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Author : J. H. Mazur
Publisher :
ISBN 13 :
Total Pages : 16 pages
Book Rating : 4.:/5 (834 download)
Download or read book High Resolution Electron Microscopy Studies of Native Oxide on Silicon written by J. H. Mazur and published by . This book was released on 1983 with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zara Shiao-Huong Weng-Sieh
Publisher :
ISBN 13 :
Total Pages : 320 pages
Book Rating : 4.:/5 (33 download)
Download or read book Electron Microscopy Investigation of Silicon-on-insulator Structures Formed by Selective Epitaxial Growth of Silicon and Epitaxial Lateral Overgrowth of Oxide written by Zara Shiao-Huong Weng-Sieh and published by . This book was released on 1992 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Cullis
Publisher : CRC Press
ISBN 13 : 9780854981588
Total Pages : 552 pages
Book Rating : 4.9/5 (815 download)
Download or read book Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983 written by Cullis and published by CRC Press. This book was released on 1983-01-01 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A.G. Cullis
Publisher : CRC Press
ISBN 13 : 1000112160
Total Pages : 533 pages
Book Rating : 4.0/5 (1 download)
Download or read book Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983 written by A.G. Cullis and published by CRC Press. This book was released on 2020-11-25 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Author :
Publisher :
ISBN 13 :
Total Pages : 1028 pages
Book Rating : 4.3/5 (91 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 1028 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author : Yves J. Chabal
Publisher : Springer Science & Business Media
ISBN 13 : 3642567118
Total Pages : 269 pages
Book Rating : 4.6/5 (425 download)
Download or read book Fundamental Aspects of Silicon Oxidation written by Yves J. Chabal and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: Discusses silicon oxidation in a tutorial fashion from both experimental and theoretical viewpoints. The authors report on the state of the art both at Lucent Technology and in academic research. The book will appeal to researchers and advanced students.
Author : Jerzy Henryk Mazur
Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (29 download)
Download or read book Atomic Structure of the Silicon/silicon Dioxide Interface written by Jerzy Henryk Mazur and published by . This book was released on 1986 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : N. M. Ravindra
Publisher :
ISBN 13 :
Total Pages : 18 pages
Book Rating : 4.:/5 (227 download)
Download or read book Silicon Oxidation and SiO2 Interface of Thin Oxides written by N. M. Ravindra and published by . This book was released on 1986 with total page 18 pages. Available in PDF, EPUB and Kindle. Book excerpt: High Resolution Transmission Electron Microscopy (HRTEM) and ellipsometry techniques have been employed to measure thicknesses of silicon oxide, grown at 800 C in dry oxygen, in the thickness range of 2 to 20 nm. While the oxide growth data measured from TEM obey a linear behavior, those obtained from ellipsometry are seen to follow a linear-parabolic law. The interface structure as function of the increasing oxide thickness was studied using HRTEM. At these oxidation temperatures, we do not see the earlier reported systematic dependence of roughness at the interface on the oxide thickness for oxides grown at 900 C. Attempts aimed at correlating the high resolution transmission electron micrographs with some physical parameters like the refractive index and the dielectric breakdown lead us to considerations of the importance of the effect of protrusions of silicon atoms of 1nm size into SiO2 layers on the interface properties. These findings lead us to explain some key features concerning the refractive index, density and dielectric strength of thin SiO2.
Author :
Publisher :
ISBN 13 :
Total Pages : 332 pages
Book Rating : 4.0/5 ( download)
Download or read book Energy Research Abstracts written by and published by . This book was released on 1994-03 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 974 pages
Book Rating : 4.:/5 (31 download)
Download or read book ERDA Energy Research Abstracts written by and published by . This book was released on 1983 with total page 974 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Materials Research Society
Publisher : Pittsburgh, Pa. : Materials Research Society
ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.3/5 (91 download)
Download or read book High Resolution Electron Microscopy of Defects in Materials: Volume 183 written by Materials Research Society and published by Pittsburgh, Pa. : Materials Research Society. This book was released on 1990-08-10 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Robert B. Marcus
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 240 pages
Book Rating : 4.4/5 (91 download)
Download or read book Transmission Electron Microscopy of Silicon VLSI Circuits and Structures written by Robert B. Marcus and published by Wiley-Interscience. This book was released on 1983 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : P G Merli
Publisher : World Scientific
ISBN 13 : 9814555053
Total Pages : 698 pages
Book Rating : 4.8/5 (145 download)
Download or read book Electron Microscopy In Materials Science - Proceedings Of The International School written by P G Merli and published by World Scientific. This book was released on 1993-01-08 with total page 698 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains an updated description of the experimental methods currently used in both Scanning and Transmission Electron Microscopy as well as the principles of electron optics and an outline of the most recent instrumental developments.The authors introduce the fundamental principles at the basis of the different techniques, the approximation used in the development of the theories, their range of validity, while stressing how to get microstructural information relevant in Materials Science.
Author : R.F. Egerton
Publisher : Springer Science & Business Media
ISBN 13 : 1475750994
Total Pages : 491 pages
Book Rating : 4.4/5 (757 download)
Download or read book Electron Energy-Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Author : H. Münder
Publisher : Newnes
ISBN 13 : 0444596348
Total Pages : 344 pages
Book Rating : 4.4/5 (445 download)
Download or read book Porous Silicon: Material, Technology and Devices written by H. Münder and published by Newnes. This book was released on 1996-07-08 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings represent the most recent progress in the field of porous silicon. Several papers present results in which the influence of the formation parameters on the structural and optical properties has been investigated. Further topics dealt with include: the influence of light during the formation process on the photoluminescence behaviour; fundamental mechanism of the photoluminescence; the electroluminescence of porous silicon; applications based on porous silicon; charge carrier transport.
Author : Moon Jea Kim
Publisher :
ISBN 13 :
Total Pages : 64 pages
Book Rating : 4.:/5 (155 download)
Download or read book High Resolution Electron Microscopy and Analytical Electron Microscopy Study of the Gold Silicon Interface Reaction written by Moon Jea Kim and published by . This book was released on 1986 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Samares Kar
Publisher : The Electrochemical Society
ISBN 13 : 1566775701
Total Pages : 676 pages
Book Rating : 4.5/5 (667 download)
Download or read book Physics and Technology of High-k Gate Dielectrics 5 written by Samares Kar and published by The Electrochemical Society. This book was released on 2007 with total page 676 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high dielectric constant materials, processing, metals for gate electrodes, interfaces, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
