Spectroscopic Ellipsometry

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Publisher : John Wiley & Sons
ISBN 13 : 9780470060186
Total Pages : 388 pages
Book Rating : 4.0/5 (61 download)

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Book Synopsis Spectroscopic Ellipsometry by : Hiroyuki Fujiwara

Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Ellipsométrie spectroscopique conventionnelle et généralisée de milieux anisotropes

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ISBN 13 :
Total Pages : 336 pages
Book Rating : 4.:/5 (49 download)

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Book Synopsis Ellipsométrie spectroscopique conventionnelle et généralisée de milieux anisotropes by : Aotmane En Naciri

Download or read book Ellipsométrie spectroscopique conventionnelle et généralisée de milieux anisotropes written by Aotmane En Naciri and published by . This book was released on 1999 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Le travail présenté dans cette thèse est consacré au développement et à l'application de techniques d'ellipsométrie conventionnelle et généralisée pour la caractérisation de milieux anisotropes. Dans la première partie sont exposés les principaux résultats de la théorie électromagnétique des milieux anisotropes et la méthode de calcul des coefficients de réflexion à l'interface d'un milieu anisotrope uniaxe arbitraire. La seconde partie, est consacrée à l'adaptation de l'ellipsomètre à polariseur tournant à trois éléments (PRPSE) à la mesure d'échantillons anisotropes. La troisième partie est dédiée à l'extension de l'ellipsomètre (PRPSE) à l'ellipsométrie généralisée pour déterminer totalement la matrice de Jones comportant des éléments non diagonaux différents de zéro. Les outils logiciels et les procédures expérimentales permettant de remonter aux caractéristiques optiques de la surface d'un échantillon anisotrope ont été réalisés. L'application de ces deux techniques a été consacrée aux mesures d'indices principaux de réfraction complexes ordinaire et extraordinaire de l'iodure mercurique HgI2. L'évolution d'état de surface de HgI2 en fonction du temps a été analysée par l'ellipsomètre PRPSE

Introduction to Spectroscopic Ellipsometry of Thin Film Materials

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Publisher : John Wiley & Sons
ISBN 13 : 3527833951
Total Pages : 213 pages
Book Rating : 4.5/5 (278 download)

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Book Synopsis Introduction to Spectroscopic Ellipsometry of Thin Film Materials by : Andrew T. S. Wee

Download or read book Introduction to Spectroscopic Ellipsometry of Thin Film Materials written by Andrew T. S. Wee and published by John Wiley & Sons. This book was released on 2022-03-08 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

ZnO Thin Films

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Publisher :
ISBN 13 : 9781536160864
Total Pages : 0 pages
Book Rating : 4.1/5 (68 download)

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Book Synopsis ZnO Thin Films by : Paolo Mele

Download or read book ZnO Thin Films written by Paolo Mele and published by . This book was released on 2019 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Zinc oxide (ZnO) is an n-type semiconductor with versatile applications such as optical devices in ultraviolet region, piezoelectric transducers, transparent electrode for solar cells and gas sensors. This book "ZnO Thin Films: Properties, Performance and Applications" gives a deep insight in the intriguing science of zinc oxide thin films. It is devoted to cover the most recent advances and reviews the state of the art of ZnO thin films applications involving energy harvesting, microelectronics, magnetic devices, photocatalysis, photovoltaics, optics, thermoelectricity, piezoelectricity, electrochemistry, temperature sensing. It serves as a fundamental information source on the techniques and methodologies involved in zinc oxide thin films growth, characterization, post-deposition plasma treatments and device processing. This book will be invaluable to the experts to consolidate their knowledge and provide insight and inspiration to beginners wishing to learn about zinc oxide thin films.