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Kelvin Probe Force Microscopy
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Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer Science & Business Media. This book was released on 2011-10-22 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer. This book was released on 2018-03-09 with total page 521 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Book Synopsis Surface Science Tools for Nanomaterials Characterization by : Challa S.S.R. Kumar
Download or read book Surface Science Tools for Nanomaterials Characterization written by Challa S.S.R. Kumar and published by Springer. This book was released on 2015-03-10 with total page 653 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Book Synopsis Conductive Atomic Force Microscopy by : Mario Lanza
Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-12-04 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Book Synopsis Atomic Force Microscopy by : Bert Voigtländer
Download or read book Atomic Force Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2019-05-23 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer. This book was released on 2011-10-29 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Book Synopsis Correlative Imaging by : Paul Verkade
Download or read book Correlative Imaging written by Paul Verkade and published by John Wiley & Sons. This book was released on 2019-11-04 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: Brings a fresh point of view to the current state of correlative imaging and the future of the field This book provides contributions from international experts on correlative imaging, describing their vision of future developments in the field based on where it is today. Starting with a brief historical overview of how the field evolved, it presents the latest developments in microscopy that facilitate the correlative workflow. It also discusses the need for an ideal correlative probe, applications in proteomic and elemental analysis, interpretation methods, and how correlative imaging can incorporate force microscopy, soft x-ray tomography, and volume electron microscopy techniques. Work on placing individual molecules within cells is also featured. Correlative Imaging: Focusing on the Future offers in-depth chapters on: correlative imaging from an LM perspective; the importance of sample processing for correlative imaging; correlative light and volume EM; correlation with scanning probe microscopies; and integrated microscopy. It looks at: cryo-correlative microscopy; correlative cryo soft X-ray imaging; and array tomography. Hydrated-state correlative imaging in vacuo, correlating data from different imaging modalities, and big data in correlative imaging are also considered. Brings a fresh view to one of the hottest topics within the imaging community: the correlative imaging field Discusses current research and offers expert thoughts on the field’s future developments Presented by internationally-recognized editors and contributors with extensive experience in research and applications Of interest to scientists working in the fields of imaging, structural biology, cell biology, developmental biology, neurobiology, cancer biology, infection and immunity, biomaterials and biomedicine Part of the Wiley–Royal Microscopical Society series Correlative Imaging: Focusing on the Future will appeal to those working in the expanding field of the biosciences, correlative microscopy and related microscopic areas. It will also benefit graduate students working in microscopy, as well as anyone working in the microscopy imaging field in biomedical research.
Book Synopsis Exploring Scanning Probe Microscopy with MATHEMATICA by : Dror Sarid
Download or read book Exploring Scanning Probe Microscopy with MATHEMATICA written by Dror Sarid and published by John Wiley & Sons. This book was released on 2007-02-27 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
Book Synopsis Scanning Probe Microscopy by : Bert Voigtländer
Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Book Synopsis Nanoscale Electrochemistry by : Andrew J. Wain
Download or read book Nanoscale Electrochemistry written by Andrew J. Wain and published by Elsevier. This book was released on 2021-09-14 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoscale Electrochemistry focuses on challenges and advances in electrochemical nanoscience at solid–liquid interfaces, highlighting the most prominent developments of the last decade. Nanotechnology has had a tremendous effect on the multidisciplinary field of electrochemistry, yielding new fundamental insights that have broadened our understanding of interfacial processes and stimulating new and diverse applications. The book begins with a tutorial chapter to introduce the principles of nanoscale electrochemical systems and emphasize their unique behavior compared with their macro/microscopic counterparts. Building on this, the following three chapters present analytical applications, such as sensing and electrochemical imaging, that are familiar to the traditional electrochemist but whose extension to the nanoscale is nontrivial and reveals new chemical information. The subsequent three chapters present exciting new electrochemical methodologies that are specific to the nanoscale, including "single entity"-based methods and surface-enhanced electrochemical spectroscopy. These techniques, now sufficiently mature for exposition, have paved the way for major developments in our understanding of solid–liquid interfaces and continue to push electrochemical analysis toward atomic-length scales. The final three chapters address the rich overlap between electrochemistry and nanomaterials science, highlighting notable applications in energy conversion and storage. This is an important reference for both academic and industrial researchers who are seeking to learn more about how nanoscale electrochemistry has developed in recent years. Outlines the major applications of nanoscale electrochemistry in energy storage, spectroscopy and biology Summarizes the major principles of nanoscale electrochemical systems, exploring how they differ from similar system types Discusses the major challenges of electrochemical analysis at the nanoscale
Book Synopsis Kelvin Probe Force Microscopy (KPFM) for Nanoelectronic Device Characterisation by : Sheng Ye
Download or read book Kelvin Probe Force Microscopy (KPFM) for Nanoelectronic Device Characterisation written by Sheng Ye and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Microscopy by : Sergei V. Kalinin
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Book Synopsis Kelvin Probe Force Microscopy in Liquid Using Electrochemical Force Microscopy by :
Download or read book Kelvin Probe Force Microscopy in Liquid Using Electrochemical Force Microscopy written by and published by . This book was released on 2015 with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt: Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid-liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid-liquid interface.
Book Synopsis Time-domain Kelvin Probe Force Microscopy for Local Ultra-fast Decay Time Measurements by : Zeno Schumacher
Download or read book Time-domain Kelvin Probe Force Microscopy for Local Ultra-fast Decay Time Measurements written by Zeno Schumacher and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "Atomic force microscopy (AFM) was developed in the mid 1980's to measure the topography of a sample with atomic resolution. Since the first reported atomic resolution images, AFM has constantly been developed further to gain more insights into structure and property at the nanometer scale. Its great advantage is the capability to spatially resolve the tip-sample interaction at a sub-nanometer scale. Extensive research and development was conducted over the past two decades to not only measure the structure of a sample but also to extract information about the local properties. Kelvin Probe Force Microscopy is an example of such a technique, enabling the measurement of the local contact potential between the AFM tip and the sample. In this thesis, AFM is used to spatially resolve the surface potential generated upon illumination of a sample with light.A new technique to accurately measure the change of the contact potential difference under pulsed illumination was developed and implemented. This new measurement technique was needed since we reached the limit of currently available methods. These did not allow the measurement of the surface photovoltage as a function of illumination wavelength or time. This new method allows a much more accurate determination of surface potential differences. Resolving the surface photovoltage on a nanometer length scale with AFM can be of great interest in particular if one can additionally gain information about the temporal response of the sample. To address this, we developed a method to study the decay of the surface photovoltage by non-contact AFM, which is only limited by the underlying physics process. The approach used to achieve fast time resolution measurements is discussed in a general context. We demonstrate that the well known fundamental sensitivity limits of force detection also govern the achievable time resolution. The time resolved methods developed in this thesis can be adapted to measure time resolved ion diffusion, thermal response and electronic pulse propagation. As a proof for the novel measurement method, the ultra-fast decay time of the photocarriers in low temperature grown GaAs of about 1 ps was measured by AFM. These experiments were implemented by combining a traditional optical pump-probe modulated excitation with localized readout by AFM, The spatial resolution is therefore given by the AFM setup and not the optical excitation." --
Book Synopsis Characterization of Materials by : John Wiley & Sons Inc
Download or read book Characterization of Materials written by John Wiley & Sons Inc and published by John Wiley & Sons. This book was released on 2002-10-15 with total page 1390 pages. Available in PDF, EPUB and Kindle. Book excerpt: "A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--
Book Synopsis Kelvin Probe Force Microscopy of Metallic Surfaces Used in Casimir Force Measurements by :
Download or read book Kelvin Probe Force Microscopy of Metallic Surfaces Used in Casimir Force Measurements written by and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Microscopies Beyond Imaging by : Paolo Samorì
Download or read book Scanning Probe Microscopies Beyond Imaging written by Paolo Samorì and published by John Wiley & Sons. This book was released on 2006-08-21 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book to focus on the use of SPMs to actively manipulate molecules and nanostructures on surfaces goes way beyond conventional treatments of scanning microscopy merely for imaging purposes. It reviews recent progress in the use of SPMs on such soft materials as polymers, with a particular emphasis on chemical discrimination, mechanical properties, tip-induced reactions and manipulations, as well as their nanoscale electrical properties. Detailing the practical application potential of this hot topic, this book is of great interest to specialists of wide-ranging disciplines, including physicists, chemists, materials scientists, spectroscopy experts, surface scientists, and engineers.
