Evaluation de la technologie CMOS SOI haute résistivité pour application RF jusqu'en bande millimétrique

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ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.:/5 (69 download)

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Book Synopsis Evaluation de la technologie CMOS SOI haute résistivité pour application RF jusqu'en bande millimétrique by : Frédéric Gianesello

Download or read book Evaluation de la technologie CMOS SOI haute résistivité pour application RF jusqu'en bande millimétrique written by Frédéric Gianesello and published by . This book was released on 2006 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: Les transmissions sans fi] n'ont cessé de prendre un essor considérable, que ce soit pour les applications spatiales, les radiocommunications mobiles ou les communications à courtes portées. Depuis quelques années, avec la montée en fréquence des composants, la technologie Silicium est présente dans. le domaine des radiofréquences et des hyperfréquences. Les circuits intégrés micro-ondes nécessitent des composants actifs performants pour des conditions de faibJe polarisation. Mais il apparaît également essentiel de proposer dans le même temps des composants passifs performants afin de pouvoir intégrer toutes les fonctions RF nécessaires Ce dernier point représente le principal écueil auquel les technologies silicium ce sont heurtées de part la nécessité d'utiliser des substrats à pertes afin de pouvoir gérer les probJèmes de « latch up ». Dans cette thèse, nous évaluerons les potentialités RF et millimétriques offertes par les technologies SOI de part leur compatibilité avec des substrats Hautement Résistifs (HR). Après avoir introduit le contexte général de l'étude nous investiguerons les performances offertes par les composants passif intégrés en technologie SOI HR. Ces composants seront alors utilisés dans le cadre de la réalisation de circuits passifs afin de valider ces composants développés et leurs modèles. Nous nous intéresserons alors à l'évolution des performances en bruit du transistor MaS. Nous conclurons en présentant des réalisations d'amplificateurs faible bruit afin de pouvoir effectuer une comparaison entre technologie SOI et silicium standard afin de dégager les potentialités millimétriques offertes par les technologies SOI HR.

mm-Wave Silicon Technology

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Publisher : Springer Science & Business Media
ISBN 13 : 0387765611
Total Pages : 313 pages
Book Rating : 4.3/5 (877 download)

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Book Synopsis mm-Wave Silicon Technology by : Ali M. Niknejad

Download or read book mm-Wave Silicon Technology written by Ali M. Niknejad and published by Springer Science & Business Media. This book was released on 2008-01-03 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book compiles and presents the research results from the past five years in mm-wave Silicon circuits. This area has received a great deal of interest from the research community including several university and research groups. The book covers device modeling, circuit building blocks, phased array systems, and antennas and packaging. It focuses on the techniques that uniquely take advantage of the scale and integration offered by silicon based technologies.

Ultra-Low Voltage Nano-Scale Memories

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Publisher : Springer Science & Business Media
ISBN 13 : 0387688536
Total Pages : 351 pages
Book Rating : 4.3/5 (876 download)

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Book Synopsis Ultra-Low Voltage Nano-Scale Memories by : Kiyoo Itoh

Download or read book Ultra-Low Voltage Nano-Scale Memories written by Kiyoo Itoh and published by Springer Science & Business Media. This book was released on 2007-09-04 with total page 351 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.

Modern Circuit Placement

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Publisher : Springer Science & Business Media
ISBN 13 : 0387687394
Total Pages : 330 pages
Book Rating : 4.3/5 (876 download)

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Book Synopsis Modern Circuit Placement by : Gi-Joon Nam

Download or read book Modern Circuit Placement written by Gi-Joon Nam and published by Springer Science & Business Media. This book was released on 2007-08-26 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers advanced techniques in modern circuit placement. It details all of most recent placement techniques available in the field and analyzes the optimality of these techniques. Coverage includes all the academic placement tools that competed against one another on the same industrial benchmark circuits at the International Symposium on Physical Design (ISPD), these techniques are also extensively being used in industrial tools as well. The book provides significant amounts of analysis on each technique such as trade-offs between quality-of-results (QoR) and runtime.

Design for Manufacturability and Statistical Design

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Publisher : Springer Science & Business Media
ISBN 13 : 0387690115
Total Pages : 319 pages
Book Rating : 4.3/5 (876 download)

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Book Synopsis Design for Manufacturability and Statistical Design by : Michael Orshansky

Download or read book Design for Manufacturability and Statistical Design written by Michael Orshansky and published by Springer Science & Business Media. This book was released on 2007-10-28 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.