Méthodes physiques d'étude des minéraux et des matériaux solides

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Publisher :
ISBN 13 :
Total Pages : 532 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Méthodes physiques d'étude des minéraux et des matériaux solides by : Jean-Pierre Eberhart

Download or read book Méthodes physiques d'étude des minéraux et des matériaux solides written by Jean-Pierre Eberhart and published by . This book was released on 1976 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects

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Publisher : World Scientific
ISBN 13 : 190897964X
Total Pages : 478 pages
Book Rating : 4.9/5 (89 download)

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Book Synopsis Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects by : Rozaliya I Barabash

Download or read book Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects written by Rozaliya I Barabash and published by World Scientific. This book was released on 2014-04-07 with total page 478 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Topics in Electron Diffraction and Microscopy of Materials

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Publisher : CRC Press
ISBN 13 : 9780750305389
Total Pages : 240 pages
Book Rating : 4.3/5 (53 download)

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Book Synopsis Topics in Electron Diffraction and Microscopy of Materials by : Peter. B Hirsch

Download or read book Topics in Electron Diffraction and Microscopy of Materials written by Peter. B Hirsch and published by CRC Press. This book was released on 1999-01-01 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

High Energy Electron Diffraction and Microscopy

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Publisher : Oxford University Press
ISBN 13 : 0191004782
Total Pages : 558 pages
Book Rating : 4.1/5 (91 download)

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Book Synopsis High Energy Electron Diffraction and Microscopy by : L. M. Peng

Download or read book High Energy Electron Diffraction and Microscopy written by L. M. Peng and published by Oxford University Press. This book was released on 2004-01-08 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.

Analyse structurale et chimique des matériaux

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Publisher : Bordas Editions
ISBN 13 : 9782040187972
Total Pages : 614 pages
Book Rating : 4.1/5 (879 download)

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Book Synopsis Analyse structurale et chimique des matériaux by : Jean-Pierre Eberhart

Download or read book Analyse structurale et chimique des matériaux written by Jean-Pierre Eberhart and published by Bordas Editions. This book was released on 1989 with total page 614 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Transmission Electron Microscopy and Diffractometry of Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540437642
Total Pages : 778 pages
Book Rating : 4.4/5 (376 download)

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Book Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz

Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2002 with total page 778 pages. Available in PDF, EPUB and Kindle. Book excerpt: Inelastic electron scattering and spectroscopy. Diffraction from crystals. Electron diffraction and crystallography.

Many-beam Electron Diffraction Related to Electron Microscope Diffraction Contrast

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Publisher : De Gruyter Akademie Forschung
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Many-beam Electron Diffraction Related to Electron Microscope Diffraction Contrast by : Gerhard Kästner

Download or read book Many-beam Electron Diffraction Related to Electron Microscope Diffraction Contrast written by Gerhard Kästner and published by De Gruyter Akademie Forschung. This book was released on 1993 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: The present work is to serve as a theoretical and practical guide for exploiting these possibilities. It comprehensively reviews the required dynamical and kinematical diffraction theory thus closing some gaps, e. g. by systematically comparing "ordinary" and "modified" Bloch waves, or by denoting conditions of a first-order critical voltage effect. It is shown how to classify and simplify many-beam situations and imaging conditions.