Iddq Testing In Low Power Supply Cmos Circuits

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IDDQ Testing of VLSI Circuits

Author : Ravi K. Gulati
Publisher : Springer Science & Business Media
ISBN 13 : 1461531462
Total Pages : 121 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis IDDQ Testing of VLSI Circuits by : Ravi K. Gulati

Download or read book IDDQ Testing of VLSI Circuits written by Ravi K. Gulati and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Low-Power CMOS Circuits

Author : Christian Piguet
Publisher : CRC Press
ISBN 13 : 1351836609
Total Pages : 499 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Low-Power CMOS Circuits by : Christian Piguet

Download or read book Low-Power CMOS Circuits written by Christian Piguet and published by CRC Press. This book was released on 2018-10-03 with total page 499 pages. Available in PDF, EPUB and Kindle. Book excerpt: The power consumption of microprocessors is one of the most important challenges of high-performance chips and portable devices. In chapters drawn from Piguet's recently published Low-Power Electronics Design, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools addresses the design of low-power circuitry in deep submicron technologies. It provides a focused reference for specialists involved in designing low-power circuitry, from transistors to logic gates. The book is organized into three broad sections for convenient access. The first examines the history of low-power electronics along with a look at emerging and possible future technologies. It also considers other technologies, such as nanotechnologies and optical chips, that may be useful in designing integrated circuits. The second part explains the techniques used to reduce power consumption at low levels. These include clock gating, leakage reduction, interconnecting and communication on chips, and adiabatic circuits. The final section discusses various CAD tools for designing low-power circuits. This section includes three chapters that demonstrate the tools and low-power design issues at three major companies that produce logic synthesizers. Providing detailed examinations contributed by leading experts, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools supplies authoritative information on how to design and model for high performance with low power consumption in modern integrated circuits. It is a must-read for anyone designing modern computers or embedded systems.

Power-Aware Testing and Test Strategies for Low Power Devices

Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Power-Aware Testing and Test Strategies for Low Power Devices by : Patrick Girard

Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Microelectronics Failure Analysis

Author : EDFAS Desk Reference Committee
Publisher : ASM International
ISBN 13 : 1615037268
Total Pages : 673 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis Microelectronics Failure Analysis by : EDFAS Desk Reference Committee

Download or read book Microelectronics Failure Analysis written by EDFAS Desk Reference Committee and published by ASM International. This book was released on 2011 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes bibliographical references and index.

Low Power Designs in Nanodevices and Circuits for Emerging Applications

Author : Shilpi Birla
Publisher : CRC Press
ISBN 13 : 1000995178
Total Pages : 339 pages
Book Rating : 4.0/5 (9 download)

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Book Synopsis Low Power Designs in Nanodevices and Circuits for Emerging Applications by : Shilpi Birla

Download or read book Low Power Designs in Nanodevices and Circuits for Emerging Applications written by Shilpi Birla and published by CRC Press. This book was released on 2023-11-14 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference textbook discusses low power designs for emerging applications. This book focuses on the research challenges associated with theory, design, and applications towards emerging Microelectronics and VLSI device design and developments, about low power consumptions. The advancements in large-scale integration technologies are principally responsible for the growth of the electronics industry. This book is focused on senior undergraduates, graduate students, and professionals in the field of electrical and electronics engineering, nanotechnology. This book: Discusses various low power techniques and applications for designing efficient circuits Covers advance nanodevices such as FinFETs, TFETs, CNTFETs Covers various emerging areas like Quantum-Dot Cellular Automata Circuits and FPGAs and sensors Discusses applications like memory design for low power applications using nanodevices The number of options for ICs in control applications, telecommunications, high-performance computing, and consumer electronics continues to grow with the emergence of VLSI designs. Nanodevices have revolutionized the electronics market and human life; it has impacted individual life to make it more convenient. They are ruling every sector such as electronics, energy, biomedicine, food, environment, and communication. This book discusses various emerging low power applications using CMOS and other emerging nanodevices.

Principles of Testing Electronic Systems

Author : Samiha Mourad
Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

System-on-Chip

Author : Bashir M. Al-Hashimi
Publisher : IET
ISBN 13 : 0863415520
Total Pages : 940 pages
Book Rating : 4.8/5 (634 download)

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Book Synopsis System-on-Chip by : Bashir M. Al-Hashimi

Download or read book System-on-Chip written by Bashir M. Al-Hashimi and published by IET. This book was released on 2006-01-31 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

Nanometer CMOS ICs

Author : Harry J.M. Veendrick
Publisher : Springer
ISBN 13 : 3319475975
Total Pages : 639 pages
Book Rating : 4.3/5 (194 download)

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Book Synopsis Nanometer CMOS ICs by : Harry J.M. Veendrick

Download or read book Nanometer CMOS ICs written by Harry J.M. Veendrick and published by Springer. This book was released on 2017-04-28 with total page 639 pages. Available in PDF, EPUB and Kindle. Book excerpt: This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Author : Andrei Pavlov
Publisher : Springer Science & Business Media
ISBN 13 : 1402083637
Total Pages : 203 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by : Andrei Pavlov

Download or read book CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies written by Andrei Pavlov and published by Springer Science & Business Media. This book was released on 2008-06-01 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Proceeding of the Second International Conference on Microelectronics, Computing & Communication Systems (MCCS 2017)

Author : Vijay Nath
Publisher : Springer
ISBN 13 : 9811082340
Total Pages : 834 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Proceeding of the Second International Conference on Microelectronics, Computing & Communication Systems (MCCS 2017) by : Vijay Nath

Download or read book Proceeding of the Second International Conference on Microelectronics, Computing & Communication Systems (MCCS 2017) written by Vijay Nath and published by Springer. This book was released on 2018-07-30 with total page 834 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volume presents high quality papers presented at the Second International Conference on Microelectronics, Computing & Communication Systems (MCCS 2017). The book discusses recent trends in technology and advancement in MEMS and nanoelectronics, wireless communications, optical communication, instrumentation, signal processing, image processing, bioengineering, green energy, hybrid vehicles, environmental science, weather forecasting, cloud computing, renewable energy, RFID, CMOS sensors, actuators, transducers, telemetry systems, embedded systems, and sensor network applications. It includes original papers based on original theoretical, practical, experimental, simulations, development, application, measurement, and testing. The applications and solutions discussed in the book will serve as a good reference material for future works.

Introduction to IDDQ Testing

Author : S. Chakravarty
Publisher : Springer Science & Business Media
ISBN 13 : 146156137X
Total Pages : 336 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Introduction to IDDQ Testing by : S. Chakravarty

Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Low-Power CMOS Design

Author : Anantha Chandrakasan
Publisher : John Wiley & Sons
ISBN 13 : 0780334299
Total Pages : 656 pages
Book Rating : 4.7/5 (83 download)

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Book Synopsis Low-Power CMOS Design by : Anantha Chandrakasan

Download or read book Low-Power CMOS Design written by Anantha Chandrakasan and published by John Wiley & Sons. This book was released on 1998-02-11 with total page 656 pages. Available in PDF, EPUB and Kindle. Book excerpt: This collection of important papers provides a comprehensive overview of low-power system design, from component technologies and circuits to architecture, system design, and CAD techniques. LOW POWER CMOS DESIGN summarizes the key low-power contributions through papers written by experts in this evolving field.

Multi-Threshold CMOS Digital Circuits

Author : Mohab Anis
Publisher : Springer Science & Business Media
ISBN 13 : 1461503914
Total Pages : 228 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Multi-Threshold CMOS Digital Circuits by : Mohab Anis

Download or read book Multi-Threshold CMOS Digital Circuits written by Mohab Anis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This excellent survey of state-of-the-art techniques discusses the MTCMOS technology that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. It addresses the leakage problem in a number of designs for combinational, sequential, dynamic and current-steering logic.

Microelectronics

Author : Jerry C. Whitaker
Publisher : CRC Press
ISBN 13 : 1351836374
Total Pages : 485 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Microelectronics by : Jerry C. Whitaker

Download or read book Microelectronics written by Jerry C. Whitaker and published by CRC Press. This book was released on 2018-10-03 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: When it comes to electronics, demand grows as technology shrinks. From consumer and industrial markets to military and aerospace applications, the call is for more functionality in smaller and smaller devices. Culled from the second edition of the best-selling Electronics Handbook, Microelectronics, Second Edition presents a summary of the current state of microelectronics and its innovative directions. This book focuses on the materials, devices, and applications of microelectronics technology. It details the IC design process and VLSI circuits, including gate arrays, programmable logic devices and arrays, parasitic capacitance, and transmission line delays. Coverage ranges from thermal properties and semiconductor materials to MOSFETs, digital logic families, memory devices, microprocessors, digital-to-analog and analog-to-digital converters, digital filters, and multichip module technology. Expert contributors discuss applications in machine vision, ad hoc networks, printing technologies, and data and optical storage systems. The book also includes defining terms, references, and suggestions for further reading. This edition features two new sections on fundamental properties and semiconductor devices. With updated material and references in every chapter, Microelectronics, Second Edition is an essential reference for work with microelectronics, electronics, circuits, systems, semiconductors, logic design, and microprocessors.

CMOS Test and Evaluation

Author : Manjul Bhushan
Publisher : Springer
ISBN 13 : 1493913492
Total Pages : 431 pages
Book Rating : 4.4/5 (939 download)

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Book Synopsis CMOS Test and Evaluation by : Manjul Bhushan

Download or read book CMOS Test and Evaluation written by Manjul Bhushan and published by Springer. This book was released on 2014-12-03 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Nanometer CMOS ICs

Author : Harry Veendrick
Publisher : Springer Nature
ISBN 13 : 303164249X
Total Pages : 697 pages
Book Rating : 4.0/5 (316 download)

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Book Synopsis Nanometer CMOS ICs by : Harry Veendrick

Download or read book Nanometer CMOS ICs written by Harry Veendrick and published by Springer Nature. This book was released on with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Design of System on a Chip

Author : Ricardo Reis
Publisher : Springer Science & Business Media
ISBN 13 : 1402079281
Total Pages : 258 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Design of System on a Chip by : Ricardo Reis

Download or read book Design of System on a Chip written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2004-07-14 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design of System on a Chip is the first of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in Brazil in the recent years by prominent authors from all over the world. In particular the first book deals with components and circuits. Device models have to satisfy the conditions to be computationally economical in addition to be accurate and to scale over various generations of technology. In addition the book addresses issues of the parasitic behavior of deep sub-micron components, such as parameter variations and sub-threshold effects. Furthermore various authors deal with items like mixed signal components and memories. We wind up with an exposition of the technology problems to be solved if our community wants to maintain the pace of the "International Technology Roadmap for Semiconductors" (ITRS).