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Author : Minesh Balkrishan Amin
Publisher :
ISBN 13 :
Total Pages : 264 pages
Book Rating : 4.:/5 (319 download)
Download or read book Data Parallel Fault Simulation for Combinational and Sequential Circuits written by Minesh Balkrishan Amin and published by . This book was released on 1996 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ernst G. Ulrich
Publisher : Springer Science & Business Media
ISBN 13 : 1461527384
Total Pages : 199 pages
Book Rating : 4.4/5 (615 download)
Download or read book Concurrent and Comparative Discrete Event Simulation written by Ernst G. Ulrich and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author : Egon Börger
Publisher : Springer Science & Business Media
ISBN 13 : 3642571999
Total Pages : 363 pages
Book Rating : 4.6/5 (425 download)
Download or read book Architecture Design and Validation Methods written by Egon Börger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 363 pages. Available in PDF, EPUB and Kindle. Book excerpt: This state-of-the-art survey gives a systematic presentation of recent advances in the design and validation of computer architectures. The book covers a comprehensive range of architecture design and validation methods, from computer aided high-level design of VLSI circuits and systems to layout and testable design, including the modeling and synthesis of behavior and dataflow, cell-based logic optimization, machine assisted verification, and virtual machine design.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : N. K. Jha
Publisher : Cambridge University Press
ISBN 13 : 9781139437431
Total Pages : 1022 pages
Book Rating : 4.4/5 (374 download)
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author : Sumit Ghosh
Publisher : Springer Science & Business Media
ISBN 13 : 0387216162
Total Pages : 435 pages
Book Rating : 4.3/5 (872 download)
Download or read book Algorithm Design for Networked Information Technology Systems written by Sumit Ghosh and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: I felt deeply honored when Professor Sumit Ghosh asked me to write the foreword to his book with an extraordinary perspective. I have long admired him, ?rst as a student leader at Stanford, where he initiated the ?rst IEEE Computer Society’s student chapter, and later as an esteemed and inspiring friend whose transdisciplinary research broadened and enhanced the horizons of practitioners of computer science and engineering, including my own. His ideas, which are derived from his profound vision, deep critical thinking, and personal intuition, reach from information technology to bioscience, as - hibited in this excellent book. To me, an ordinary engineer, it opens up a panoramic view of the Universe of Knowledge that keeps expanding and - spiring,likethegoodIndianproverb,whichsays,“agoodbookinformsyou,an excellent book teaches you, and a great book changes you. ” I sincerely believe that Professor Ghosh’s book will help us change and advance the methods of systems engineering and technology. Vision Inspired vision sees ahead of others what will or may come to be, a vivid, imagined concept or anticipation. An inspired vision personi?es what is good and what like-minded individuals hope for. Our vision is one of creating an Internet of minds, where minds are Web sites or knowledge centers, which create, store, and radiate knowledge through interaction with other minds connected by a universal shared network. This vision will not just hasten the death of distance, but will also - carcerate ignorance.
Author : Jürgen Becker
Publisher : Springer Science & Business Media
ISBN 13 : 3540229892
Total Pages : 1226 pages
Book Rating : 4.5/5 (42 download)
Download or read book Field Programmable Logic and Application written by Jürgen Becker and published by Springer Science & Business Media. This book was released on 2004-08-19 with total page 1226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 14th International Conference on Field-Programmable Logic, FPL 2003, held in Leuven, Belgium in August/September 2004. The 78 revised full papers, 45 revised short papers, and 29 poster abstracts presented together with 3 keynote contributions and 3 tutorial summaries were carefully reviewed and selected from 285 papers submitted. The papers are organized in topical sections on organic and biologic computing, security and cryptography, platform-based design, algorithms and architectures, acceleration application, architecture, physical design, arithmetic, multitasking, circuit technology, network processing, testing, applications, signal processing, computational models and compiler, dynamic reconfiguration, networks and optimisation algorithms, system-on-chip, high-speed design, image processing, network-on-chip, power-aware design, IP-based design, co-processing architectures, system level design, physical interconnect, computational models, cryptography and compression, network applications and architecture, and debugging and test.
Author :
Publisher :
ISBN 13 :
Total Pages : 590 pages
Book Rating : 4.3/5 (91 download)
Download or read book Digest of Technical Papers written by and published by . This book was released on 1988 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Evstratios Vandris
Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (319 download)
Download or read book Switch-level Fault Simulation of MOS VLSI Circuits written by Evstratios Vandris and published by . This book was released on 1991 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1441969934
Total Pages : 331 pages
Book Rating : 4.4/5 (419 download)
Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Author : Julius T. Tou
Publisher : Springer Science & Business Media
ISBN 13 : 1461590566
Total Pages : 323 pages
Book Rating : 4.4/5 (615 download)
Download or read book Advances in Information Systems Science written by Julius T. Tou and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 323 pages. Available in PDF, EPUB and Kindle. Book excerpt: Information systems science is advancing in many directions with rapid strides. Many diversified ideas, methodologies, and techniques have been conceived and developed for improving the design of information systems and for inventing new methods for solving complex information problems. This volume, the seventh of a continuing series on information systems science, covers five timely topics which are in the mainstream of current interest in this growing field. In each chapter, an attempt is made to famil iarize the reader with some basic background information on the advances discussed, so that this volume may be used independently or in conjunction with the previous volumes. The emphasis in this volume is centered upon diagnosis for digital systems, distributed information networks, micro computer technology, and data structures for pattern recognition. In recent years, digital systems have found widespread applications in on-line real-time processing. Such applications demand high reliability, availability, and serviceability. Reliability may be improved through the use of highly reliable parts. Improvement in integrity may be accompanied by retry operation and redundant configuration. Serviceability may be improved by making use of fault diagnosis techniques. Chapter 1 is devoted to this important subject. Fault diagnosis techniques are developed to improve serviceability and to shorten mean time for repair. Kitamura, Tashiro, and Inagaki discuss many recent methods for fault diagnosis and explain them with illustrative examples.
Author : Wai-Kai Chen
Publisher : CRC Press
ISBN 13 : 9781420041408
Total Pages : 3076 pages
Book Rating : 4.0/5 (414 download)
Download or read book The Circuits and Filters Handbook written by Wai-Kai Chen and published by CRC Press. This book was released on 2002-12-23 with total page 3076 pages. Available in PDF, EPUB and Kindle. Book excerpt: A bestseller in its first edition, The Circuits and Filters Handbook has been thoroughly updated to provide the most current, most comprehensive information available in both the classical and emerging fields of circuits and filters, both analog and digital. This edition contains 29 new chapters, with significant additions in the areas of computer-
Author : S. Chakravarty
Publisher : Springer Science & Business Media
ISBN 13 : 146156137X
Total Pages : 336 pages
Book Rating : 4.4/5 (615 download)
Download or read book Introduction to IDDQ Testing written by S. Chakravarty and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Author : Alexander Miczo
Publisher : John Wiley & Sons
ISBN 13 : 0471457779
Total Pages : 697 pages
Book Rating : 4.4/5 (714 download)
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Author : Suman Lata Tripathi
Publisher : CRC Press
ISBN 13 : 1000168158
Total Pages : 379 pages
Book Rating : 4.0/5 (1 download)
Download or read book Advanced VLSI Design and Testability Issues written by Suman Lata Tripathi and published by CRC Press. This book was released on 2020-08-18 with total page 379 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Author :
Publisher : Elsevier
ISBN 13 : 0123849896
Total Pages : 889 pages
Book Rating : 4.1/5 (238 download)
Download or read book GPU Computing Gems Emerald Edition written by and published by Elsevier. This book was released on 2011-01-13 with total page 889 pages. Available in PDF, EPUB and Kindle. Book excerpt: GPU Computing Gems Emerald Edition offers practical techniques in parallel computing using graphics processing units (GPUs) to enhance scientific research. The first volume in Morgan Kaufmann's Applications of GPU Computing Series, this book offers the latest insights and research in computer vision, electronic design automation, and emerging data-intensive applications. It also covers life sciences, medical imaging, ray tracing and rendering, scientific simulation, signal and audio processing, statistical modeling, video and image processing. This book is intended to help those who are facing the challenge of programming systems to effectively use GPUs to achieve efficiency and performance goals. It offers developers a window into diverse application areas, and the opportunity to gain insights from others' algorithm work that they may apply to their own projects. Readers will learn from the leading researchers in parallel programming, who have gathered their solutions and experience in one volume under the guidance of expert area editors. Each chapter is written to be accessible to researchers from other domains, allowing knowledge to cross-pollinate across the GPU spectrum. Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution. The insights and ideas as well as practical hands-on skills in the book can be immediately put to use. Computer programmers, software engineers, hardware engineers, and computer science students will find this volume a helpful resource. For useful source codes discussed throughout the book, the editors invite readers to the following website: ..." - Covers the breadth of industry from scientific simulation and electronic design automation to audio / video processing, medical imaging, computer vision, and more - Many examples leverage NVIDIA's CUDA parallel computing architecture, the most widely-adopted massively parallel programming solution - Offers insights and ideas as well as practical "hands-on" skills you can immediately put to use
