridge University Press. This book was released on 2017-09-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

Frontiers of Characterization and Metrology for Nanoelectronics

Author : David G. Seiler
Publisher : American Institute of Physics
ISBN 13 : 9780735407121
Total Pages : 0 pages
Book Rating : 4.4/5 (71 download)

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Book Synopsis Frontiers of Characterization and Metrology for Nanoelectronics by : David G. Seiler

Download or read book Frontiers of Characterization and Metrology for Nanoelectronics written by David G. Seiler and published by American Institute of Physics. This book was released on 2009-10-26 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the introduction of new materials, innovative processing and assembly, and novel devices brings formidable metrology challenges. We have entered an era where nanotechnology is required to meet the demand for smaller, faster, cheaper, and more complex functional chips. Innovative metrology and characterization methods have become critical. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It comprises applications in nanoelectronic materials and devices, research and development, and manufacturing and diagnostics. Novel characterization methods for beyond CMOS and extreme CMOS devices are addressed, as well as electrical measurements, interconnects, patterning, microscopy, and modeling. The Editors believe that this book of collected papers from world-class leaders provides a basis and effective portrayal of the industry’s characterization and metrology needs and how they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductors into the nanoelectronic regime. It also provides a foundation for stimulating further advances in metrology and new ideas for research and development.

Fundamental Principles of Engineering Nanometrology

Author : Richard Leach
Publisher : William Andrew
ISBN 13 : 1437778321
Total Pages : 349 pages
Book Rating : 4.4/5 (377 download)

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Book Synopsis Fundamental Principles of Engineering Nanometrology by : Richard Leach

Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by William Andrew. This book was released on 2009-09-03 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Surfactants in Precision Cleaning

Author : Rajiv Kohli
Publisher : Elsevier
ISBN 13 : 0128222174
Total Pages : 336 pages
Book Rating : 4.1/5 (282 download)

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Book Synopsis Surfactants in Precision Cleaning by : Rajiv Kohli

Download or read book Surfactants in Precision Cleaning written by Rajiv Kohli and published by Elsevier. This book was released on 2021-10-21 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surfactants in Precision Cleaning: Removal of Contaminants at the Micro and Nanoscale is a single source of information on surfactants, emulsions, microemulsions and detergents for removal of surface contaminants at the micro and nanoscale. The topics covered include cleaning mechanisms, effect of surfactants, types of stable dispersions (emulsions, microemulsions, surfactants, detergents, etc.), cleaning technology, and cleaning applications. Users will find this volume an excellent resource on the use of stable dispersions in precision cleaning. - Single source of current information on surfactants, emulsions, microemulsions and detergents for precision cleaning applications - Includes a list of extensive reference sources - Discusses specific selection and properties of surfactants and their use in cleaning - Provides a guide for cleaning applications in different industry sectors

Nanoscale Calibration Standards and Methods

Author : Günter Wilkening
Publisher : John Wiley & Sons
ISBN 13 : 3527606874
Total Pages : 541 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Nanoscale Calibration Standards and Methods by : Günter Wilkening

Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Microscale Diagnostic Techniques

Author : Kenneth S. Breuer
Publisher : Springer Science & Business Media
ISBN 13 : 9783540230991
Total Pages : 280 pages
Book Rating : 4.2/5 (39 download)

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Book Synopsis Microscale Diagnostic Techniques by : Kenneth S. Breuer

Download or read book Microscale Diagnostic Techniques written by Kenneth S. Breuer and published by Springer Science & Business Media. This book was released on 2005-03-17 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microrheology.- Micron-Resolution Particle Image Velocimetry.- Electrokinetic Flow Diagnostics.- Micro- and Nano-Scale Diagnostic Technique for Thermomentry.- Nanoscale Mechanical Characterization of Carbon Nanotubes.- Applications of the Piezoelectric Quartz Crystal Microbalance for Microdevice Development.

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7

Author : Dieter K. Schroder
Publisher : The Electrochemical Society
ISBN 13 : 1566775698
Total Pages : 406 pages
Book Rating : 4.5/5 (667 download)

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Book Synopsis Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 by : Dieter K. Schroder

Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 2007 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.

Metrology and Physical Mechanisms in New Generation Ionic Devices

Author : Umberto Celano
Publisher : Springer
ISBN 13 : 3319395319
Total Pages : 191 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Metrology and Physical Mechanisms in New Generation Ionic Devices by : Umberto Celano

Download or read book Metrology and Physical Mechanisms in New Generation Ionic Devices written by Umberto Celano and published by Springer. This book was released on 2016-06-18 with total page 191 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

Multiferroics

Author : Andres Cano
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3110581043
Total Pages : 538 pages
Book Rating : 4.1/5 (15 download)

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Book Synopsis Multiferroics by : Andres Cano

Download or read book Multiferroics written by Andres Cano and published by Walter de Gruyter GmbH & Co KG. This book was released on 2021-06-21 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Multiferroics, materials with a coexistence of magnetic and ferroelectric order, provide an efficient route for the control of magnetism by electric fields. The authors cover multiferroic thin-film heterostructures, device architectures and domain/interface effects. They critically discuss achievements as well as limitations and assess opportunities for future applications.

Handbook of Terahertz Technology

Author : Neil Sellers
Publisher : Scientific e-Resources
ISBN 13 : 1839472332
Total Pages : 324 pages
Book Rating : 4.8/5 (394 download)

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Book Synopsis Handbook of Terahertz Technology by : Neil Sellers

Download or read book Handbook of Terahertz Technology written by Neil Sellers and published by Scientific e-Resources. This book was released on 2018-01-21 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terahertz radiation - also known as submillimeter radiation, terahertz waves, tremendously high frequency (THF), T-rays, T-waves, T-light, T-lux or THz - consists of electromagnetic waves within the ITU-designated band of frequencies from 0.3 to 3 terahertz. Wavelengths of radiation in the terahertz band correspondingly range from 1 mm to 0.1 mm. Because terahertz radiation begins at a wavelength of one millimeter and proceeds into shorter wavelengths, it is sometimes known as the submillimeter band, and its radiation as submillimeter waves, especially in astronomy. The book presents information about Terahertz science, Terahertz photodetectors and Terahertz Lasers. A special emphasis is given to room temperature operation of long wavelength photodetectors based on novel quantum dots. Moreover, a complete analysis of systems based on Quantum Cascade structures to detect far infrared wavelengths is provided. Finally, the book presents Terahertz laser principles considering multi-color lasers in this range of wavelengths. It is written as a background for graduate students in the Optics field.

National Semiconductor Metrology Program

Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 146 pages
Book Rating : 4.:/5 (7 download)

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Book Synopsis National Semiconductor Metrology Program by : National Institute of Standards and Technology (U.S.)

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1995 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Nanoelectronic Materials

Author : Loutfy H. Madkour
Publisher : Springer
ISBN 13 : 3030216217
Total Pages : 783 pages
Book Rating : 4.0/5 (32 download)

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Book Synopsis Nanoelectronic Materials by : Loutfy H. Madkour

Download or read book Nanoelectronic Materials written by Loutfy H. Madkour and published by Springer. This book was released on 2019-06-27 with total page 783 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents synthesis techniques for the preparation of low-dimensional nanomaterials including 0D (quantum dots), 1D (nanowires, nanotubes) and 2D (thin films, few layers), as well as their potential applications in nanoelectronic systems. It focuses on the size effects involved in the transition from bulk materials to nanomaterials; the electronic properties of nanoscale devices; and different classes of nanomaterials from microelectronics to nanoelectronics, to molecular electronics. Furthermore, it demonstrates the structural stability, physical, chemical, magnetic, optical, electrical, thermal, electronic and mechanical properties of the nanomaterials. Subsequent chapters address their characterization, fabrication techniques from lab-scale to mass production, and functionality. In turn, the book considers the environmental impact of nanotechnology and novel applications in the mechanical industries, energy harvesting, clean energy, manufacturing materials, electronics, transistors, health and medical therapy. In closing, it addresses the combination of biological systems with nanoelectronics and highlights examples of nanoelectronic–cell interfaces and other advanced medical applications. The book answers the following questions: • What is different at the nanoscale? • What is new about nanoscience? • What are nanomaterials (NMs)? • What are the fundamental issues in nanomaterials? • Where are nanomaterials found? • What nanomaterials exist in nature? • What is the importance of NMs in our lives? • Why so much interest in nanomaterials? • What is at nanoscale in nanomaterials? • What is graphene? • Are pure low-dimensional systems interesting and worth pursuing? • Are nanotechnology products currently available? • What are sensors? • How can Artificial Intelligence (AI) and nanotechnology work together? • What are the recent advances in nanoelectronic materials? • What are the latest applications of NMs?

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Author : Richard Haight
Publisher : World Scientific
ISBN 13 : 9814322849
Total Pages : 346 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight

Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Nanoscale Standards by Metrological AFM and Other Instruments

Author : Ichiko Misumi
Publisher :
ISBN 13 : 9780750331906
Total Pages : pages
Book Rating : 4.3/5 (319 download)

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Book Synopsis Nanoscale Standards by Metrological AFM and Other Instruments by : Ichiko Misumi

Download or read book Nanoscale Standards by Metrological AFM and Other Instruments written by Ichiko Misumi and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Handbook of Surface and Nanometrology

Author : David J. Whitehouse
Publisher : CRC Press
ISBN 13 : 1420082027
Total Pages : 982 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Surface and Nanometrology by : David J. Whitehouse

Download or read book Handbook of Surface and Nanometrology written by David J. Whitehouse and published by CRC Press. This book was released on 2010-12-20 with total page 982 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication of the first edition, miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology. This interdependence of scales has had profound practical implications.Updated and expanded to reflect many new developments, Handbook of Surface and Nanometrology, Second Edition determines h