Measurement of X-ray Scattering Coefficient for Light Substances as a Function of Wavelength

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Publisher :
ISBN 13 :
Total Pages : 154 pages
Book Rating : 4.E/5 ( download)

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Book Synopsis Measurement of X-ray Scattering Coefficient for Light Substances as a Function of Wavelength by : Pierre Mertz

Download or read book Measurement of X-ray Scattering Coefficient for Light Substances as a Function of Wavelength written by Pierre Mertz and published by . This book was released on 1926 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Measurement of the X-ray Scattering Coefficient for Light Substances as a Function of Wavelenth

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Publisher :
ISBN 13 :
Total Pages : 3 pages
Book Rating : 4.:/5 (34 download)

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Book Synopsis Measurement of the X-ray Scattering Coefficient for Light Substances as a Function of Wavelenth by : Pierre Mertz

Download or read book Measurement of the X-ray Scattering Coefficient for Light Substances as a Function of Wavelenth written by Pierre Mertz and published by . This book was released on 1926* with total page 3 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-ray Scattering

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Publisher : BoD – Books on Demand
ISBN 13 : 9535128876
Total Pages : 230 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis X-ray Scattering by : Alicia Esther Ares

Download or read book X-ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.

Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences

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Publisher : Springer
ISBN 13 : 3540959688
Total Pages : 331 pages
Book Rating : 4.5/5 (49 download)

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Book Synopsis Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences by : T.A. Ezquerra

Download or read book Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences written by T.A. Ezquerra and published by Springer. This book was released on 2009-06-12 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.

Basic X-ray Scattering for Soft Matter

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Publisher : Oxford University Press
ISBN 13 : 0198728662
Total Pages : 149 pages
Book Rating : 4.1/5 (987 download)

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Book Synopsis Basic X-ray Scattering for Soft Matter by : Wilhelmus Hendrikus Jeu

Download or read book Basic X-ray Scattering for Soft Matter written by Wilhelmus Hendrikus Jeu and published by Oxford University Press. This book was released on 2016 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is a well-established technique in materials science. The aim of this text is to explain basic principles and applications of x-ray scattering in a simple way using many practical examples followed by more elaborate case studies. It contains a separate chapter on the different types of order/disorder in soft matter that play such an important role in modern self-assembling systems. Finally the last chapter treats soft matter surfaces and thin film that are increasingly used in coatings and in many technological applications, such as liquid crystal displays and nanostructured block copolymer films

Fundamentals of Powder Diffraction and Structural Characterization of Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 0387241477
Total Pages : 732 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Fundamentals of Powder Diffraction and Structural Characterization of Materials by : Vitalij Pecharsky

Download or read book Fundamentals of Powder Diffraction and Structural Characterization of Materials written by Vitalij Pecharsky and published by Springer Science & Business Media. This book was released on 2005-03-03 with total page 732 pages. Available in PDF, EPUB and Kindle. Book excerpt: Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.

Medical Imaging Systems

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Publisher : Springer
ISBN 13 : 3319965204
Total Pages : 263 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis Medical Imaging Systems by : Andreas Maier

Download or read book Medical Imaging Systems written by Andreas Maier and published by Springer. This book was released on 2018-08-02 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.

X-ray Scattering from Semiconductors

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Publisher : World Scientific
ISBN 13 : 1860941591
Total Pages : 303 pages
Book Rating : 4.8/5 (69 download)

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Book Synopsis X-ray Scattering from Semiconductors by : Paul F. Fewster

Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.

Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra

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Publisher : Cambridge Scholars Publishing
ISBN 13 : 1527543897
Total Pages : 250 pages
Book Rating : 4.5/5 (275 download)

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Book Synopsis Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra by : Anton I. Mikhailov

Download or read book Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra written by Anton I. Mikhailov and published by Cambridge Scholars Publishing. This book was released on 2019-11-25 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.

X-ray Scattering From Semiconductors

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Publisher : World Scientific
ISBN 13 : 1783262079
Total Pages : 303 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis X-ray Scattering From Semiconductors by : Paul F Fewster

Download or read book X-ray Scattering From Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2000-10-27 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a

Dissertations in Physics

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Publisher : Stanford, Calif. : Stanford University Press
ISBN 13 :
Total Pages : 824 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Dissertations in Physics by : M. Lois Marckworth

Download or read book Dissertations in Physics written by M. Lois Marckworth and published by Stanford, Calif. : Stanford University Press. This book was released on 1961 with total page 824 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Scattering from Semiconductors and Other Materials

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Publisher : World Scientific
ISBN 13 : 9814436933
Total Pages : 510 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis X-Ray Scattering from Semiconductors and Other Materials by : Paul F. Fewster

Download or read book X-Ray Scattering from Semiconductors and Other Materials written by Paul F. Fewster and published by World Scientific. This book was released on 2015 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

Physical Chemistry of Macromolecules

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Publisher : John Wiley & Sons
ISBN 13 : 0471281387
Total Pages : 590 pages
Book Rating : 4.4/5 (712 download)

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Book Synopsis Physical Chemistry of Macromolecules by : S. F. Sun

Download or read book Physical Chemistry of Macromolecules written by S. F. Sun and published by John Wiley & Sons. This book was released on 2004-01-28 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt: Integrating coverage of polymers and biological macromolecules into a single text, Physical Chemistry of Macromolecules is carefully structured to provide a clear and consistent resource for beginners and professionals alike. The basic knowledge of both biophysical and physical polymer chemistry is covered, along with important terms, basic structural properties and relationships. This book includes end of chapter problems and references, and also: Enables users to improve basic knowledge of biophysical chemistry and physical polymer chemistry. Explores fully the principles of macromolecular chemistry, methods for determining molecular weight and configuration of molecules, the structure of macromolecules, and their separations.

Theory of XRF : getting acquainted with the principles

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Publisher :
ISBN 13 : 9789090167589
Total Pages : 71 pages
Book Rating : 4.1/5 (675 download)

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Book Synopsis Theory of XRF : getting acquainted with the principles by : Peter Brouwer

Download or read book Theory of XRF : getting acquainted with the principles written by Peter Brouwer and published by . This book was released on 2006 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Diffraction Crystallography

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Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda

Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

X-ray Characterization of Materials

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Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis X-ray Characterization of Materials by : Eric Lifshin

Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

NBS Special Publication

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Publisher :
ISBN 13 :
Total Pages : 650 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis NBS Special Publication by :

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 650 pages. Available in PDF, EPUB and Kindle. Book excerpt: