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Characterizing The Deep
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Book Synopsis Characterization in Compound Semiconductor Processing by : Yale Strausser
Download or read book Characterization in Compound Semiconductor Processing written by Yale Strausser and published by Momentum Press. This book was released on 2010 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Characterization in Compound Semiconductor Processing is for scientists and engineers working with compound semiconductor materials and devices who are not characterization specialists. Materials and processes typically used in R&D and in the fabrication of GaAs, GaA1As, InP and HgCdTe based devices provide examples of common analytical problems. The book discusses a variety of characterization techniques to provide insight into how each individually, or in combination, might be used in solving problems associated with these materials. The book will help in the selection and application of the appropriate analytical techniques by its coverage of all stages of materials or device processing: substrate preparation, epitaxial growth, dielectric film deposition, contact formation and dopant introduction."--P. [4] of cover.
Author :National Academies of Sciences, Engineering, and Medicine Publisher :National Academies Press ISBN 13 :0309373727 Total Pages :177 pages Book Rating :4.3/5 (93 download)
Book Synopsis Characterization, Modeling, Monitoring, and Remediation of Fractured Rock by : National Academies of Sciences, Engineering, and Medicine
Download or read book Characterization, Modeling, Monitoring, and Remediation of Fractured Rock written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2021-01-29 with total page 177 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fractured rock is the host or foundation for innumerable engineered structures related to energy, water, waste, and transportation. Characterizing, modeling, and monitoring fractured rock sites is critical to the functioning of those infrastructure, as well as to optimizing resource recovery and contaminant management. Characterization, Modeling, Monitoring, and Remediation of Fractured Rock examines the state of practice and state of art in the characterization of fractured rock and the chemical and biological processes related to subsurface contaminant fate and transport. This report examines new developments, knowledge, and approaches to engineering at fractured rock sites since the publication of the 1996 National Research Council report Rock Fractures and Fluid Flow: Contemporary Understanding and Fluid Flow. Fundamental understanding of the physical nature of fractured rock has changed little since 1996, but many new characterization tools have been developed, and there is now greater appreciation for the importance of chemical and biological processes that can occur in the fractured rock environment. The findings of Characterization, Modeling, Monitoring, and Remediation of Fractured Rock can be applied to all types of engineered infrastructure, but especially to engineered repositories for buried or stored waste and to fractured rock sites that have been contaminated as a result of past disposal or other practices. The recommendations of this report are intended to help the practitioner, researcher, and decision maker take a more interdisciplinary approach to engineering in the fractured rock environment. This report describes how existing tools-some only recently developed-can be used to increase the accuracy and reliability of engineering design and management given the interacting forces of nature. With an interdisciplinary approach, it is possible to conceptualize and model the fractured rock environment with acceptable levels of uncertainty and reliability, and to design systems that maximize remediation and long-term performance. Better scientific understanding could inform regulations, policies, and implementation guidelines related to infrastructure development and operations. The recommendations for research and applications to enhance practice of this book make it a valuable resource for students and practitioners in this field.
Author :Norbert G. H. Meyendorf Publisher :Springer Science & Business Media ISBN 13 :3662089882 Total Pages :435 pages Book Rating :4.6/5 (62 download)
Book Synopsis Nondestructive Materials Characterization by : Norbert G. H. Meyendorf
Download or read book Nondestructive Materials Characterization written by Norbert G. H. Meyendorf and published by Springer Science & Business Media. This book was released on 2013-11-21 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: With an emphasis on aircraft materials, this book describes techniques for the material characterization to detect and quantify degradation processes such as corrosion and fatigue. It introduces readers to these techniques based on x-ray, ultrasonic, optical and thermal principles and demonstrates the potential of the techniques for a wide variety of applications concerning aircraft materials, especially aluminum and titanium alloys. The advantages and disadvantages of various techniques are evaluated.
Book Synopsis Characterizing and Understanding Rainfed Environments by : T. P. Tuong
Download or read book Characterizing and Understanding Rainfed Environments written by T. P. Tuong and published by Int. Rice Res. Inst.. This book was released on 2000 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: Overview; Tools and methodologies for biophysical characterization; Biophysical characterization and mapping; Characterizing biotic stresses; Socioeconomic characterization; Integrating biophysical and socioeconomic characterization.
Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Book Synopsis Electrical Characterization of Silicon-on-Insulator Materials and Devices by : Sorin Cristoloveanu
Download or read book Electrical Characterization of Silicon-on-Insulator Materials and Devices written by Sorin Cristoloveanu and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls the activity and enthu siasm of our SOl groups. Many contributing students have since then disappeared from the SOl horizon. Some of them believed that SOl was the great love of their scientific lives; others just considered SOl as a fantastic LEGO game for adults. We thank them all for kindly letting us imagine that we were guiding them. This book was very necessary to many people. SOl engineers will certainly be happy: indeed, if the performance of their SOl components is not always outstanding, they can now safely incriminate the relations given in the book rather than their process. Martine, Gunter, and Y. S. Chang can contemplate at last the amount of work they did with the figures. Our SOl accomplices already know how much we borrowed from their expertise and would find it indecent to have their detailed contri butions listed. Jean-Pierre and Dimitris incited the book, while sharing their experience in the reliability of floating bodies. Our families and friends now realize the SOl capability of dielectrically isolating us for about two years in a BOX. Our kids encouraged us to start writing. Our wives definitely gave us the courage to stop writing. They had a hard time fighting the symptoms of a rapidly developing SOl allergy.
Book Synopsis Analytical Techniques for the Characterization of Compound Semiconductors by : G. Bastard
Download or read book Analytical Techniques for the Characterization of Compound Semiconductors written by G. Bastard and published by Elsevier. This book was released on 1991-07-26 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.
Book Synopsis Stratigraphic Reservoir Characterization for Petroleum Geologists, Geophysicists, and Engineers by : Roger M. Slatt
Download or read book Stratigraphic Reservoir Characterization for Petroleum Geologists, Geophysicists, and Engineers written by Roger M. Slatt and published by Newnes. This book was released on 2013-11-21 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reservoir characterization as a discipline grew out of the recognition that more oil and gas could be extracted from reservoirs if the geology of the reservoir was understood. Prior to that awakening, reservoir development and production were the realm of the petroleum engineer. In fact, geologists of that time would have felt slighted if asked by corporate management to move from an exciting exploration assignment to a more mundane assignment working with an engineer to improve a reservoir’s performance. Slowly, reservoir characterization came into its own as a quantitative, multidisciplinary endeavor requiring a vast array of skills and knowledge sets. Perhaps the biggest attractor to becoming a reservoir geologist was the advent of fast computing, followed by visualization programs and theaters, all of which allow young geoscientists to practice their computing skills in a highly technical work environment. Also, the discipline grew in parallel with the evolution of data integration and the advent of asset teams in the petroleum industry. Finally, reservoir characterization flourished with the quantum improvements that have occurred in geophysical acquisition and processing techniques and that allow geophysicists to image internal reservoir complexities. Practical resource describing different types of sandstone and shale reservoirs Case histories of reservoir studies for easy comparison Applications of standard, new, and emerging technologies
Book Synopsis Quantitative Characterization and Engineering Application of Pores and Fractures of Different Scales in Unconventional Reservoirs – Volume II by : Wenlong Ding
Download or read book Quantitative Characterization and Engineering Application of Pores and Fractures of Different Scales in Unconventional Reservoirs – Volume II written by Wenlong Ding and published by Frontiers Media SA. This book was released on 2023-04-05 with total page 551 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Characterization and Behavior of Interfaces by : J. David Frost
Download or read book Characterization and Behavior of Interfaces written by J. David Frost and published by IOS Press. This book was released on 2010 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interfaces exist in every geotechnical system in many forms and at multiple scales. Although historically, they are often considered to be the weak link in a system, particularly as the result of a number of unexpected catastrophic failures, new insight gained over the past twenty years by researchers around the world has shown that it is possible to select combinations of materials and design an engineered interface so that it is at least as strong as the surrounding materials. These new insights have been gained as a result of experimental study, numerical modeling and analytical investigation of successful and failed systems. While individual technical papers have been presented and/or published in various forums and proceedings over the years, no technical event has ever been convened for the sole purpose of allowing for exchange of information and ideas pertaining to geotechnical interfaces. The research symposium held in September 2008 in Atlanta Georgia, USA, in conjunction with the Fourth International Symposium on Deformation Characteristics of Geomaterials (IS Atlanta 2008) at the Georgia Institute of Technology on The Characterization and Behavior of Interfaces addressed this deficiency and the papers presented at that event are contained in this publication. IOS Press is an international science, technical and medical publisher of high-quality books for academics, scientists, and professionals in all fields. Some of the areas we publish in: -Biomedicine -Oncology -Artificial intelligence -Databases and information systems -Maritime engineering -Nanotechnology -Geoengineering -All aspects of physics -E-governance -E-commerce -The knowledge economy -Urban studies -Arms control -Understanding and responding to terrorism -Medical informatics -Computer Sciences
Book Synopsis Computational Radiomics for Cancer Characterization by : Omar Sultan Al-Kadi
Download or read book Computational Radiomics for Cancer Characterization written by Omar Sultan Al-Kadi and published by Frontiers Media SA. This book was released on 2022-10-21 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Streamflow Gains and Losses Along San Francisquito Creek, and Characterization of Surface-water and Ground-water Quality, Southern San Mateo and Northern Santa Clara Counties, California, 1996-97 by : Loren F. Metzger
Download or read book Streamflow Gains and Losses Along San Francisquito Creek, and Characterization of Surface-water and Ground-water Quality, Southern San Mateo and Northern Santa Clara Counties, California, 1996-97 written by Loren F. Metzger and published by . This book was released on 2002 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Quantitative Characterization and Engineering Application of Pores and Fractures of Different Scales in Unconventional Reservoirs by : Wenlong Ding
Download or read book Quantitative Characterization and Engineering Application of Pores and Fractures of Different Scales in Unconventional Reservoirs written by Wenlong Ding and published by Frontiers Media SA. This book was released on 2023-02-16 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Ecological Characterization of the Sea Island Coastal Region of South Carolina and Georgia: Biological features of the characterization area by :
Download or read book Ecological Characterization of the Sea Island Coastal Region of South Carolina and Georgia: Biological features of the characterization area written by and published by . This book was released on 1980 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Site Characterization Progress Report by :
Download or read book Site Characterization Progress Report written by and published by . This book was released on 1997 with total page 840 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Materials and Process Characterization by : Norman G. Einspruch
Download or read book Materials and Process Characterization written by Norman G. Einspruch and published by Academic Press. This book was released on 2014-12-01 with total page 614 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.
Book Synopsis Advanced Characterization Techniques for Thin Film Solar Cells by : Daniel Abou-Ras
Download or read book Advanced Characterization Techniques for Thin Film Solar Cells written by Daniel Abou-Ras and published by John Wiley & Sons. This book was released on 2016-07-13 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
