Dynamical Scattering of X-Rays in Crystals

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Publisher : Springer
ISBN 13 : 9783642812095
Total Pages : 0 pages
Book Rating : 4.8/5 (12 download)

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Book Synopsis Dynamical Scattering of X-Rays in Crystals by : Z.G. Pinsker

Download or read book Dynamical Scattering of X-Rays in Crystals written by Z.G. Pinsker and published by Springer. This book was released on 2012-02-01 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: (Historical Survey) The discovery of X-ray diffraction in crystals by LAUE, FRIDRICH and KNIPPING in 1912 [1.1] served as the starting pOint for the development of scientific research along a number of important lines. We shall discuss just a few of them. The above discovery convincingly demonstrated the wave properties of X-rays. This, together with the previously established electromagnetic nature of radiation, confirmed the hypothesis that X-rays form the short-wave part of the electromagnetic spectrum. Further, this discovery was the first and decisive experimental proof of the periodic structure of crystals. In fact, theoretical crystallography had already arrived at this conclusion, mainly as an outcome of the theory of the space groups of symmetry elaborated by FEDOROV [1.2] and SCHOENFLIES [1.3]. From the optics of visible light we know that the radiation of a wave length of the same order as, and preferably less than, the period of a grat ing suffers diffraction on periodic objects of the type of optical grating. Thus, the discovery proved that the wavelength of an X-ray must be of the order of interatomic distances. It became clear why the visible light of wavelengths exceeding the crystal lattice periods by about 500 to 1000 times failed to reveal the periodic structure of crystals in diffraction experi ments.

X-Ray and Neutron Dynamical Diffraction

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Publisher : Springer Science & Business Media
ISBN 13 : 1461558794
Total Pages : 419 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis X-Ray and Neutron Dynamical Diffraction by : André Authier

Download or read book X-Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Dynamical Theory of X-ray Diffraction

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Author :
Publisher : Oxford University Press, USA
ISBN 13 : 9780198528920
Total Pages : 700 pages
Book Rating : 4.5/5 (289 download)

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Book Synopsis Dynamical Theory of X-ray Diffraction by : André Authier

Download or read book Dynamical Theory of X-ray Diffraction written by André Authier and published by Oxford University Press, USA. This book was released on 2004 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt: Publisher Description

Dynamical Scattering of X-Rays in Crystals

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Publisher : Springer
ISBN 13 :
Total Pages : 534 pages
Book Rating : 4.:/5 (5 download)

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Book Synopsis Dynamical Scattering of X-Rays in Crystals by : Z.G. Pinsker

Download or read book Dynamical Scattering of X-Rays in Crystals written by Z.G. Pinsker and published by Springer. This book was released on 1978-04 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: (Historical Survey) The discovery of X-ray diffraction in crystals by LAUE, FRIDRICH and KNIPPING in 1912 [1.1] served as the starting pOint for the development of scientific research along a number of important lines. We shall discuss just a few of them. The above discovery convincingly demonstrated the wave properties of X-rays. This, together with the previously established electromagnetic nature of radiation, confirmed the hypothesis that X-rays form the short-wave part of the electromagnetic spectrum. Further, this discovery was the first and decisive experimental proof of the periodic structure of crystals. In fact, theoretical crystallography had already arrived at this conclusion, mainly as an outcome of the theory of the space groups of symmetry elaborated by FEDOROV [1.2] and SCHOENFLIES [1.3]. From the optics of visible light we know that the radiation of a wave length of the same order as, and preferably less than, the period of a grat ing suffers diffraction on periodic objects of the type of optical grating. Thus, the discovery proved that the wavelength of an X-ray must be of the order of interatomic distances. It became clear why the visible light of wavelengths exceeding the crystal lattice periods by about 500 to 1000 times failed to reveal the periodic structure of crystals in diffraction experi ments.

Multiple Diffraction of X-Rays in Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 3642821669
Total Pages : 312 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Multiple Diffraction of X-Rays in Crystals by : Shih-Lin In-Hang

Download or read book Multiple Diffraction of X-Rays in Crystals written by Shih-Lin In-Hang and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin ciple, reflect three-dimensional information about the structure of the dif fracting material. Recent progress in understanding this diffraction phenome non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys tematic review of this type of diffraction, encompasses its diverse applica tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.

Transmission Electron Microscopy

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Publisher : Springer
ISBN 13 : 3662135531
Total Pages : 532 pages
Book Rating : 4.6/5 (621 download)

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Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer

Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.

X-Ray Multiple-Wave Diffraction

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540211969
Total Pages : 458 pages
Book Rating : 4.2/5 (119 download)

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Book Synopsis X-Ray Multiple-Wave Diffraction by : Shih-Lin Chang

Download or read book X-Ray Multiple-Wave Diffraction written by Shih-Lin Chang and published by Springer Science & Business Media. This book was released on 2004-06-24 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.

X-Ray and Neutron Diffraction in Nonideal Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 3642742912
Total Pages : 483 pages
Book Rating : 4.6/5 (427 download)

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Book Synopsis X-Ray and Neutron Diffraction in Nonideal Crystals by : Mikhail A. Krivoglaz

Download or read book X-Ray and Neutron Diffraction in Nonideal Crystals written by Mikhail A. Krivoglaz and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 483 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).

X-ray Scattering from Semiconductors

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Publisher : World Scientific
ISBN 13 : 1860941591
Total Pages : 303 pages
Book Rating : 4.8/5 (69 download)

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Book Synopsis X-ray Scattering from Semiconductors by : Paul F. Fewster

Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.

Local Structure from Diffraction

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Publisher : Springer Science & Business Media
ISBN 13 : 0306470772
Total Pages : 397 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Local Structure from Diffraction by : S.J.L. Billinge

Download or read book Local Structure from Diffraction written by S.J.L. Billinge and published by Springer Science & Business Media. This book was released on 2006-02-04 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.

Parametric X-Ray Radiation in Crystals

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540269052
Total Pages : 194 pages
Book Rating : 4.2/5 (69 download)

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Book Synopsis Parametric X-Ray Radiation in Crystals by : Vladimir G. Baryshevsky

Download or read book Parametric X-Ray Radiation in Crystals written by Vladimir G. Baryshevsky and published by Springer Science & Business Media. This book was released on 2005-12-20 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: This systematic and comprehensive monograph is devoted to parametric X-ray radiation (PXR). This radiation is generated by the motion of electrons inside a crystal, whereby the emitted photons are diffracted by the crystal and the radiation intensity critically depends on the parameters of the crystal structure. Nowadays PXR is the subject of numerous theoretical and experimental studies throughout the world. The first part of the book is a theoretical treatment of PXR, which includes a new approach to describe the radiation process in crystals. The second part is a survey of PXR experimental results and the possible applications of PXR as a tool for crystal structure analysis and a source of tunable X-ray radiation.

Theoretical Concepts of X-Ray Nanoscale Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 3642381774
Total Pages : 325 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Theoretical Concepts of X-Ray Nanoscale Analysis by : Andrei Benediktovich

Download or read book Theoretical Concepts of X-Ray Nanoscale Analysis written by Andrei Benediktovich and published by Springer Science & Business Media. This book was released on 2013-09-07 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Thin Film Analysis by X-Ray Scattering

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Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz

Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Basic Concepts of X-Ray Diffraction

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Publisher : John Wiley & Sons
ISBN 13 : 3527681183
Total Pages : 299 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Basic Concepts of X-Ray Diffraction by : Emil Zolotoyabko

Download or read book Basic Concepts of X-Ray Diffraction written by Emil Zolotoyabko and published by John Wiley & Sons. This book was released on 2014-02-10 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.

Early Days of X-ray Crystallography

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Publisher : Oxford University Press, USA
ISBN 13 : 0199659842
Total Pages : 456 pages
Book Rating : 4.1/5 (996 download)

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Book Synopsis Early Days of X-ray Crystallography by : André Authier

Download or read book Early Days of X-ray Crystallography written by André Authier and published by Oxford University Press, USA. This book was released on 2013-08 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2012 marked the centenary of one of the most significant discoveries of the early twentieth century, the discovery of X-ray diffraction (March 1912, by Laue, Friedrich, and Knipping) and of Bragg's law (November 1912). The discovery of X-ray diffraction confirmed the wave nature of X-rays and the space-lattice hypothesis. It had two major consequences: the analysis of the structure of atoms, and the determination of the atomic structure of materials. This had a momentous impact in chemistry, physics, mineralogy, material science, and biology. This book relates the discovery itself, the early days of X-ray crystallography, and the way the news of the discovery spread round the world. It explains how the first crystal structures were determined, and recounts which were the early applications of X-ray crystallography. It also tells how the concept of space lattice has developed since ancient times, and how our understanding of the nature of light has changed over time. The contributions of the main actors of the story, prior to the discovery, at the time of the discovery and immediately afterwards, are described through their writings and are put into the context of the time, accompanied by brief biographical details.

Advanced Transmission Electron Microscopy

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Publisher : Springer
ISBN 13 : 1493966073
Total Pages : 741 pages
Book Rating : 4.4/5 (939 download)

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Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo

Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Characterization of Crystal Growth Defects by X-Ray Methods

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Publisher : Springer Science & Business Media
ISBN 13 : 1475711263
Total Pages : 615 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods by : B.K. Tanner

Download or read book Characterization of Crystal Growth Defects by X-Ray Methods written by B.K. Tanner and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 615 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.