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Fault Models In Testing
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Book Synopsis VLSI Fault Modeling and Testing Techniques by : George W. Zobrist
Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.
Book Synopsis Delay Fault Testing for VLSI Circuits by : Angela Krstic
Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Book Synopsis Formal Description Techniques IX by : R. Gotzhein
Download or read book Formal Description Techniques IX written by R. Gotzhein and published by Springer. This book was released on 1996-09-30 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the combined proceedings of the latest IFIP Formal Description Techniques (FDTs) and Protocol Specification, Testing and Verification (PSTV) series. It addresses FDTs applicable to communication protocols and distributed systems, with special emphasis on standardised FDTs. It features state-of-the-art in theory, application, tools and industrialisation of formal description.
Book Synopsis Assessing Fault Model and Test Quality by : Kenneth M. Butler
Download or read book Assessing Fault Model and Test Quality written by Kenneth M. Butler and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.
Book Synopsis Testing Static Random Access Memories by : Said Hamdioui
Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Book Synopsis High Performance Memory Testing by : R. Dean Adams
Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Book Synopsis Data-Driven and Model-Based Methods for Fault Detection and Diagnosis by : Majdi Mansouri
Download or read book Data-Driven and Model-Based Methods for Fault Detection and Diagnosis written by Majdi Mansouri and published by Elsevier. This book was released on 2020-02-05 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: Data-Driven and Model-Based Methods for Fault Detection and Diagnosis covers techniques that improve the quality of fault detection and enhance monitoring through chemical and environmental processes. The book provides both the theoretical framework and technical solutions. It starts with a review of relevant literature, proceeds with a detailed description of developed methodologies, and then discusses the results of developed methodologies, and ends with major conclusions reached from the analysis of simulation and experimental studies. The book is an indispensable resource for researchers in academia and industry and practitioners working in chemical and environmental engineering to do their work safely. - Outlines latent variable based hypothesis testing fault detection techniques to enhance monitoring processes represented by linear or nonlinear input-space models (such as PCA) or input-output models (such as PLS) - Explains multiscale latent variable based hypothesis testing fault detection techniques using multiscale representation to help deal with uncertainty in the data and minimize its effect on fault detection - Includes interval PCA (IPCA) and interval PLS (IPLS) fault detection methods to enhance the quality of fault detection - Provides model-based detection techniques for the improvement of monitoring processes using state estimation-based fault detection approaches - Demonstrates the effectiveness of the proposed strategies by conducting simulation and experimental studies on synthetic data
Book Synopsis Testing of Digital Systems by : N. K. Jha
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Book Synopsis Integrated Circuit Test Engineering by : Ian A. Grout
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Book Synopsis Micro-Electrode-Dot-Array Digital Microfluidic Biochips by : Zipeng Li
Download or read book Micro-Electrode-Dot-Array Digital Microfluidic Biochips written by Zipeng Li and published by Springer. This book was released on 2018-12-14 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an insightful guide to the design, testing and optimization of micro-electrode-dot-array (MEDA) digital microfluidic biochips. The authors focus on the characteristics specific for MEDA biochips, e.g., real-time sensing and advanced microfluidic operations like lamination mixing and droplet shape morphing. Readers will be enabled to enhance the automated design and use of MEDA and to develop a set of solutions to facilitate the full exploitation of design complexities that are possible with standard CMOS fabrication techniques. The book provides the first set of design automation and test techniques for MEDA biochips. The methods described in this book have been validated using fabricated MEDA biochips in the laboratory. Readers will benefit from an in-depth look at the MEDA platform and how to combine microfluidics with software, e.g., applying biomolecular protocols to software-controlled and cyberphysical microfluidic biochips.
Book Synopsis System-level Test and Validation of Hardware/Software Systems by : Matteo Sonza Reorda
Download or read book System-level Test and Validation of Hardware/Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Book Synopsis Testing Software and Systems by : Franz Wotawa
Download or read book Testing Software and Systems written by Franz Wotawa and published by Springer. This book was released on 2016-10-10 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 278th IFIP WG 6.1 International Conference on Testing Software and Systems, ICTSS 2016, held in Graz, Austria, in October 2016. The 12 revised full papers and 6 short papers presented were carefully reviewed and selected from 41 submissions. The papers are organized in topical sections on testing methodologies, heuristics and non-determinism in testing, practical applications, and short contributions.
Book Synopsis A Unified Approach for Timing Verification and Delay Fault Testing by : Mukund Sivaraman
Download or read book A Unified Approach for Timing Verification and Delay Fault Testing written by Mukund Sivaraman and published by Springer Science & Business Media. This book was released on 2012-09-17 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
Book Synopsis Advanced Test Methods for SRAMs by : Alberto Bosio
Download or read book Advanced Test Methods for SRAMs written by Alberto Bosio and published by Springer Science & Business Media. This book was released on 2009-10-08 with total page 179 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Book Synopsis Interconnection Noise in VLSI Circuits by : Francesc Moll
Download or read book Interconnection Noise in VLSI Circuits written by Francesc Moll and published by Springer Science & Business Media. This book was released on 2004 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: Later, simple models of crosstalk and switching noise are used to give an intuitive understanding of these problems. Finally, some verification and test issues related to interconnection noise are discussed. Throughout the book, the examples used to illustrate the discussion are based on digital CMOS circuits, but the general treatment of the problems is from a fundamental point of view, so that the discussion can be applied to different technologies.
Book Synopsis Embedded System Design by : Peter Marwedel
Download or read book Embedded System Design written by Peter Marwedel and published by Springer Science & Business Media. This book was released on 2010-11-16 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until the late 1980s, information processing was associated with large mainframe computers and huge tape drives. During the 1990s, this trend shifted toward information processing with personal computers, or PCs. The trend toward miniaturization continues and in the future the majority of information processing systems will be small mobile computers, many of which will be embedded into larger products and interfaced to the physical environment. Hence, these kinds of systems are called embedded systems. Embedded systems together with their physical environment are called cyber-physical systems. Examples include systems such as transportation and fabrication equipment. It is expected that the total market volume of embedded systems will be significantly larger than that of traditional information processing systems such as PCs and mainframes. Embedded systems share a number of common characteristics. For example, they must be dependable, efficient, meet real-time constraints and require customized user interfaces (instead of generic keyboard and mouse interfaces). Therefore, it makes sense to consider common principles of embedded system design. Embedded System Design starts with an introduction into the area and a survey of specification models and languages for embedded and cyber-physical systems. It provides a brief overview of hardware devices used for such systems and presents the essentials of system software for embedded systems, like real-time operating systems. The book also discusses evaluation and validation techniques for embedded systems. Furthermore, the book presents an overview of techniques for mapping applications to execution platforms. Due to the importance of resource efficiency, the book also contains a selected set of optimization techniques for embedded systems, including special compilation techniques. The book closes with a brief survey on testing. Embedded System Design can be used as a text book for courses on embedded systems and as a source which provides pointers to relevant material in the area for PhD students and teachers. It assumes a basic knowledge of information processing hardware and software. Courseware related to this book is available at http://ls12-www.cs.tu-dortmund.de/~marwedel.
Book Synopsis Random Testing of Digital Circuits by : Rene David
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
