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Author : Wendong Zhang
Publisher :
ISBN 13 : 9781118717974
Total Pages : pages
Book Rating : 4.7/5 (179 download)
Download or read book Measurement Technology for Micro-nanometer Devices written by Wendong Zhang and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wendong Zhang
Publisher : John Wiley & Sons
ISBN 13 : 1118717961
Total Pages : 341 pages
Book Rating : 4.1/5 (187 download)
Download or read book Measurement Technology for Micro-Nanometer Devices written by Wendong Zhang and published by John Wiley & Sons. This book was released on 2017-01-17 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Author : Daniel Anthony
Publisher : Createspace Independent Publishing Platform
ISBN 13 : 9781548115760
Total Pages : 334 pages
Book Rating : 4.1/5 (157 download)
Download or read book Measurement Technology for Micro-Nanometer Devices written by Daniel Anthony and published by Createspace Independent Publishing Platform. This book was released on 2017-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale - Highlights the advanced research work from industry and academia in micro-nano devices test technology - Written at both introductory and advanced levels, provides the fundamentals and theories - Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Author : Wei Gao
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3038131830
Total Pages : 674 pages
Book Rating : 4.0/5 (381 download)
Download or read book Measurement Technology and Intelligent Instruments VIII written by Wei Gao and published by Trans Tech Publications Ltd. This book was released on 2008-06-12 with total page 674 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters BCI (WoS). Measurement, rigorously defined as ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering. This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.
Author : Günter Wilkening
Publisher : John Wiley & Sons
ISBN 13 : 3527606874
Total Pages : 541 pages
Book Rating : 4.5/5 (276 download)
Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author :
Publisher :
ISBN 13 :
Total Pages : 576 pages
Book Rating : 4.3/5 (91 download)
Download or read book Optical Test and Measurement Technology and Equipment written by and published by . This book was released on 2006 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Yuri Chugui
Publisher : Trans Tech Publications
ISBN 13 : 9780878492732
Total Pages : 0 pages
Book Rating : 4.4/5 (927 download)
Download or read book Measurement Technology and Intelligent Instruments IX written by Yuri Chugui and published by Trans Tech Publications. This book was released on 2010 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A collection that focuses on measurement science and metrology: micro- and nano-measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, and terahertz technologies for science, industry and biomedicine.
Author : J. R. Devaney
Publisher :
ISBN 13 :
Total Pages : 48 pages
Book Rating : 4.:/5 (473 download)
Download or read book Semiconductor Measurement Technology. 35 written by J. R. Devaney and published by . This book was released on 1977 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zhu Li
Publisher :
ISBN 13 :
Total Pages : 730 pages
Book Rating : 4.3/5 (91 download)
Download or read book Second International Symposium on Measurement Technology and Intelligent Instruments written by Zhu Li and published by . This book was released on 1993 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zheng You
Publisher : World Scientific
ISBN 13 : 9813232811
Total Pages : 392 pages
Book Rating : 4.8/5 (132 download)
Download or read book Micro-nano Technology Xvii-xviii - Proceedings Of The 17th-18th Annual Conference And 6th-7th International Conference Of The Chinese Society Of Micro/nano Technology written by Zheng You and published by World Scientific. This book was released on 2017-11-24 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book collects selected papers from the 17th and 18th Annual Conference of the Chinese Society of Micro/Nano Technology (CSMNT2015 and CSMNT2016).The papers cover various fields, like Micro/Nano Transducer/Robot, Microfluidic Devices and Systems, Micro/Nano Fabrication & Measurement Technologies, Microfluidics and Nano Fluids, Nano Material Research/Nanotube/Nanowire Devices, MEMS/NENS and Applications, Nanometer Biological/Nano Medicine, Packaging Technology. All the papers are written by Chinese researchers. From this book, you can have an overview of research of MEMS and nano technology in China. The reader can be researchers, graduate students, and engineers who are working in the field of MEMS and nano technology.
Author : W. Murray Bullis
Publisher :
ISBN 13 :
Total Pages : 48 pages
Book Rating : 4.3/5 (91 download)
Download or read book Metrology for Submicrometer Devices and Circuits written by W. Murray Bullis and published by . This book was released on 1980 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jing Tao Han
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3038137804
Total Pages : 900 pages
Book Rating : 4.0/5 (381 download)
Download or read book Equipment Manufacturing Technology written by Jing Tao Han and published by Trans Tech Publications Ltd. This book was released on 2011-12-06 with total page 900 pages. Available in PDF, EPUB and Kindle. Book excerpt: These volumes comprise papers, on the topic of Materials Processing Technology, selected from the second International Conference on Advances in Materials and Manufacturing (ICAMMP 2011) held on the 16-18th December 2011 in Guilin, China. The 170 peer-reviewed papers are grouped into the chapters: 1: Mechatronics, 2: Measure Control Technologies and Intelligent Systems, 3: Transmission and Control of Fluid, 4: Mechanical Control and Embedded System, 5: Micro-Electronic Packaging Technology and Equipment, 6: Advanced Machinery and Equipment.
Author : Yongsheng Gao
Publisher : Trans Tech Publications
ISBN 13 :
Total Pages : 796 pages
Book Rating : 4.3/5 (91 download)
Download or read book Measurement Technology and Intelligent Instruments VI written by Yongsheng Gao and published by Trans Tech Publications. This book was released on 2005 with total page 796 pages. Available in PDF, EPUB and Kindle. Book excerpt: The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology.
Author : Robert Schmitt
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3038264938
Total Pages : 518 pages
Book Rating : 4.0/5 (382 download)
Download or read book Measurement Technology and Intelligent Instruments XI written by Robert Schmitt and published by Trans Tech Publications Ltd. This book was released on 2014-05-21 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collection of selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany. The 60 papers are grouped as follows: Chapter 1: Metrology for SI, Chapter 2: Position & Displacement Metrology, Chapter 3: Micro- and Nanometrology, Chapter 4: Macrometrology, Chapter 5: Optical Metrology, Chapter 6: Sensors and Actuators, Chapter 7: Material Properties' Characterization, Chapter 8: Intelligent Instruments for Automation, Chapter 9: Management of Measurement Processes, Chapter 10: Calibration and Machine Tool Performance, Chapter 11: Trends in Production Technology, Chapter 12: Measurements, Modeling and Simulation in the Humanitarian Field
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.F/5 ( download)
Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1988 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Wunyuh Jywe
Publisher :
ISBN 13 :
Total Pages : 708 pages
Book Rating : 4.X/5 (4 download)
Download or read book Progress on Advanced Manufacture for Micro/nano Technology 2005 written by Wunyuh Jywe and published by . This book was released on 2006 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 392 pages
Book Rating : 4.3/5 (91 download)
Download or read book Annual IEEE Semiconductor Thermal Measurement and Management Symposium written by and published by . This book was released on 2005 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:
