Introduction To Spectroscopic Ellipsometry Of Thin Film Materials

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Introduction to Spectroscopic Ellipsometry of Thin Film Materials

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Author : Andrew T. S. Wee
Publisher : John Wiley & Sons
ISBN 13 : 3527833951
Total Pages : 213 pages
Book Rating : 4.5/5 (278 download)

Book Synopsis Introduction to Spectroscopic Ellipsometry of Thin Film Materials by : Andrew T. S. Wee

Download or read book Introduction to Spectroscopic Ellipsometry of Thin Film Materials written by Andrew T. S. Wee and published by John Wiley & Sons. This book was released on 2022-03-08 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Spectroscopic Ellipsometry

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Author : Harland G. Tompkins
Publisher : Momentum Press
ISBN 13 : 1606507281
Total Pages : 138 pages
Book Rating : 4.6/5 (65 download)

Book Synopsis Spectroscopic Ellipsometry by : Harland G. Tompkins

Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Introduction to Spectroscopic Ellipsometry of Thin Film Materials

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Author : Andrew Thye Shen Wee
Publisher : John Wiley & Sons
ISBN 13 : 3527349510
Total Pages : 213 pages
Book Rating : 4.5/5 (273 download)

Book Synopsis Introduction to Spectroscopic Ellipsometry of Thin Film Materials by : Andrew Thye Shen Wee

Download or read book Introduction to Spectroscopic Ellipsometry of Thin Film Materials written by Andrew Thye Shen Wee and published by John Wiley & Sons. This book was released on 2022-04-11 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Spectroscopic Ellipsometry

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Author : Hiroyuki Fujiwara
Publisher : John Wiley & Sons
ISBN 13 : 9780470060186
Total Pages : 388 pages
Book Rating : 4.0/5 (61 download)

Book Synopsis Spectroscopic Ellipsometry by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Spectroscopic Ellipsometry for Photovoltaics

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Author : Hiroyuki Fujiwara
Publisher : Springer
ISBN 13 : 3319753770
Total Pages : 602 pages
Book Rating : 4.3/5 (197 download)

Book Synopsis Spectroscopic Ellipsometry for Photovoltaics by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry for Photovoltaics written by Hiroyuki Fujiwara and published by Springer. This book was released on 2019-01-10 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Handbook of Ellipsometry

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Author : Harland Tompkins
Publisher : William Andrew
ISBN 13 : 0815517475
Total Pages : 887 pages
Book Rating : 4.8/5 (155 download)

Book Synopsis Handbook of Ellipsometry by : Harland Tompkins

Download or read book Handbook of Ellipsometry written by Harland Tompkins and published by William Andrew. This book was released on 2005-01-06 with total page 887 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.

Optical Properties of Materials and Their Applications

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Author : Jai Singh
Publisher : John Wiley & Sons
ISBN 13 : 111950631X
Total Pages : 667 pages
Book Rating : 4.1/5 (195 download)

Book Synopsis Optical Properties of Materials and Their Applications by : Jai Singh

Download or read book Optical Properties of Materials and Their Applications written by Jai Singh and published by John Wiley & Sons. This book was released on 2020-01-07 with total page 667 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a semi-quantitative approach to recent developments in the study of optical properties of condensed matter systems Featuring contributions by noted experts in the field of electronic and optoelectronic materials and photonics, this book looks at the optical properties of materials as well as their physical processes and various classes. Taking a semi-quantitative approach to the subject, it presents a summary of the basic concepts, reviews recent developments in the study of optical properties of materials and offers many examples and applications. Optical Properties of Materials and Their Applications, 2nd Edition starts by identifying the processes that should be described in detail and follows with the relevant classes of materials. In addition to featuring four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry, the book covers: optical properties of disordered condensed matter and glasses; concept of excitons; photoluminescence, photoinduced changes, and electroluminescence in noncrystalline semiconductors; and photoinduced bond breaking and volume change in chalcogenide glasses. Also included are chapters on: nonlinear optical properties of photonic glasses; kinetics of the persistent photoconductivity in crystalline III-V semiconductors; and transparent white OLEDs. In addition, readers will learn about excitonic processes in quantum wells; optoelectronic properties and applications of quantum dots; and more. Covers all of the fundamentals and applications of optical properties of materials Includes theory, experimental techniques, and current and developing applications Includes four new chapters on optoelectronic properties of organic semiconductors, recent advances in electroluminescence, perovskites, and ellipsometry Appropriate for materials scientists, chemists, physicists and electrical engineers involved in development of electronic materials Written by internationally respected professionals working in physics and electrical engineering departments and government laboratories Optical Properties of Materials and Their Applications, 2nd Edition is an ideal book for senior undergraduate and postgraduate students, and teaching and research professionals in the fields of physics, chemistry, chemical engineering, materials science, and materials engineering.

Ellipsometry of Functional Organic Surfaces and Films

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Author : Karsten Hinrichs
Publisher : Springer
ISBN 13 : 3319758950
Total Pages : 549 pages
Book Rating : 4.3/5 (197 download)

Book Synopsis Ellipsometry of Functional Organic Surfaces and Films by : Karsten Hinrichs

Download or read book Ellipsometry of Functional Organic Surfaces and Films written by Karsten Hinrichs and published by Springer. This book was released on 2018-05-06 with total page 549 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

Ellipsometry at the Nanoscale

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Author : Maria Losurdo
Publisher : Springer Science & Business Media
ISBN 13 : 3642339565
Total Pages : 740 pages
Book Rating : 4.6/5 (423 download)

Book Synopsis Ellipsometry at the Nanoscale by : Maria Losurdo

Download or read book Ellipsometry at the Nanoscale written by Maria Losurdo and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Advanced Characterization Techniques for Thin Film Solar Cells

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Author : Daniel Abou-Ras
Publisher : John Wiley & Sons
ISBN 13 : 3527699015
Total Pages : 760 pages
Book Rating : 4.5/5 (276 download)

Book Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras

Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Daniel Abou-Ras and published by John Wiley & Sons. This book was released on 2016-07-13 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

In Situ Characterization of Thin Film Growth

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Author : Gertjan Koster
Publisher : Elsevier
ISBN 13 : 0857094955
Total Pages : 295 pages
Book Rating : 4.8/5 (57 download)

Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster

Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques

Spectroscopic Ellipsometry Data Analysis

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Author :
Publisher :
ISBN 13 :
Total Pages : 27 pages
Book Rating : 4.:/5 (684 download)

Book Synopsis Spectroscopic Ellipsometry Data Analysis by :

Download or read book Spectroscopic Ellipsometry Data Analysis written by and published by . This book was released on 1997 with total page 27 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectroscopic ellipsometry is a very powerful technique for optical characterization of thin-film and bulk materials, but the technique measures functions of complex reflection coefficients, which are usually not of interest per se. The interesting characteristics such as film thickness, surface roughness thickness, and optical functions can be determined only by modeling the near-surface region of the sample. However, the measured quantities are not equivalent to those determined from the modeling. Ellipsometry measurements determine elements of the sample Mueller matrix, but the usual result of modeling calculations are elements of the sample. Often this difference is academic, but if the sample depolarizes the light, it is not. Ellipsometry calculations also include methods for determining the optical functions of materials. Data for bulk materials are usually accurate for substrates, but are not appropriate for most thin films. Therefore, reasonable parameterizations are quite useful in performing spectroscopic ellipsometry data analysis. Recently, there has been an increased interest in anisotropic materials, both in thin-film and bulk form. A generalized procedure will be presented for calculating the elements of the Jones matrix for any number of layers, any one of which may or may not be uniaxial.

Handbook of Thin Film Materials: Characterization and spectroscopy of thin films

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Author : Hari Singh Nalwa
Publisher :
ISBN 13 :
Total Pages : 816 pages
Book Rating : 4.3/5 (91 download)

Book Synopsis Handbook of Thin Film Materials: Characterization and spectroscopy of thin films by : Hari Singh Nalwa

Download or read book Handbook of Thin Film Materials: Characterization and spectroscopy of thin films written by Hari Singh Nalwa and published by . This book was released on 2002 with total page 816 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vol.1: Deposition and processing of thin films; Vol.2: Characterization and spectroscopy of thin films; Vol.3: Ferroelectric and dielectric thin films; Vol.4: Semiconductor and superconductor thin films; Vol.5: Nanomaterials and magnetic thin flims

Infrared Spectroscopic Ellipsometry

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Author : Arnulf Röseler
Publisher : VCH
ISBN 13 :
Total Pages : 168 pages
Book Rating : 4.X/5 (3 download)

Book Synopsis Infrared Spectroscopic Ellipsometry by : Arnulf Röseler

Download or read book Infrared Spectroscopic Ellipsometry written by Arnulf Röseler and published by VCH. This book was released on 1990 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Membrane Characterization

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Author : José Ignacio Calvo Díez
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3110792311
Total Pages : 347 pages
Book Rating : 4.1/5 (17 download)

Book Synopsis Membrane Characterization by : José Ignacio Calvo Díez

Download or read book Membrane Characterization written by José Ignacio Calvo Díez and published by Walter de Gruyter GmbH & Co KG. This book was released on 2024-10-21 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt: Membrane technology has become an essential tool in many industrial processes in which the separation or fractionation of various species is necessary to obtain or recover high value-added products. In these processes, the synthetic membranes usually play a filter role, being characterized by the size of the pores present in it, which delimit the size of the molecules to be separated. It is therefore necessary to have a precise knowledge of the characteristic size of said pores. In this book, the main techniques that can be used to determine the mean pore size and the pore size distribution of a synthetic membrane are analyzed and discussed, from the point of view of their theoretical basis, with special attention to equipment that should be used for each technique, as well as reviewing their advantages and disadvantages. Through this text, the researcher or responsible of the quality-control at membrane manufacturing companies will be able to know decide properly which of the porosimetric techniques is more adequate for the knowledge that needs to be obtained from their filters.

Functional Oxide Based Thin-Film Materials

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Author : Dong-Sing Wuu
Publisher : MDPI
ISBN 13 : 3039288377
Total Pages : 160 pages
Book Rating : 4.0/5 (392 download)

Book Synopsis Functional Oxide Based Thin-Film Materials by : Dong-Sing Wuu

Download or read book Functional Oxide Based Thin-Film Materials written by Dong-Sing Wuu and published by MDPI. This book was released on 2020-05-29 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Special Issue on Functional Oxide-Based Thin-Film Materials touches on the latest advancements in several aspects related to material science: the synthesis of novel oxide, photoluminescence characteristics, photocatalytic ability, energy storage, light emitter studies, low-emissivity glass coatings, and investigations of both nanostructure and thin-film properties. It represents an amalgamation of specialists working with device applications and shedding light on the properties and behavior of thin-film oxides (e.g., GaOx, Ga2O3, HfO2, LiNbO3, and doped ZnO, among numerous others). The papers cover many aspects of thin-film science and technology, from thin film to nanostructure and from material properties to optoelectronic applications, thus reflecting the many interests of the community of scientists active in the field.

Characterization of Thin Films by Spectroscopic Ellipsometry

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Author : Lawrence John D'Aries
Publisher :
ISBN 13 :
Total Pages : 200 pages
Book Rating : 4.:/5 (779 download)

Book Synopsis Characterization of Thin Films by Spectroscopic Ellipsometry by : Lawrence John D'Aries

Download or read book Characterization of Thin Films by Spectroscopic Ellipsometry written by Lawrence John D'Aries and published by . This book was released on 1986 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: