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Author : Wei Li
Publisher :
ISBN 13 :
Total Pages : 31 pages
Book Rating : 4.:/5 (11 download)
Download or read book Automated Defect Analysis in Electron Microscopy Images written by Wei Li and published by . This book was released on 2018 with total page 31 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. K. Head
Publisher : North-Holland
ISBN 13 :
Total Pages : 422 pages
Book Rating : 4.F/5 ( download)
Download or read book Computed Electron Micrographs and Defect Identification written by A. K. Head and published by North-Holland. This book was released on 1973 with total page 422 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. H. Loretto
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (847 download)
Download or read book Defect Analysis in Electron Microscopy written by M. H. Loretto and published by . This book was released on 1986 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rik Brydson
Publisher : John Wiley & Sons
ISBN 13 : 1119979900
Total Pages : 235 pages
Book Rating : 4.1/5 (199 download)
Download or read book Aberration-Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Author : Alina Bruma
Publisher : CRC Press
ISBN 13 : 0429512732
Total Pages : 164 pages
Book Rating : 4.4/5 (295 download)
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Author : Materials Research Society
Publisher : Pittsburgh, Pa. : Materials Research Society
ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.3/5 (91 download)
Download or read book High Resolution Electron Microscopy of Defects in Materials: Volume 183 written by Materials Research Society and published by Pittsburgh, Pa. : Materials Research Society. This book was released on 1990-08-10 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Erni Rolf
Publisher : World Scientific Publishing Company
ISBN 13 : 1911299476
Total Pages : 348 pages
Book Rating : 4.9/5 (112 download)
Download or read book Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction written by Erni Rolf and published by World Scientific Publishing Company. This book was released on 2010-09-01 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy./a
Author : Jim Bentley
Publisher :
ISBN 13 :
Total Pages : 432 pages
Book Rating : 4.3/5 (91 download)
Download or read book Advances in Materials Problem Solving with the Electron Microscope: Volume 589 written by Jim Bentley and published by . This book was released on 2001 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Download or read book Quantitative Automated Object Wave Restoration in High-Resolution Electron Microscopy written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The main problem addressed by this dissertation is the accurate and automated determination of electron microscope imaging conditions. This enables the restoration of the object wave, which confers direct structural information about the specimen, from sets of differently aberrated images. An important member in the imaging chain is the image recording device, in many cases now a charge-coupled device (CCD) camera. Previous characterisations of these cameras often relied on the unjustified assumption that the Modulation Transfer Function (MTF) also correctly describes the spatial frequency dependent attenuation of the electron shot noise. A new theory is therefore presented that distinguishes between signal and noise transfer. This facilitates the evaluation of both properties using a detailed Monte-Carlo simulation model for the electron and photon scattering in the scintillator of the camera. Furthermore, methods for the accurate experimental determination of the signal and noise transfer functions are presented. In agreement with the Monte-Carlo simulations, experimental results for commercially available CCD cameras show that the signal transfer is significantly poorer than the noise transfer. The centrepiece of this dissertation is the development of new methods for determining the relative aberrations in a set of images and the absolute symmetric aberrations in the restored wave. Both are based on the analysis of the phase information in the Fourier domain and give each Fourier component a weight independent of its strength. This makes the method suitable even for largely crystalline samples with little amorphous contamination, where conventional methods, such as automated diffractogram fitting, usually fail. The method is then extended to also cover the antisymmetric aberrations, using combined beam tilt and focal series. The applicability of the new method is demonstrated with object wave restorations from tilt and focal series of complex inorganic block oxi.
Author : Gerjan P. van Bakel
Publisher :
ISBN 13 :
Total Pages : 122 pages
Book Rating : 4.:/5 (462 download)
Download or read book Defect analysis with atomic-resolution microscopy written by Gerjan P. van Bakel and published by . This book was released on 1992 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Marco Oster
Publisher : Cuvillier Verlag
ISBN 13 : 3736985622
Total Pages : 208 pages
Book Rating : 4.7/5 (369 download)
Download or read book Automated Phase Plate Application In Transmission Electron Microscopy written by Marco Oster and published by Cuvillier Verlag. This book was released on 2017-06-28 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy is an essential tool to determine the structure of biological and material-science samples. A majority of the studied specimen are phase objects, i.e. they impose a small distortion on the phase on the traversing electron wave. To visualize this signal, conventional transmission electron microscopy needs to apply intended lens aberrations, which results in distorted images. Phase plate microscopy offers an alternative possibility to generate phase contrast without relying on the lens aberrations. However, the delicate alignment of the phase plates and their quick degeneration prevent their routine application. In this work, approaches for automating the phase plate alignment are developed. To further improve the applicability, different means to reduce the so-called cut-on effect are evaluated. For that, the characteristics of a prototype instrument especially constructed to solve the cut-on problem are assessed and the properties of a new dynamic imaging mode examined in a theoretical study and by simulation. The applicability of the approach is demonstrated on beam-sensitive samples using the developed automation routines. Die Transmissionselektronenmikroskopie dient als essentielles Werkzeug der Strukturaufklärung biologischer und materialwissenschaftlicher Systeme. Ein Großteil der dort untersuchten Proben sind Phasenobjekte, d.h. ihre Interaktion mit der durchlaufenden Elektronenwelle bewirkt eine Phasenänderung selbiger. Zur Sichtbarmachung dieses Signals werden in der konventionellen Transmissionselektronenmikroskopie Linsenaberrationen benutzt, wobei das entstehende Bild von entsprechenden Abbildungsfehlern behaftet ist. Phasenplattenmikroskopie bietet eine alternative Möglichkeit der Kontrasterzeugung, ohne dabei Linsenaberrationen zu benötigen. Jedoch verhindern sowohl die zur Anwendung notwendigen diffizilen Bedientechniken, als auch die große Empfindlichkeit heutzutage verfügbarer Phasenplattensysteme bisher einen routinemäßigen Einsatz. In dieser Arbeit werden Möglichkeiten einer automatisierten Anwendung von Phasenplatten erarbeitet und deren Einsatzfähigkeit evaluiert. Der Fokus liegt hierbei auf der Begrenzung des sogenannten cut-on Effekts, welcher die Phasenkontrastübertragung für kleine Ortsfrequenzen limitiert. Dazu werden zum einen die Eigenschaften eines eigens zur Behebung dieses Problems konstruierten Prototypengeräts evaluiert, und zum anderen die Merkmale eines neuen, bisher nicht detailliert beschriebenen Abbildungsmodus theoretisch erarbeitet und seine praktische Anwendung auf strahlungsempfindlichen Proben unter Zuhilfenahme der entwickelten Automatisierungstechniken demonstriert.
Author : Earl J. Kirkland
Publisher : Springer
ISBN 13 : 9783030332594
Total Pages : 358 pages
Book Rating : 4.3/5 (325 download)
Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer. This book was released on 2020-04-03 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Author : van Bakel (Gerjan P.E.M.)
Publisher :
ISBN 13 :
Total Pages : 122 pages
Book Rating : 4.:/5 (989 download)
Download or read book Defect Analysis with Atomic-resolution Microscopy written by van Bakel (Gerjan P.E.M.) and published by . This book was released on 1992 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jeffrey William Edington
Publisher :
ISBN 13 :
Total Pages : 48 pages
Book Rating : 4.E/5 ( download)
Download or read book The Operation and Calibration of the Electron Microscope written by Jeffrey William Edington and published by . This book was released on 1974 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : C. A. English
Publisher :
ISBN 13 :
Total Pages : 20 pages
Book Rating : 4.:/5 (353 download)
Download or read book Electron Microscope Image Contrast from Small Dislocation Loops written by C. A. English and published by . This book was released on 1979 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : W. O. Saxton
Publisher :
ISBN 13 :
Total Pages : 312 pages
Book Rating : 4.X/5 (1 download)
Download or read book Computer Techniques for Image Processing in Electron Microscopy written by W. O. Saxton and published by . This book was released on 1978 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Robert Sinclair
Publisher : Cambridge University Press
ISBN 13 : 9781107410152
Total Pages : 418 pages
Book Rating : 4.4/5 (11 download)
Download or read book High Resolution Electron Microscopy of Defects in Materials: written by Robert Sinclair and published by Cambridge University Press. This book was released on 2014-06-05 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
