Fabrication and Characterization of Silicon Nanowire Scanning Probes

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ISBN 13 :
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Book Rating : 4.:/5 (122 download)

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Book Synopsis Fabrication and Characterization of Silicon Nanowire Scanning Probes by : Arezo Behroudj

Download or read book Fabrication and Characterization of Silicon Nanowire Scanning Probes written by Arezo Behroudj and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ultra Low Dissipation Silicon Nanowire Resonator Arrays for Scanning Probe Applications

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (126 download)

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Book Synopsis Ultra Low Dissipation Silicon Nanowire Resonator Arrays for Scanning Probe Applications by : Andrew Jordan

Download or read book Ultra Low Dissipation Silicon Nanowire Resonator Arrays for Scanning Probe Applications written by Andrew Jordan and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This work describes the fabrication and characterization of silicon nanowire oscillators for use in ultra-high sensitivity force detection. These structures are optimized for use as scanning probes by fabricating them at the edge of a chip, allowing for easy optical displacement detection. Two sets of nanowire samples are described, with mean diameters of 132 nm and 77 nm. The characterization of the mechanical properties of the nanowire, such as quality factor and resonant frequency, is done by optical interferometry. The thermomechanical noise-limited force sensitivity of these nanowires is recorded across a range of temperatures and reaches as low as 500±20 zN Hz^-1/2 at 4.2 K.

Fabrication and Characterization of Silicon Nanowire Field-effect Sensors

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ISBN 13 :
Total Pages : 294 pages
Book Rating : 4.:/5 (646 download)

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Book Synopsis Fabrication and Characterization of Silicon Nanowire Field-effect Sensors by : David Aaron Routenberg

Download or read book Fabrication and Characterization of Silicon Nanowire Field-effect Sensors written by David Aaron Routenberg and published by . This book was released on 2009 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fabrication and Electrical Characterization of Silicon Nanowire Arrays

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ISBN 13 :
Total Pages : 100 pages
Book Rating : 4.:/5 (299 download)

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Book Synopsis Fabrication and Electrical Characterization of Silicon Nanowire Arrays by : Sarah M. Dilts

Download or read book Fabrication and Electrical Characterization of Silicon Nanowire Arrays written by Sarah M. Dilts and published by . This book was released on 2004 with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 1402030193
Total Pages : 503 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials by : Paula M. Vilarinho

Download or read book Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials written by Paula M. Vilarinho and published by Springer Science & Business Media. This book was released on 2006-06-15 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Fabrication and Characterization of Silicon Nanowire FETs with Coupled Dopants Induced Quantum Dot

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (12 download)

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Book Synopsis Fabrication and Characterization of Silicon Nanowire FETs with Coupled Dopants Induced Quantum Dot by : Zhencheng Tan

Download or read book Fabrication and Characterization of Silicon Nanowire FETs with Coupled Dopants Induced Quantum Dot written by Zhencheng Tan and published by . This book was released on 2019 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Vertically Stacked Silicon Nanowire

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (697 download)

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Book Synopsis Vertically Stacked Silicon Nanowire by :

Download or read book Vertically Stacked Silicon Nanowire written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Xii, 63 leaves : ill. ; 30 cm.

Scanning Probe Microscopy¿in Industrial Applications

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Publisher : John Wiley & Sons
ISBN 13 : 111872304X
Total Pages : 337 pages
Book Rating : 4.1/5 (187 download)

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Book Synopsis Scanning Probe Microscopy¿in Industrial Applications by : Dalia G. Yablon

Download or read book Scanning Probe Microscopy¿in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Silicon Nanowire Sensor from Electron Beam Litography

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ISBN 13 :
Total Pages : 103 pages
Book Rating : 4.:/5 (865 download)

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Book Synopsis Silicon Nanowire Sensor from Electron Beam Litography by : Siti Fatimah Abd Rahman

Download or read book Silicon Nanowire Sensor from Electron Beam Litography written by Siti Fatimah Abd Rahman and published by . This book was released on 2011 with total page 103 pages. Available in PDF, EPUB and Kindle. Book excerpt: This study demonstrates the process development of silicon nanowires (SiNWs) sensor requires both the fabrication of nanoscale diameter wires and standard integration to CMOS process. There are three objectives that applied to this research work. The first objective is to design masks using GDSII Editor Software and AutoCAD, respectively. The second objective is to apply a top-down approach method consists of electron beam and conventional mixed lithography process for device fabrication. Then, the final objective of this work is to analyze the electrical characteristic of the fabricated device in terms of I-V relations using semiconductor parameter analyzer (SPA).

Scanning Probe Techniques for Materials Characterization at Nanometer Scale

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Publisher : The Electrochemical Society
ISBN 13 : 9781566773027
Total Pages : 224 pages
Book Rating : 4.7/5 (73 download)

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Book Synopsis Scanning Probe Techniques for Materials Characterization at Nanometer Scale by : Douglas C. Hansen

Download or read book Scanning Probe Techniques for Materials Characterization at Nanometer Scale written by Douglas C. Hansen and published by The Electrochemical Society. This book was released on 2001 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fabrication and Characterization of Silicon Nanowires

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Publisher : LAP Lambert Academic Publishing
ISBN 13 : 9783846586525
Total Pages : 124 pages
Book Rating : 4.5/5 (865 download)

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Book Synopsis Fabrication and Characterization of Silicon Nanowires by : Vikram Passi

Download or read book Fabrication and Characterization of Silicon Nanowires written by Vikram Passi and published by LAP Lambert Academic Publishing. This book was released on 2012-07 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt: When dimensions of material approach nanoscale, they often reveal startling properties. These unique properties when compared to bulk material make them interesting candidates for new technologies. In a race to sustain Moore's Law, silicon nanowires which possess remarkable properties diverse from bulk-silicon have gained notable attention. With advancement in technology engineers have mastered the art of fabrication of nanowires, but there exists a big gap in understanding various phenomena at this scale. The aim of this work is to bridge the gap and give an insight into some interesting properties and application of silicon nanowires. Using top-down lithography Silicon nanowires are fabricated and various mechanical and electrical properties are studied. The use of functionalized silicon nanowires for gas detection is demonstrated with very large sensitivity and detection window reported for the first time.

Fabrication and characterization of self-sensing and self-actuating piezoresistive microscale silicon cantilevers for an integrated scanning probe microscopy and scanning electron microscopy system

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ISBN 13 :
Total Pages : 146 pages
Book Rating : 4.:/5 (863 download)

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Book Synopsis Fabrication and characterization of self-sensing and self-actuating piezoresistive microscale silicon cantilevers for an integrated scanning probe microscopy and scanning electron microscopy system by : Ute Wenzel

Download or read book Fabrication and characterization of self-sensing and self-actuating piezoresistive microscale silicon cantilevers for an integrated scanning probe microscopy and scanning electron microscopy system written by Ute Wenzel and published by . This book was released on 2012 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Applied Scanning Probe Methods XII

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Publisher : Springer Science & Business Media
ISBN 13 : 3540850392
Total Pages : 271 pages
Book Rating : 4.5/5 (48 download)

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Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.

Silicon Nanowire-based Circuits

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (955 download)

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Book Synopsis Silicon Nanowire-based Circuits by : Diego Chiabrando

Download or read book Silicon Nanowire-based Circuits written by Diego Chiabrando and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fabrication and Characterization of Silicon Nanowires and Metal Nanostructures

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ISBN 13 :
Total Pages : 292 pages
Book Rating : 4.:/5 (71 download)

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Book Synopsis Fabrication and Characterization of Silicon Nanowires and Metal Nanostructures by : Vicki Wai-Shum Lui

Download or read book Fabrication and Characterization of Silicon Nanowires and Metal Nanostructures written by Vicki Wai-Shum Lui and published by . This book was released on 2005 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fabrication and Characterization of Vertical Silicon Nanowire Arrays

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (858 download)

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Book Synopsis Fabrication and Characterization of Vertical Silicon Nanowire Arrays by : Jeffrey M. Weisse

Download or read book Fabrication and Characterization of Vertical Silicon Nanowire Arrays written by Jeffrey M. Weisse and published by . This book was released on 2013 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Thermoelectric devices, which convert temperature gradients into electricity, have the potential to harness waste heat to improve overall energy efficiency. However, current thermoelectric devices are not cost-effective for most applications due to their low efficiencies and high material costs. To improve the overall conversion efficiency, thermoelectric materials should possess material properties that closely resemble a "phonon glass" and an "electron crystal". The desired low thermal and high electrical conductivities allow the thermoelectric device to maintain a high temperature gradient while effectively transporting current. Unfortunately, thermal transport and electrical transport are a closely coupled phenomena and it is difficult to independently engineer each specific conduction mechanism in conventional materials. One strategy to realize this is to generate nanostructured silicon (e.g. silicon nanowires (SiNWs)), which have been shown to reduce thermal conductivity ([kappa]) through enhanced phonon scattering while theoretically preserving the electronic properties; therefore, improving the overall device efficiency. The ability to suppress phonon propagation in nanostructured silicon, which has a bulk phonon mean free path ~ 300 nm at 300 K, has raised substantial interest as an ultra-low [kappa] material capable of reducing the thermal conductivity up to three orders of magnitude lower than that of bulk silicon. While the formation of porous silicon and SiNWs has individually been demonstrated as promising methods to reduce [kappa], there is a lack of research investigating the thermal conductivity in SiNWs containing porosity. We fabricated SiNW arrays using top-down etching methods (deep reactive ion etching and metal-assisted chemical etching) and by tuning the diameter with different patterning methods and tuning the internal porosity with different SiNW etching conditions. The effects of both the porosity and the SiNW dimensions at the array scale are investigated by measuring [kappa] of vertical SiNW arrays using a nanosecond time-domain thermoreflectance technique. In addition to thermoelectric devices, vertical SiNW arrays, due to their anisotropic electronic and optical properties, large surface to volume ratios, resistance to Li-ion pulverization, ability to orthogonalize light absorption and carrier transport directions, and trap light, make vertical SiNW arrays important building blocks for various applications. These may include sensors, solar cells, and Li-ion batteries. Many of these applications benefit from vertical SiNW arrays fabricated on non-silicon based substrates which endow the final devices with the properties of flexibility, transparency, and light-weight while removing any performance limitation of the silicon fabrication substrate. We then developed two vertical transfer printing methods (V-TPMs) that are used to detach SiNW arrays from their original fabrication substrates and subsequently attach them to any desired substrate while retaining their vertical alignment over a large area. The transfer of vertically aligned arrays of uniform length SiNWs is desirable to remove the electrical, thermal, optical, and structural impact from the fabrication substrate and also to enable the integration of vertical SiNWs directly into flexible and conductive substrates. Moreover, realization of a thermoelectric device requires the formation of electrical contacts on both sides of the SiNW arrays. We formed metallic contacts on both ends of the SiNW arrays with a mechanical supporting and electrical insulating polymer in between. Electrical characterization of the SiNW devices exhibited good current-voltage (I-V) characteristics independent of substrates materials and bending conditions. We believe the V-TPMs developed in this work have great potential for manufacturing practical thermoelectric devices as well as high performing, scalable SiNW array devices on flexible and conducting substrates.

Applied Scanning Probe Methods VI

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Publisher : Springer Science & Business Media
ISBN 13 : 3540373195
Total Pages : 372 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Applied Scanning Probe Methods VI by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods VI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-11-07 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.