Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Design For Test And Test Optimization Techniques For Tsv Based 3d Stacked Ics
Download Design For Test And Test Optimization Techniques For Tsv Based 3d Stacked Ics full books in PDF, epub, and Kindle. Read online Design For Test And Test Optimization Techniques For Tsv Based 3d Stacked Ics ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by : Brandon Noia
Download or read book Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs written by Brandon Noia and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.
Book Synopsis Testing of Interposer-Based 2.5D Integrated Circuits by : Ran Wang
Download or read book Testing of Interposer-Based 2.5D Integrated Circuits written by Ran Wang and published by Springer. This book was released on 2017-03-20 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.
Book Synopsis Design for High Performance, Low Power, and Reliable 3D Integrated Circuits by : Sung Kyu Lim
Download or read book Design for High Performance, Low Power, and Reliable 3D Integrated Circuits written by Sung Kyu Lim and published by Springer Science & Business Media. This book was released on 2012-11-27 with total page 573 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It describes numerous “manufacturing-ready” GDSII-level layouts of TSV-based 3D ICs developed with the tools covered in the book. This book will also feature sign-off level analysis of timing, power, signal integrity, and thermal analysis for 3D IC designs. Full details of the related algorithms will be provided so that the readers will be able not only to grasp the core mechanics of the physical design tools, but also to be able to reproduce and improve upon the results themselves. This book will also offer various design-for-manufacturability (DFM), design-for-reliability (DFR), and design-for-testability (DFT) techniques that are considered critical to the physical design process.
Book Synopsis Progress in VLSI Design and Test by : Hafizur Rahaman
Download or read book Progress in VLSI Design and Test written by Hafizur Rahaman and published by Springer. This book was released on 2012-06-26 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Book Synopsis 3D IC Stacking Technology by : Banqiu Wu
Download or read book 3D IC Stacking Technology written by Banqiu Wu and published by McGraw Hill Professional. This book was released on 2011-10-14 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: The latest advances in three-dimensional integrated circuit stacking technology With a focus on industrial applications, 3D IC Stacking Technology offers comprehensive coverage of design, test, and fabrication processing methods for three-dimensional device integration. Each chapter in this authoritative guide is written by industry experts and details a separate fabrication step. Future industry applications and cutting-edge design potential are also discussed. This is an essential resource for semiconductor engineers and portable device designers. 3D IC Stacking Technology covers: High density through silicon stacking (TSS) technology Practical design ecosystem for heterogeneous 3D IC products Design automation and TCAD tool solutions for through silicon via (TSV)-based 3D IC stack Process integration for TSV manufacturing High-aspect-ratio silicon etch for TSV Dielectric deposition for TSV Barrier and seed deposition Copper electrodeposition for TSV Chemical mechanical polishing for TSV applications Temporary and permanent bonding Assembly and test aspects of TSV technology
Book Synopsis Three-Dimensional Integration of Semiconductors by : Kazuo Kondo
Download or read book Three-Dimensional Integration of Semiconductors written by Kazuo Kondo and published by Springer. This book was released on 2015-12-09 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book starts with background concerning three-dimensional integration - including their low energy consumption and high speed image processing - and then proceeds to how to construct them and which materials to use in particular situations. The book covers numerous applications, including next generation smart phones, driving assistance systems, capsule endoscopes, homing missiles, and many others. The book concludes with recent progress and developments in three dimensional packaging, as well as future prospects.
Book Synopsis An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition by : Jose Moreira
Download or read book An Engineer's Guide to Automated Testing of High-Speed Interfaces, Second Edition written by Jose Moreira and published by Artech House. This book was released on 2016-04-30 with total page 709 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Book Synopsis Thermal Issues in Testing of Advanced Systems on Chip by : Nima Aghaee Ghaleshahi
Download or read book Thermal Issues in Testing of Advanced Systems on Chip written by Nima Aghaee Ghaleshahi and published by Linköping University Electronic Press. This book was released on 2015-09-23 with total page 219 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large number of functions. This is achieved by efficient integration of huge number of transistors. Such very large scale integration is enabled by a core-based design paradigm as well as deep-submicron and 3D-stacked-IC technologies. These technologies are susceptible to reliability and testing complications caused by thermal issues. Three crucial thermal issues related to temperature variations, temperature gradients, and temperature cycling are addressed in this thesis. Existing test scheduling techniques rely on temperature simulations to generate schedules that meet thermal constraints such as overheating prevention. The difference between the simulated temperatures and the actual temperatures is called temperature error. This error, for past technologies, is negligible. However, advanced SoCs experience large errors due to large process variations. Such large errors have costly consequences, such as overheating, and must be taken care of. This thesis presents an adaptive approach to generate test schedules that handle such temperature errors. Advanced SoCs manufactured as 3D stacked ICs experience large temperature gradients. Temperature gradients accelerate certain early-life defect mechanisms. These mechanisms can be artificially accelerated using gradient-based, burn-in like, operations so that the defects are detected before shipping. Moreover, temperature gradients exacerbate some delay-related defects. In order to detect such defects, testing must be performed when appropriate temperature-gradients are enforced. A schedule-based technique that enforces the temperature-gradients for burn-in like operations is proposed in this thesis. This technique is further developed to support testing for delay-related defects while appropriate gradients are enforced. The last thermal issue addressed by this thesis is related to temperature cycling. Temperature cycling test procedures are usually applied to safety-critical applications to detect cycling-related early-life failures. Such failures affect advanced SoCs, particularly through-silicon-via structures in 3D-stacked-ICs. An efficient schedule-based cycling-test technique that combines cycling acceleration with testing is proposed in this thesis. The proposed technique fits into existing 3D testing procedures and does not require temperature chambers. Therefore, the overall cycling acceleration and testing cost can be drastically reduced. All the proposed techniques have been implemented and evaluated with extensive experiments based on ITC’02 benchmarks as well as a number of 3D stacked ICs. Experiments show that the proposed techniques work effectively and reduce the costs, in particular the costs related to addressing thermal issues and early-life failures. We have also developed a fast temperature simulation technique based on a closed-form solution for the temperature equations. Experiments demonstrate that the proposed simulation technique reduces the schedule generation time by more than half.
Book Synopsis VLSI-SoC: Internet of Things Foundations by : Luc Claesen
Download or read book VLSI-SoC: Internet of Things Foundations written by Luc Claesen and published by Springer. This book was released on 2015-10-02 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, held in Playa del Carmen, Mexico, in October 2014. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Book Synopsis Wireless and Satellite Systems by : Min Jia
Download or read book Wireless and Satellite Systems written by Min Jia and published by Springer. This book was released on 2019-05-06 with total page 779 pages. Available in PDF, EPUB and Kindle. Book excerpt: This two-volume set LNICST 280-281 constitutes the post-conference proceedings of the 10th EAI International Conference on Wireless and Satellite Services, WiSATS 2019, held in Harbin, China, in January 2019. The conference was formerly known as the International Conference on Personal Satellite Services (PSATS) mainly covering topics in the satellite domain. The 137 full papers were carefully reviewed and selected from 289 submissions. The papers are organized in topical sections on machine learning for satellite-terrestrial networks, human-machine interactive sensing, monitoring, and communications, integrated space and onboard networks, intelligent signal processing, wireless communications and networks, vehicular communications and networks, intelligent 5G communication and digital image processing technology, security, reliability and resilience in internet of things, advances in communications and computing for internet of things.
Book Synopsis Three Dimensional Integrated Circuit Design and Test by : Jing Xie
Download or read book Three Dimensional Integrated Circuit Design and Test written by Jing Xie and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The emerging three-dimensional integrated circuits (3D ICs) is one of the most promising solutions for future IC designs. 3D stacking enables much higher memory bandwidth and much lower overhead in multi-power domain design, which provides solutions for chip-multiprocessor design in mitigating the "memory wall" and "dark-silicon" problem. At the same time, 3D technology leads to new opportunities and challenges in the field of circuit and system design techniques, EDA tools and chip testing mechanism. This dissertation presents two killer applications for the modern 3D system and one 3D testing solution. The first contribution of this dissertation is to propose a killer application for TSV based system - the 3D memory stacking. This dissertation presents a 3D memory stacking system that leverages the massive number of TSVs between memory layers to help high-bandwidth checkpointing/restore. To validate the proposed scheme, 2-layer TSV-based SRAM-SRAM 3D-stacked chip is implemented to mimic the high-bandwidth and fast data transfer from one memory layer to another memory layer, so that the in-memory checkpointing/restore scheme can be enabled for the future exascale computing. The capacity of each SRAM layer is 1 Mbit. Each layer contains 64 banks, with each bank contains 256 words and the word length is 64-bit. The final footprint including I/O pad is 2.9mm X 2mm. The SRAM dies were taped out in GlobalFoundries using its 130nm low power process, and the 3D stacking was done by using Tezzaron's TSV technology. The prototyping chip can perform checkpointing/restore at the speed of 4K/cycle with 1Ghz clock.This dissertation also gives an applicable solution for 3D testing. Testing for 3D ICs based on through-silicon-via (TSV) is one of the major challenges for improving the system yield and reducing the overall cost. The lack of pads on most tiers and the mechanical vulnerability of tiers after wafer thinning make it difficult to perform 3D Known-Good-Die (KGD) test with the existing 2D IC probing methods. This dissertation presents a novel and time-efficient 3D testing flow. In this Known-Good-Stack (KGS) flow, a yield-aware TSV defect searching and replacing strategy is introduced. The Build-in-Self-Test (BIST) design with TSV redundancy scheme help improve the system yield for today's imperfect TSV fabrication process. Our study shows that less than 6 redundant TSVs is enough to increase the TSV yield to 98% for a TSV cluster with a size under 16 X 16 with relatively low initial TSV yield. The average TSV cluster testing and self-fixing time is about 3-16 testing cycle depending on the initial TSV yield.The second killer application for 3D system in this dissertation is multi-power domain system design utilizing the monolithic technology. Optimizing energy consumption for electronic systems has been an important design consideration. Among all the techniques, multi-power domain design is a widely used one for low power and high performance applications. In order to perform the data transfer between these different power domains, we needs a cross power domain interface (CPDI). The existing level-conversion flip-flop (LCFF) structures all require dual power rails, which results in large area and performance overhead. We proposed a scan-able CPDI circuit utilizing monolithic 3D technology. This interface functions as a flip-flop and provides reliable data conversion from one power domain to another. It also has built-in scan feature which makes it testable. Our design separates power rails in each tier, substantially reduced physical design complexity and area penalty. The design is implemented in a 20nm, 28nm and 45nm low power technology. It shows 20%-35% smaller D to Q comparing with normal designs. The proposed design also shows scalability and better energy consumption than precious LCFF design.Finally, we presented a dual power domain deep pipeline circuit architecture for future power-efficient systems. We reduce the power consumption by putting all the combinational logics in a lower power domain, while all the FFs and clock network operate at normal voltage for smaller insertion delay and better clock control. In order to realize these functions and system benefits, we proposed a novel level conversion flip flop omega design, which has 30% insertion delay than the normal flop design and could be easily integrated into today's synthesis flow. This work provides guideline on how to design a dual power domain system with less power under the same system throughput requirement. A system level estimation shows that the 3D dual power supply system could consume about 15% less energy by using our design methodology.
Book Synopsis Handbook of 3D Integration, Volume 4 by : Paul D. Franzon
Download or read book Handbook of 3D Integration, Volume 4 written by Paul D. Franzon and published by John Wiley & Sons. This book was released on 2019-01-25 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration. This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.
Book Synopsis Physical Design for 3D Integrated Circuits by : Aida Todri-Sanial
Download or read book Physical Design for 3D Integrated Circuits written by Aida Todri-Sanial and published by CRC Press. This book was released on 2017-12-19 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physical Design for 3D Integrated Circuits reveals how to effectively and optimally design 3D integrated circuits (ICs). It also analyzes the design tools for 3D circuits while exploiting the benefits of 3D technology. The book begins by offering an overview of physical design challenges with respect to conventional 2D circuits, and then each chapter delivers an in-depth look at a specific physical design topic. This comprehensive reference: Contains extensive coverage of the physical design of 2.5D/3D ICs and monolithic 3D ICs Supplies state-of-the-art solutions for challenges unique to 3D circuit design Features contributions from renowned experts in their respective fields Physical Design for 3D Integrated Circuits provides a single, convenient source of cutting-edge information for those pursuing 2.5D/3D technology.
Book Synopsis Handbook of 3D Integration, Volume 4 by : Paul D. Franzon
Download or read book Handbook of 3D Integration, Volume 4 written by Paul D. Franzon and published by John Wiley & Sons. This book was released on 2019-01-25 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.
Book Synopsis Advanced Flip Chip Packaging by : Ho-Ming Tong
Download or read book Advanced Flip Chip Packaging written by Ho-Ming Tong and published by Springer Science & Business Media. This book was released on 2013-03-20 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced Flip Chip Packaging presents past, present and future advances and trends in areas such as substrate technology, material development, and assembly processes. Flip chip packaging is now in widespread use in computing, communications, consumer and automotive electronics, and the demand for flip chip technology is continuing to grow in order to meet the need for products that offer better performance, are smaller, and are environmentally sustainable.
Book Synopsis Through Silicon Vias by : Brajesh Kumar Kaushik
Download or read book Through Silicon Vias written by Brajesh Kumar Kaushik and published by CRC Press. This book was released on 2016-11-30 with total page 165 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent advances in semiconductor technology offer vertical interconnect access (via) that extend through silicon, popularly known as through silicon via (TSV). This book provides a comprehensive review of the theory behind TSVs while covering most recent advancements in materials, models and designs. Furthermore, depending on the geometry and physical configurations, different electrical equivalent models for Cu, carbon nanotube (CNT) and graphene nanoribbon (GNR) based TSVs are presented. Based on the electrical equivalent models the performance comparison among the Cu, CNT and GNR based TSVs are also discussed.
Book Synopsis Design of 3D Integrated Circuits and Systems by : Rohit Sharma
Download or read book Design of 3D Integrated Circuits and Systems written by Rohit Sharma and published by CRC Press. This book was released on 2018-09-03 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-dimensional (3D) integration of microsystems and subsystems has become essential to the future of semiconductor technology development. 3D integration requires a greater understanding of several interconnected systems stacked over each other. While this vertical growth profoundly increases the system functionality, it also exponentially increases the design complexity. Design of 3D Integrated Circuits and Systems tackles all aspects of 3D integration, including 3D circuit and system design, new processes and simulation techniques, alternative communication schemes for 3D circuits and systems, application of novel materials for 3D systems, and the thermal challenges to restrict power dissipation and improve performance of 3D systems. Containing contributions from experts in industry as well as academia, this authoritative text: Illustrates different 3D integration approaches, such as die-to-die, die-to-wafer, and wafer-to-wafer Discusses the use of interposer technology and the role of Through-Silicon Vias (TSVs) Presents the latest improvements in three major fields of thermal management for multiprocessor systems-on-chip (MPSoCs) Explores ThruChip Interface (TCI), NAND flash memory stacking, and emerging applications Describes large-scale integration testing and state-of-the-art low-power testing solutions Complete with experimental results of chip-level 3D integration schemes tested at IBM and case studies on advanced complementary metal–oxide–semiconductor (CMOS) integration for 3D integrated circuits (ICs), Design of 3D Integrated Circuits and Systems is a practical reference that not only covers a wealth of design issues encountered in 3D integration but also demonstrates their impact on the efficiency of 3D systems.
