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Author : Michiyoshi Tanaka
Publisher :
ISBN 13 :
Total Pages : 296 pages
Book Rating : 4.:/5 (318 download)
Download or read book Convergent-beam Electron Diffraction II written by Michiyoshi Tanaka and published by . This book was released on 1988 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jean- Paul Morniroli
Publisher : CRC Press
ISBN 13 : 9781420034073
Total Pages : 432 pages
Book Rating : 4.0/5 (34 download)
Download or read book Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects written by Jean- Paul Morniroli and published by CRC Press. This book was released on 2004-11-01 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
Author : John Wickham Steeds
Publisher : Institute of Physics Publishing (GB)
ISBN 13 :
Total Pages : 122 pages
Book Rating : 4.F/5 ( download)
Download or read book Convergent Beam Electron Diffraction of Alloy Phases written by John Wickham Steeds and published by Institute of Physics Publishing (GB). This book was released on 1984 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Tanaka
Publisher :
ISBN 13 :
Total Pages : 352 pages
Book Rating : 4.:/5 (837 download)
Download or read book Convergent-Beam Electron Diffraction written by M. Tanaka and published by . This book was released on 2002 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michiyoshi Tanaka
Publisher :
ISBN 13 :
Total Pages : 192 pages
Book Rating : 4.:/5 (142 download)
Download or read book Convergent-beam Electron Diffraction written by Michiyoshi Tanaka and published by . This book was released on 1985 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michiyoshi Tanaka
Publisher :
ISBN 13 :
Total Pages : 352 pages
Book Rating : 4.:/5 (529 download)
Download or read book Convergent-beam Electron Diffraction Four written by Michiyoshi Tanaka and published by . This book was released on 2002 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Convergent Beam Electron Diffraction from Imperfect Crystals written by and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Nobuo Tanaka
Publisher : Springer
ISBN 13 : 4431565027
Total Pages : 340 pages
Book Rating : 4.4/5 (315 download)
Download or read book Electron Nano-Imaging written by Nobuo Tanaka and published by Springer. This book was released on 2017-04-04 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
Author : Michiyoshi Tanaka
Publisher :
ISBN 13 :
Total Pages : 308 pages
Book Rating : 4.:/5 (491 download)
Download or read book Convergent-beam Electron Diffraction III written by Michiyoshi Tanaka and published by . This book was released on 1994 with total page 308 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : C. Barry Carter
Publisher : Springer
ISBN 13 : 3319266519
Total Pages : 543 pages
Book Rating : 4.3/5 (192 download)
Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author : Jian-min Zuo
Publisher :
ISBN 13 :
Total Pages : 488 pages
Book Rating : 4.:/5 (229 download)
Download or read book Quantitative Convergent Beam Electron Diffraction and Its Applications in Studying Crystal Structure and Bonding written by Jian-min Zuo and published by . This book was released on 1989 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Nico Selhorst Blom
Publisher :
ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (171 download)
Download or read book Computer Generation of Convergent Beam Electron Diffraction Patterns written by Nico Selhorst Blom and published by . This book was released on 1987 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jean Paul Morniroli
Publisher :
ISBN 13 : 9780367806361
Total Pages : pages
Book Rating : 4.8/5 (63 download)
Download or read book Large-angle Convergent-beam Electron Diffraction (LACBED) written by Jean Paul Morniroli and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
Author : Adam J. Schwartz
Publisher : Springer Science & Business Media
ISBN 13 : 1475732058
Total Pages : 352 pages
Book Rating : 4.4/5 (757 download)
Download or read book Electron Backscatter Diffraction in Materials Science written by Adam J. Schwartz and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author : Zhong-lin Wang
Publisher : Springer Science & Business Media
ISBN 13 : 1489915796
Total Pages : 461 pages
Book Rating : 4.4/5 (899 download)
Download or read book Elastic and Inelastic Scattering in Electron Diffraction and Imaging written by Zhong-lin Wang and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 461 pages. Available in PDF, EPUB and Kindle. Book excerpt: Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Author : J.M. Zuo
Publisher : Springer Science & Business Media
ISBN 13 : 1489923535
Total Pages : 374 pages
Book Rating : 4.4/5 (899 download)
Download or read book Electron Microdiffraction written by J.M. Zuo and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 374 pages. Available in PDF, EPUB and Kindle. Book excerpt: Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies.
Author : Martin Saunders
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (599 download)
Download or read book Measurement of Low-order Structure Factors by Convergent Beam Electron Diffraction written by Martin Saunders and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
