Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Download Applications Of X Ray Topographic Methods To Materials Science full books in PDF, epub, and Kindle. Read online Applications Of X Ray Topographic Methods To Materials Science ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author : Sigmund Weissmann
Publisher : Springer
ISBN 13 :
Total Pages : 562 pages
Book Rating : 4.:/5 (89 download)
Download or read book Applications of X-Ray Topographic Methods to Materials Science written by Sigmund Weissmann and published by Springer. This book was released on 1984-12 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rutgers University. Bureau of Engineering Research
Publisher :
ISBN 13 :
Total Pages : 124 pages
Book Rating : 4.E/5 ( download)
Download or read book Research Report written by Rutgers University. Bureau of Engineering Research and published by . This book was released on 1985 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Eric Lifshin
Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)
Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Author : S Amelinckx
Publisher : Elsevier
ISBN 13 : 0444601864
Total Pages : 412 pages
Book Rating : 4.4/5 (446 download)
Download or read book Diffraction and Imaging Techniques in Material Science P2 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Author : Rebecca J. Pardee
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications of the National Institute of Standards and Technology 1988 Catalog written by Rebecca J. Pardee and published by . This book was released on 1989 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.:/5 (31 download)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Brian Keith Tanner
Publisher : Pergamon
ISBN 13 :
Total Pages : 192 pages
Book Rating : 4.:/5 (319 download)
Download or read book X-ray Diffraction Topography written by Brian Keith Tanner and published by Pergamon. This book was released on 1976 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring cr.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 360 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1989 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1092 pages
Book Rating : 4.:/5 (3 download)
Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1988 with total page 1092 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 688 pages
Book Rating : 4.:/5 (31 download)
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1988 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Volker Weiss
Publisher : Springer Science & Business Media
ISBN 13 : 1461329523
Total Pages : 533 pages
Book Rating : 4.4/5 (613 download)
Download or read book Nondestructive Evaluation of Materials written by Volker Weiss and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Army Materials and Mechanics Research Center of Water town, Massachusetts in cooperation with the Materials Science Group of the Department of Chemical Engineering and Materials Science of Syracuse University has conducted the Sagamore Army Materials Research Conference since 1954. The main purpose of these conferences has been to gather together over 150 scientists and engineers from academic institutions, industry and government who are uniquely qualified to explore in depth a subject of importance to the Department of Defense, the Army and the scientific community. This volume NONDESTRUCTIVE EVALUATION OF MATERIALS, addresses the areas of x-ray, ultrasonics and other methods of nondestructive testing. We wish to acknowledge the dedicated assistance of Joseph M. Bernier of the Army Materials and Mechanics Research Center and Helen Brown DeMascio of Syracuse University throughout the stages of the conference planning and finally the publication of this book. Their help is deeply appreciated. Syracuse University Syracuse, New York The Editors Contents SESSION I X-RAY S. Heissman, Moderator H. K. Herglotz, Moderator 1. Overview of X-Ray Diffraction Methods for Nondestructive Testing • • • • • • • ••• 1 L. V. Azaroff 2. Detection of Fatigue Damage by X-Rays 21 S. Taira and K. Kamachi 3. A Historical Example of Fatigue Damage • • • • • • • 55 H. K. Herglotz 4. The Application of X-Ray Topography to Materials Science . . . . . . . . . . . . . . . . . . . . 69 S. Weissman 5.
Author : André Authier
Publisher : Springer Science & Business Media
ISBN 13 : 1461558794
Total Pages : 419 pages
Book Rating : 4.4/5 (615 download)
Download or read book X-Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
Author :
Publisher :
ISBN 13 :
Total Pages : 760 pages
Book Rating : 4.F/5 ( download)
Download or read book Journal of Research of the National Institute of Standards and Technology written by and published by . This book was released on 1988 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : André Authier
Publisher : Oxford University Press, USA
ISBN 13 : 9780198528920
Total Pages : 700 pages
Book Rating : 4.5/5 (289 download)
Download or read book Dynamical Theory of X-ray Diffraction written by André Authier and published by Oxford University Press, USA. This book was released on 2004 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt: Publisher Description
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author :
Publisher :
ISBN 13 :
Total Pages : 280 pages
Book Rating : 4.3/5 (91 download)
Download or read book Applications of Synchrotron Radiation Techniques to Materials Science written by and published by . This book was released on 1996 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Meirion Wyn Roberts
Publisher : Royal Society of Chemistry
ISBN 13 : 0851863000
Total Pages : 412 pages
Book Rating : 4.8/5 (518 download)
Download or read book Surface and Defect Properties of Solids written by Meirion Wyn Roberts and published by Royal Society of Chemistry. This book was released on with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation Specialist Periodical Reports provide systematic and detailed review coverage of progress in the major areas of chemical research. Written by experts in their specialist fields the series creates a unique service for the active research chemist, supplying regular critical in-depth accounts of progress in particular areas of chemistry. For over 90 years The Royal Society of Chemistry and its predecessor, the Chemical Society, have been publishing reports charting developments in chemistry, which originally took the form of Annual Reports. However, by 1967 the whole spectrum of chemistry could no longer be contained within one volume and the series Specialist Periodical Reports was born. The Annual Reports themselves still existed but were divided into two, and subsequently three, volumes covering Inorganic, Organic and Physical Chemistry. For more general coverage of the highlights in chemistry they remain a 'must'. Since that time the SPR series has altered according to the fluctuating degree of activity in various fields of chemistry. Some titles have remained unchanged, while others have altered their emphasis along with their titles; some have been combined under a new name whereas others have had to be discontinued. The current list of Specialist Periodical Reports can be seen on the inside flap of this volume.
