Atomic Force Microscopy Scanning Nearfield Optical Microscopy And Nanoscratching

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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

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Author : Gerd Kaupp
Publisher : Springer Science & Business Media
ISBN 13 : 3540284729
Total Pages : 302 pages
Book Rating : 4.5/5 (42 download)

Book Synopsis Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching by : Gerd Kaupp

Download or read book Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching written by Gerd Kaupp and published by Springer Science & Business Media. This book was released on 2006-10-24 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Nano-optics and Near-field Optical Microscopy

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Author : Anatoly V. Zayats
Publisher : Artech House
ISBN 13 : 1596932848
Total Pages : 379 pages
Book Rating : 4.5/5 (969 download)

Book Synopsis Nano-optics and Near-field Optical Microscopy by : Anatoly V. Zayats

Download or read book Nano-optics and Near-field Optical Microscopy written by Anatoly V. Zayats and published by Artech House. This book was released on 2009 with total page 379 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.

Acquisition of a Combined Scanning Near-Field Optical and Atomic Force Microscope

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Author :
Publisher :
ISBN 13 :
Total Pages : 6 pages
Book Rating : 4.:/5 (742 download)

Book Synopsis Acquisition of a Combined Scanning Near-Field Optical and Atomic Force Microscope by :

Download or read book Acquisition of a Combined Scanning Near-Field Optical and Atomic Force Microscope written by and published by . This book was released on 2005 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: This project supported a new universal scanning microscope system combining near-field scanning optical microscopy (NSOM), conventional atomic force (AFM) microscopy, and confocal optical microscopy. To build a universal system capable of high-resolution topographical imaging concurrently with spectroscopic abilities, the authors have acquired several independent units and combined them into a custom-designed NSOM/AFM/Raman instrument. They have acquired an atomic force microscope (Multimode, Digital Instruments), a near-field scanning microscope (Aurora III, Digital Instruments, partially supported by NASA), and a SpectraPro Raman spectrograph from Roper. In addition to these major instruments, they acquired a number of supporting parts/instruments toward their goal of completion of the system and sample preparation, selection, and characterization for Raman studies (e.g., CCD camera, avalanche detectors, two lasers, optical parts, air table, fluorescence microscope, mini x-ray unit, etc). A post-doctoral Research Associate was in charge of putting all these parts together. The authors did not go with a single unit from WiTec because actual demonstrations did not show expected sensitivity. This report presents a description of the instrument and preliminary results obtained with it. The instrument was used to collect Raman spectra from patterned arrays of bent single wall carbon nanotubes and bundles (3 nm in diameter) and from freely suspended nanomembranes with encapsulated gold nanoparticles.

Near-field Nano/Atom Optics and Technology

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Author : Motoichi Ohtsu
Publisher : Springer Science & Business Media
ISBN 13 : 4431679375
Total Pages : 309 pages
Book Rating : 4.4/5 (316 download)

Book Synopsis Near-field Nano/Atom Optics and Technology by : Motoichi Ohtsu

Download or read book Near-field Nano/Atom Optics and Technology written by Motoichi Ohtsu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt: Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.

Atomic Force Microscopy in Liquid

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Author : Arturo M. Baró
Publisher : John Wiley & Sons
ISBN 13 : 3527327584
Total Pages : 385 pages
Book Rating : 4.5/5 (273 download)

Book Synopsis Atomic Force Microscopy in Liquid by : Arturo M. Baró

Download or read book Atomic Force Microscopy in Liquid written by Arturo M. Baró and published by John Wiley & Sons. This book was released on 2012-05-14 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

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Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 9780306455964
Total Pages : 264 pages
Book Rating : 4.4/5 (559 download)

Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 2 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1997-04-30 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Applying a Commercial Atomic Force Microscope for Scanning Near-field Optical Microscopy Techniques and Investigation of Cell-cell Signaling

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Author : Gabriela Monserratt López Ayón
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (642 download)

Book Synopsis Applying a Commercial Atomic Force Microscope for Scanning Near-field Optical Microscopy Techniques and Investigation of Cell-cell Signaling by : Gabriela Monserratt López Ayón

Download or read book Applying a Commercial Atomic Force Microscope for Scanning Near-field Optical Microscopy Techniques and Investigation of Cell-cell Signaling written by Gabriela Monserratt López Ayón and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Force Microscopy

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Author : Dror Sarid
Publisher : Oxford University Press
ISBN 13 : 0195344693
Total Pages : 285 pages
Book Rating : 4.1/5 (953 download)

Book Synopsis Scanning Force Microscopy by : Dror Sarid

Download or read book Scanning Force Microscopy written by Dror Sarid and published by Oxford University Press. This book was released on 1994-08-25 with total page 285 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit

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Author : En-Te Hwu
Publisher : Edwin Hwu
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4./5 ( download)

Book Synopsis Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit by : En-Te Hwu

Download or read book Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit written by En-Te Hwu and published by Edwin Hwu. This book was released on 2014-04-30 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt: A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

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Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 0306470950
Total Pages : 208 pages
Book Rating : 4.3/5 (64 download)

Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 3 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Near Field Scanning Optical Microscopy(NSOM) of Nano Devices

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Author : Chun Hong Low
Publisher :
ISBN 13 :
Total Pages : 63 pages
Book Rating : 4.:/5 (31 download)

Book Synopsis Near Field Scanning Optical Microscopy(NSOM) of Nano Devices by : Chun Hong Low

Download or read book Near Field Scanning Optical Microscopy(NSOM) of Nano Devices written by Chun Hong Low and published by . This book was released on 2008 with total page 63 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis aims to investigate the optical properties of nano-devices using the technique of Near-Field Scanning Optical Microscopy (NSOM). A unique setup to perform Atomic Force Microscopy (AFM) and NSOM simultaneously in a scanning electron microscope (SEM) to collect spatially resolved luminescence and image transport on nano-scale structures, particularly nanowires, will allow direct determination of transport parameters, such as minority carrier mobility and diffusion length that are vital to the performance of optoelectronic devices. The work involves the development of a unique nano-scale imaging technique applicable to a wide range of structures. The main structures of interest in this thesis will be GaN nanowires. Instead of using a laser for generating charge for imaging, the e-beam from the SEM was used to generate localized charge for an NSOM probe to monitor the motion of the excess charge due to diffusion and/or drift via electron-hole recombination process. For the first time in this research, the author addressed numerous challenges such as the intricate NSOM technique to resolve sub-wavelength dimension measurements of the elements and determine optimized experimental parameters to compensate for the relatively low efficiency of NSOM optical collection. Of significance, transport imaging of 1-10 [micrometer] long GaN nanowires resulted in minority carrier diffusion lengths ranging from 1-2 [micrometer]. An initial experimental exploration was also conducted to determine the theoretical prediction of the unique transmission enhancement of Au nanobowties fabricated on luminescent GaAs heterostructure. The author will report the working principles, experimental procedures, optimal process parameters and the respective imaging results for assessing the properties of the nano-devices studied in this thesis work. Recommendations for future work pertaining to the augmentation of related NSOM work will also be made to ensure continued progress in this area of work.

Atomic Force Microscopy/Scanning Tunneling Microscopy

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Author : M.T. Bray
Publisher : Springer Science & Business Media
ISBN 13 : 1475793227
Total Pages : 431 pages
Book Rating : 4.4/5 (757 download)

Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy by : M.T. Bray

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by M.T. Bray and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Atomic Force Microscopy for Energy Research

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Author : Cai Shen
Publisher : CRC Press
ISBN 13 : 1000577872
Total Pages : 457 pages
Book Rating : 4.0/5 (5 download)

Book Synopsis Atomic Force Microscopy for Energy Research by : Cai Shen

Download or read book Atomic Force Microscopy for Energy Research written by Cai Shen and published by CRC Press. This book was released on 2022-04-26 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

Atomic Force Microscopy

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Author : Peter Eaton
Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.1/5 (995 download)

Book Synopsis Atomic Force Microscopy by : Peter Eaton

Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Atomic Force Microscopy

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Author : Victor Bellitto
Publisher : BoD – Books on Demand
ISBN 13 : 9535104144
Total Pages : 272 pages
Book Rating : 4.5/5 (351 download)

Book Synopsis Atomic Force Microscopy by : Victor Bellitto

Download or read book Atomic Force Microscopy written by Victor Bellitto and published by BoD – Books on Demand. This book was released on 2012-03-23 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

Atomic Force Microscopy For Biologists (2nd Edition)

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Author : Victor J Morris
Publisher : World Scientific
ISBN 13 : 190897821X
Total Pages : 423 pages
Book Rating : 4.9/5 (89 download)

Book Synopsis Atomic Force Microscopy For Biologists (2nd Edition) by : Victor J Morris

Download or read book Atomic Force Microscopy For Biologists (2nd Edition) written by Victor J Morris and published by World Scientific. This book was released on 2009-08-11 with total page 423 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is part of a range of emerging microscopic methods for biologists which offer the magnification range of both the light and electron microscope, but allow imaging under the 'natural' conditions usually associated with the light microscope. To biologists, AFM offers the prospect of high resolution images of biological material, images of molecules and their interactions even under physiological conditions, and the study of molecular processes in living systems. This book provides a realistic appreciation of the advantages and limitations of the technique and the present and future potential for improving the understanding of biological systems.The second edition of this bestseller has been updated to describe the latest developments in this exciting field, including a brand new chapter on force spectroscopy. The dramatic developments of AFM over the past ten years from a simple imaging tool to the multi-faceted, nano-manipulating technique that it is today are conveyed in a lively and informative narrative, which provides essential reading for students and experienced researchers alike./a

Scanning Microscopy Technologies and Applications

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Author : Edgar Clayton Teague
Publisher :
ISBN 13 :
Total Pages : 236 pages
Book Rating : 4.3/5 (91 download)

Book Synopsis Scanning Microscopy Technologies and Applications by : Edgar Clayton Teague

Download or read book Scanning Microscopy Technologies and Applications written by Edgar Clayton Teague and published by . This book was released on 1988 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: