Electron Energy-Loss Spectroscopy in the Electron Microscope

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Publisher : Springer Science & Business Media
ISBN 13 : 1475750994
Total Pages : 491 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Electron Energy-Loss Spectroscopy in the Electron Microscope by : R.F. Egerton

Download or read book Electron Energy-Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Electron Energy Loss Spectroscopy and Surface Vibrations

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Publisher : Academic Press
ISBN 13 : 1483259455
Total Pages : 379 pages
Book Rating : 4.4/5 (832 download)

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Book Synopsis Electron Energy Loss Spectroscopy and Surface Vibrations by : H. Ibach

Download or read book Electron Energy Loss Spectroscopy and Surface Vibrations written by H. Ibach and published by Academic Press. This book was released on 2013-10-22 with total page 379 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Energy Loss Spectroscopy and Surface Vibrations is devoted to electron energy loss spectroscopy as a probe of the crystal surface. Electrons with energy in the range of a few electron volts sample only a few atomic layers. As they approach or exit from the crystal, they interact with the vibrational modes of the crystal surface, or possibly with other elementary excitations localized there. The energy spectrum of electrons back-reflected from the surface is thus a rich source of information on its dynamics. The book opens with a detailed analysis of the physics that controls the operation of the monochromator, which is the core of the experimental apparatus. Separate chapters follow on the interaction of electrons with vibrational modes of the surface region and with other elementary excitations in the vicinity; the lattice dynamics of clean and adsorbate-covered surfaces, with emphasis on those features of particular relevance to surface vibrational spectroscopy; and selected applications vibration spectroscopy in surface physics and chemistry.

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

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Publisher : John Wiley & Sons
ISBN 13 : 3527604774
Total Pages : 472 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas by : Channing C. Ahn

Download or read book Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas written by Channing C. Ahn and published by John Wiley & Sons. This book was released on 2006-03-06 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Electron Energy Loss Spectroscopy

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Publisher : Garland Science
ISBN 13 : 1000144623
Total Pages : 245 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Electron Energy Loss Spectroscopy by : R. Brydson

Download or read book Electron Energy Loss Spectroscopy written by R. Brydson and published by Garland Science. This book was released on 2020-08-13 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Encyclopedia of Tribology

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Publisher : Springer
ISBN 13 : 9780387928982
Total Pages : 4139 pages
Book Rating : 4.9/5 (289 download)

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Book Synopsis Encyclopedia of Tribology by : Q. Jane Wang

Download or read book Encyclopedia of Tribology written by Q. Jane Wang and published by Springer. This book was released on 2013-09-26 with total page 4139 pages. Available in PDF, EPUB and Kindle. Book excerpt: TRIBOLOGY – the study of friction, wear and lubrication – impacts almost every aspect of our daily lives. The Springer Encyclopedia of Tribology is an authoritative and comprehensive reference covering all major aspects of the science and engineering of tribology that are relevant to researchers across all engineering industries and related scientific disciplines. This is the first major reference that brings together the science, engineering and technological aspects of tribology of this breadth and scope in a single work. Developed and written by leading experts in the field, the Springer Encyclopedia of Tribology covers the fundamentals as well as advanced applications across material types, different length and time scales, and encompassing various engineering applications and technologies. Exciting new areas such as nanotribology, tribochemistry and biotribology have also been included. As a six-volume set, the Springer Encyclopedia of Tribology comprises 1630 entries written by authoritative experts in each subject area, under the guidance of an international panel of key researchers from academia, national laboratories and industry. With alphabetically-arranged entries, concept diagrams and cross-linking features, this comprehensive work provides easy access to essential information for both researchers and practicing engineers in the fields of engineering (aerospace, automotive, biomedical, chemical, electrical, and mechanical) as well as materials science, physics, and chemistry.

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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Publisher : Cambridge University Press
ISBN 13 : 0521482666
Total Pages : 457 pages
Book Rating : 4.5/5 (214 download)

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Book Synopsis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by : Zhong Lin Wang

Download or read book Reflection Electron Microscopy and Spectroscopy for Surface Analysis written by Zhong Lin Wang and published by Cambridge University Press. This book was released on 1996-05-23 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: A self-contained book on electron microscopy and spectrometry techniques for surface studies.

Aberration-Corrected Analytical Transmission Electron Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 1119979900
Total Pages : 235 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Aberration-Corrected Analytical Transmission Electron Microscopy by : Rik Brydson

Download or read book Aberration-Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Fundamentals of Inelastic Electron Scattering

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Publisher : Springer Science & Business Media
ISBN 13 : 3709188660
Total Pages : 205 pages
Book Rating : 4.7/5 (91 download)

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Book Synopsis Fundamentals of Inelastic Electron Scattering by : P. Schattschneider

Download or read book Fundamentals of Inelastic Electron Scattering written by P. Schattschneider and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron energy loss spectroscopy (ELS) is a vast subject with a long and honorable history. The problem of stopping power for high energy particles interested the earliest pioneers of quantum mechanics such as Bohr and Bethe, who laid the theoretical foun dations of the subject. The experimental origins might perhaps be traced to the original Franck-Hertz experiment. The modern field includes topics as diverse as low energy reflection electron energy loss studies of surface vibrational modes, the spectroscopy of gases and the modern theory of plasmon excitation in crystals. For the study of ELS in electron microscopy, several historically distinct areas of physics are relevant, including the theory of the Debye Waller factor for virtual inelastic scattering, the use of complex optical potentials, lattice dynamics for crystalline specimens and the theory of atomic ionisation for isolated atoms. However the field of electron energy loss spectroscopy contains few useful texts which can be recommended for students. With the recent appearance of Raether's and Egerton's hooks (see text for references), we have for the first time both a comprehensive review text-due to Raether-and a lucid introductory text which emphasizes experimental aspects-due to Egerton. Raether's text tends to emphasize the recent work on surface plasmons, while the strength of Egerton's book is its treatment of inner shell excitations for microanalysis, based on the use of atomic wavefunctions for crystal electrons.

Science of Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 0387497625
Total Pages : 1336 pages
Book Rating : 4.3/5 (874 download)

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Book Synopsis Science of Microscopy by : P.W. Hawkes

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Spectroscopy for Materials Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 1119697328
Total Pages : 500 pages
Book Rating : 4.1/5 (196 download)

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Book Synopsis Spectroscopy for Materials Characterization by : Simonpietro Agnello

Download or read book Spectroscopy for Materials Characterization written by Simonpietro Agnello and published by John Wiley & Sons. This book was released on 2021-09-08 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.

Excitation of Plasmons and Interband Transitions by Electrons

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Publisher : Springer
ISBN 13 : 354034716X
Total Pages : 206 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Excitation of Plasmons and Interband Transitions by Electrons by : Heinz Raether

Download or read book Excitation of Plasmons and Interband Transitions by Electrons written by Heinz Raether and published by Springer. This book was released on 2006-04-11 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book treats the physics of Electron Loss Spectroscopy (ELS) with electrons of different energies. Its emphasis is on the collective excitations or plasmons in the bulk as well as on the surface, including interaction with the interband transitions. A discussion of the experimental and theoretical aspects helps to define the current state of the art. In addition to the general physics, data on the plasmons (energy, halfwidth, dispersion) obtained by different methods of observation (transmission and reflection with fast and slow electrons) have been collected as completely as possible. Mr. R. Manzke was helpful in gathering these figures. Related topics such as coupling of plasmons with light, Cerenkov radiation and waveguides, plasmons in electron gases of one and two dimensions together with some applications (microanalysis) are briefly described to round off the representation and to demonstrate the usefulness of the plasmon concept."--Preface

Scanning Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Scanning Auger Electron Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 0470866780
Total Pages : 384 pages
Book Rating : 4.4/5 (78 download)

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Book Synopsis Scanning Auger Electron Microscopy by : Martin Prutton

Download or read book Scanning Auger Electron Microscopy written by Martin Prutton and published by John Wiley & Sons. This book was released on 2006-05-01 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.

Analytical Electron Microscopy for Materials Science

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Publisher : Springer Science & Business Media
ISBN 13 : 4431669884
Total Pages : 162 pages
Book Rating : 4.4/5 (316 download)

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Book Synopsis Analytical Electron Microscopy for Materials Science by : DAISUKE Shindo

Download or read book Analytical Electron Microscopy for Materials Science written by DAISUKE Shindo and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Applied RHEED

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540651994
Total Pages : 240 pages
Book Rating : 4.6/5 (519 download)

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Book Synopsis Applied RHEED by : Wolfgang Braun

Download or read book Applied RHEED written by Wolfgang Braun and published by Springer Science & Business Media. This book was released on 1999-04-16 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

In Situ Characterization of Thin Film Growth

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Publisher : Elsevier
ISBN 13 : 0857094955
Total Pages : 295 pages
Book Rating : 4.8/5 (57 download)

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Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster

Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques

Impact of Electron and Scanning Probe Microscopy on Materials Research

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Publisher : Springer Science & Business Media
ISBN 13 : 9401144516
Total Pages : 503 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby

Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.