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Materials Reliability In Microelectronics Ii Volume 265
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Book Synopsis Materials Reliability in Microelectronics II: by : C. V. Thompson
Download or read book Materials Reliability in Microelectronics II: written by C. V. Thompson and published by Cambridge University Press. This book was released on 2014-06-05 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Materials Reliability in Microelectronics II: Volume 265 by : C. V. Thompson
Download or read book Materials Reliability in Microelectronics II: Volume 265 written by C. V. Thompson and published by . This book was released on 1992-09-30 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Materials Reliability in Microelectronics by :
Download or read book Materials Reliability in Microelectronics written by and published by . This book was released on 1999 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Materials Reliability in Microelectronics V: Volume 391 by : Anthony S. Oates
Download or read book Materials Reliability in Microelectronics V: Volume 391 written by Anthony S. Oates and published by . This book was released on 1995-10-24 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.
Book Synopsis Electromigration in Metals by : Paul S. Ho
Download or read book Electromigration in Metals written by Paul S. Ho and published by Cambridge University Press. This book was released on 2022-05-12 with total page 433 pages. Available in PDF, EPUB and Kindle. Book excerpt: Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.
Book Synopsis Materials Reliability in Microelectronics III: Volume 309 by : Kenneth P. Rodbell
Download or read book Materials Reliability in Microelectronics III: Volume 309 written by Kenneth P. Rodbell and published by . This book was released on 1993-08-31 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Materials Reliability in Microelectronics IX: Volume 563 by : Cynthia A. Volkert
Download or read book Materials Reliability in Microelectronics IX: Volume 563 written by Cynthia A. Volkert and published by Cambridge University Press. This book was released on 1999-10-01 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The continual evolution of integrated circuit architecture places ever-increasing demands on the metal and dielectric thin films used in fabricating these circuits. Not only must these materials meet performance and manufacturability requirements, they must also be highly reliable for many years under operating conditions. A thorough understanding of the failure mechanisms and the effect of processing conditions and material properties on reliability is required to achieve this, particularly if it is to be done while minimizing cost and maximizing performance. This book brings together researchers from academia and industry to discuss fundamental mechanisms and phenomena in the reliability field. Topics include: solder and barrier-layer reliability; electromigration modeling; electromigration in interconnects; advanced measurement techniques; mechanical behavior of back-end materials and adhesion and fracture.
Book Synopsis Chemical Perspectives of Microelectronic Materials by :
Download or read book Chemical Perspectives of Microelectronic Materials written by and published by . This book was released on 1992 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Materials Reliability Issues in Microelectronics: Volume 225 by : James R. Lloyd
Download or read book Materials Reliability Issues in Microelectronics: Volume 225 written by James R. Lloyd and published by Mrs Proceedings. This book was released on 1991-10-22 with total page 390 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Materials Reliability in Microelectronics IV: Volume 338 by : Peter Børgesen
Download or read book Materials Reliability in Microelectronics IV: Volume 338 written by Peter Børgesen and published by Materials Research Society. This book was released on 1994-10-19 with total page 629 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Computational Methods in Materials Science: Volume 278 by : James E. Mark
Download or read book Computational Methods in Materials Science: Volume 278 written by James E. Mark and published by . This book was released on 1992-09-23 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Chemical Perspectives of Microelectronic Materials III: Volume 282 by : C. R. Abernathy
Download or read book Chemical Perspectives of Microelectronic Materials III: Volume 282 written by C. R. Abernathy and published by Mrs Proceedings. This book was released on 1993-03-23 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Hierachically Structured Materials: Volume 255 by : Ilhan A. Aksay
Download or read book Hierachically Structured Materials: Volume 255 written by Ilhan A. Aksay and published by . This book was released on 1992-09-22 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Biomolecular Materials: Volume 292 by : Christopher Viney
Download or read book Biomolecular Materials: Volume 292 written by Christopher Viney and published by . This book was released on 1993-05-28 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lessons from nature; Cellular synthesis; Non-cellular synthesis; Structural and mechanical properties; Applications.
Book Synopsis Materials Theory and Modelling: Volume 291 by : Jeremy Broughton
Download or read book Materials Theory and Modelling: Volume 291 written by Jeremy Broughton and published by . This book was released on 1993-05-07 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Materials Reliability in Microelectronics VII: Volume 473 by : J. Joseph Clement
Download or read book Materials Reliability in Microelectronics VII: Volume 473 written by J. Joseph Clement and published by . This book was released on 1997-10-20 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Book Synopsis Materials Reliability in Microelectronics III: by : Kenneth P. Rodbell
Download or read book Materials Reliability in Microelectronics III: written by Kenneth P. Rodbell and published by Cambridge University Press. This book was released on 2014-06-05 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
