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Electron Microscopes Spectroscopy And Their Applications
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Book Synopsis Electron Microscopes, Spectroscopy and Their Applications by : Guillermo Huerta Cuellar
Download or read book Electron Microscopes, Spectroscopy and Their Applications written by Guillermo Huerta Cuellar and published by BoD – Books on Demand. This book was released on 2024-05-22 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores the use of electronic microscopes and spectroscopic techniques to solve different problems. Delve into the intricate details of these powerful tools as they reveal some of the hidden mysteries of the microscopic realm. From exploring the inner workings of cells to analyzing the composition of materials at the atomic level, this book offers an engaging and motivating journey into the realm of cutting-edge scientific exploration in electron microscopy and spectroscopy techniques with emerging trends in the field. Whether you are an experienced researcher or a curious enthusiast, this book will motivate your scientific thinking to discover and expand your understanding of the microscopic world, inviting you to continue working in these areas to obtain more interesting results.
Book Synopsis Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope by : Anjam Khursheed
Download or read book Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope written by Anjam Khursheed and published by . This book was released on 2020-10-16 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.
Book Synopsis Electron Energy-Loss Spectroscopy in the Electron Microscope by : R.F. Egerton
Download or read book Electron Energy-Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Book Synopsis Electron Energy-Loss Spectroscopy in the Electron Microscope by : R.F. Egerton
Download or read book Electron Energy-Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2011-07-29 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook
Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Book Synopsis Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope by : Anjam Khursheed
Download or read book Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope written by Anjam Khursheed and published by World Scientific. This book was released on 2020-10-26 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.
Book Synopsis In-situ Electron Microscopy by : Gerhard Dehm
Download or read book In-situ Electron Microscopy written by Gerhard Dehm and published by John Wiley & Sons. This book was released on 2012-05-30 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Book Synopsis Electron Energy-Loss Spectroscopy in the Electron Microscope by : Ray Egerton
Download or read book Electron Energy-Loss Spectroscopy in the Electron Microscope written by Ray Egerton and published by Springer. This book was released on 2012-10-20 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron energy-loss spectroscopy (EELS or ELS) has been used to investi gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their own spectrometer or electron-detection system. Chapter 3 outlines the theory used to interpret spectral features, while Chapter 4 gives procedures for numerical processing of the energy-loss spectrum. Chapter 5 contains examples of practical applications of EELS and a discussion of radiation damage, spatial resolution, and detection limits.
Book Synopsis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by : Zhong Lin Wang
Download or read book Reflection Electron Microscopy and Spectroscopy for Surface Analysis written by Zhong Lin Wang and published by Cambridge University Press. This book was released on 1996-05-23 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Book Synopsis Surface Microscopy with Low Energy Electrons by : Ernst Bauer
Download or read book Surface Microscopy with Low Energy Electrons written by Ernst Bauer and published by Springer. This book was released on 2014-07-10 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Book Synopsis 4D Electron Microscopy by : Ahmed H Zewail
Download or read book 4D Electron Microscopy written by Ahmed H Zewail and published by World Scientific. This book was released on 2009-12-24 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. It is also poised to contribute much new spatially-resolved and time-resolved insights of central importance in the exploration of most aspects of condensed matter, ranging from the physical to the biological sciences. Whereas in all conventional EM methods, imaging, diffraction, and chemical analyses have been conducted in a static — time-integrated — manner, now it has become possible to unite the time domain with the spatial one, thereby creating four-dimensional (4D) electron microscopy. This advance is based on the fundamental concept of timed, coherent single-electron packets, or electron pulses, which are liberated with femtosecond durations. Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto. No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot. This book is not a vade mecum — numerous other texts are available for the practitioner for that purpose. It is instead an in-depth exposé of the paradigm concepts and the developed techniques that can now be executed to gain new knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time. Contents: Historical Perspectives: From Camera Obscura to 4D ImagingConcepts of Coherence: Optics, Diffraction, and ImagingFrom 2D to 3D Structural Imaging: Salient ConceptsApplications of 2D and 3D Imaging and Related Techniques4D Electron Imaging in Space and Time: Principles4D Ultrafast Electron Imaging: Developments and ApplicationsThe Electron Microscope and the Synchrotron: A Comparison4D Visualization: Past, Present, and Future Readership: Academics and researchers in the fields of physical chemistry, chemical analysis, solid state physics, electron microscopy, scanning, tunnelling, nanoelectronics, molecular biology, molecular imaging and structural biology. Keywords:Reviews:“This is a unique and ground-breaking book. For the first time it includes the important time dimension in electron microscopy, revealing time-resolved electron micrographs and diffraction patterns on an almost unbelievably fast time scale. The book is written with great clarity and is lavishly illustrated with some stunning micrographs.”Professor Colin Humphreys Cambridge University, UK “This book, by leaders in femtosecond spectroscopy and solid-state chemistry, gives an exciting overview of the new field of time-resolved transmission electron microscopy … Despite the enormous challenges in this new field, this stimulating book from these authorities should be read by all graduate students about to choose a field of research. A book to make the experts think.”Professor John Spence Arizona State University, USA “This is one of the most enlightening science textbooks I have ever read. The basic concepts behind 3D and 4D electron microscopy are presented in a concise and clear language, accompanied by figures of remarkable didactic content. This excellent textbook blends the qualities of an introductory with an in-depth account, and is bound to become a reference in the field.”Professor Majed Chergui EPFL, Lausanne, Switzerland “This is a fascinating book, very timely published when electron microscopy (EM) is at a turning point with dramatically improved capacities … The description of scattering of electrons and the function of the electron microscope is sufficiently complete to make this book well suited as a university textbook.”Crystallography Reviews “Combining the authors' expertise in femtochemistry, catalysis, and electron microscopy has resulted in a book that conveys the excitement and potential for this new paradigm in electron imaging … there is no doubt that the development of the 4D microscope has introduced a new paradigm for characterization by TEM. Taken together with introductory texts covering TEM, it provides the understanding necessary for the reader to appreciate the principles of this brand new field.”Journal of the American Chemistry Society “Researchers using electron microscopy will find this book fascinating and very helpful for learning about the latest advances in electron microscopy imaging technology.”IEEE Electrical Insulation Magazine “The renowned authors of this new appearance on time-resolved 3D electron microscopy have created a fantastic book that will appeal to a broad range of scientists. Its topic and breadth will surely be of interest to those interested in physics, material science, and solid-state chemistry … The expertise of the authors and the clear, well-documented nature of the book combine to lend it great potential to set the standard in this field.”Angewandte Chemie “It is for the 'ultrafast' chapters that the book will be read for these contain new and very unfamiliar material. The book is handsomely produced with all the illustrations on a Cambridge blue background.”Ultramicroscopy “The expert reader, who believes to know every aspect regarding electron microscopy, will discover many new and inspiring elements. For the electron microscopy layman it will ignite a fire for this exciting, trans-disciplinary subject area.”Prof. Dr. Armin Feldhoff Leibniz University Hannover
Book Synopsis Industrial Applications Of Electron Microscopy by : Zhigang Li
Download or read book Industrial Applications Of Electron Microscopy written by Zhigang Li and published by CRC Press. This book was released on 2002-12-04 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Book Synopsis Scanning Auger Electron Microscopy by : Martin Prutton
Download or read book Scanning Auger Electron Microscopy written by Martin Prutton and published by John Wiley & Sons. This book was released on 2006-05-01 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.
Book Synopsis Electron Microscopy and Analysis 2001 by : M. Aindow
Download or read book Electron Microscopy and Analysis 2001 written by M. Aindow and published by CRC Press. This book was released on 2001-12-01 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for
Book Synopsis Scanning Probe Microscopy and Spectroscopy by : Dawn Bonnell
Download or read book Scanning Probe Microscopy and Spectroscopy written by Dawn Bonnell and published by John Wiley & Sons. This book was released on 2000-12-05 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Book Synopsis Science of Microscopy by : P.W. Hawkes
Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.
Book Synopsis Physical Principles of Electron Microscopy by : Ray Egerton
Download or read book Physical Principles of Electron Microscopy written by Ray Egerton and published by Springer Science & Business Media. This book was released on 2011-02-11 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
