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Author : ASM International
Publisher : ASM International
ISBN 13 : 161503076X
Total Pages : 453 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa '98 written by ASM International and published by ASM International. This book was released on 1998-01-01 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030905
Total Pages : 372 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2007-01-01 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Author : ASM International
Publisher : ASM International
ISBN 13 : 1627082735
Total Pages : 540 pages
Book Rating : 4.6/5 (27 download)
Download or read book ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030859
Total Pages : 456 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa 2001 written by ASM International and published by ASM International. This book was released on 2001-01-01 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 666 pages
Book Rating : 4.F/5 ( download)
Download or read book International Aerospace Abstracts written by and published by . This book was released on 1988 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1930 pages
Book Rating : 4.:/5 ( download)
Download or read book Official Gazette of the United States Patent and Trademark Office written by and published by . This book was released on 1988 with total page 1930 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Grace M. Davidson
Publisher : ASM International
ISBN 13 : 1615030824
Total Pages : 310 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 1997: International Symposium for Testing and Failure Analysis written by Grace M. Davidson and published by ASM International. This book was released on 1997-01-01 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : ASM International
ISBN 13 : 1615037276
Total Pages : 487 pages
Book Rating : 4.6/5 (15 download)
Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030883
Total Pages : 524 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa 2005 written by ASM International and published by ASM International. This book was released on 2005-01-01 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. S. M. International
Publisher : ASM International
ISBN 13 : 1627080228
Total Pages : 634 pages
Book Rating : 4.6/5 (27 download)
Download or read book ISTFA 2013 written by A. S. M. International and published by ASM International. This book was released on 2013-01-01 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author :
Publisher :
ISBN 13 :
Total Pages : 1000 pages
Book Rating : 4.3/5 (91 download)
Download or read book Alloys Index written by and published by . This book was released on 1985 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : F. Lombardi
Publisher : Springer Science & Business Media
ISBN 13 : 9400914172
Total Pages : 531 pages
Book Rating : 4.4/5 (9 download)
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Author :
Publisher :
ISBN 13 :
Total Pages : 594 pages
Book Rating : 4.0/5 ( download)
Download or read book Conference Proceedings written by and published by . This book was released on 1989 with total page 594 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author :
Publisher :
ISBN 13 :
Total Pages : 356 pages
Book Rating : 4.3/5 (91 download)
Download or read book Directory of Published Proceedings written by and published by . This book was released on 1990 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 562 pages
Book Rating : 4.3/5 (91 download)
Download or read book Materials Performance written by and published by . This book was released on 1982 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : K. Kiss
Publisher : Elsevier
ISBN 13 : 0444597476
Total Pages : 415 pages
Book Rating : 4.4/5 (445 download)
Download or read book Problem Solving with Microbeam Analysis written by K. Kiss and published by Elsevier. This book was released on 2012-12-02 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.
