Analysis of Particulate Matter Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) [microform]

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Publisher : Library and Archives Canada = Bibliothèque et Archives Canada
ISBN 13 : 9780612952096
Total Pages : 152 pages
Book Rating : 4.9/5 (52 download)

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Book Synopsis Analysis of Particulate Matter Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) [microform] by : Carolina Font Palma

Download or read book Analysis of Particulate Matter Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) [microform] written by Carolina Font Palma and published by Library and Archives Canada = Bibliothèque et Archives Canada. This book was released on 2004 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study particulate matter of environmental relevance. Aerosols with known chemical composition were produced using a vibrating orifice aerosol generator (VOAG). The characteristic patterns of the particles were obtained through the use of mass-resolved secondary ion images and mass spectra. The evaluation of several filters was conducted and mixed cellulose filters were selected as the appropriate substrate to sample aerosols. The size and morphology of particles was determined by scanning electron microscopy (SEM). Principal component analysis (PCA) was applied to differentiate chemically distinct areas produced by the aerosol particles and the background and found to improve the extraction of the essential chemical information from the enormous amount of data generated by ToF-SIMS imaging.

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

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Author :
Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681740885
Total Pages : 67 pages
Book Rating : 4.6/5 (817 download)

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Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn

Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Analysis of Organic and Inorganic Species on the Surface of Atmospheric Aerosol Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)

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Publisher :
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4.:/5 (13 download)

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Book Synopsis Analysis of Organic and Inorganic Species on the Surface of Atmospheric Aerosol Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) by : Richard E. Peterson

Download or read book Analysis of Organic and Inorganic Species on the Surface of Atmospheric Aerosol Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) written by Richard E. Peterson and published by . This book was released on 2002 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work explores the utility of time-of-flight static secondary-ion mass spectrometry (TOF-SIMS) for the analysis of the surface organic layer on individual atmospheric aerosol particles. The surface sensitivity and minimal fragmentation available with TOF-SIMS suggest that it can be a powerful tool for the examination of the organic and inorganic species on the surface of individual particles. Cascade impactors were used to collect aerosol from summer 2000 Montana forest fires, winter snowmobile samples in Yellowstone National Park, Hawaiian lava and sea salt, from an Asian Dust event reaching Salt Lake City, Utah in April 2001 and from Salt Lake Valley summer urban aerosol. TOF-SIMS analysis and multivariate statistical techniques combined gave chemical and morphological information about the particles. Surfaces of the aerosol from forest fires, snowmobile exhaust, and sea salt were all dominated by aliphatic hydrocarbons and their amphiphilic derivatives. Each source showed a different organic chemical signature. The extent and composition of the organics layer which typically covers the surface of atmospheric particles are expected to effect all of the surface related aerosol properties such as health effects, the ability of the particle to activate and form cloud droplets, and the aggregation of particles as well as reactions between the particle and gas phase species.

The Practice of TOF-SIMS

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Author :
Publisher :
ISBN 13 : 9781606507735
Total Pages : 0 pages
Book Rating : 4.5/5 (77 download)

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Book Synopsis The Practice of TOF-SIMS by : Alan M. Spool

Download or read book The Practice of TOF-SIMS written by Alan M. Spool and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that can provide information about composition with submicron lateral resolution for a wide variety of materials. In conjunction with the latest cluster ion sources, organic depth profiling is also commonly performed now. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity in the identification of many organic materials. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner along with guidelines to help the reader understand where they are or are not really helpful. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique. While the analyses are in fact performed in a vacuum, they are conducted in the context of a wider laboratory environment where many other analytical methods are available. The place of TOF-SIMS amongst them, when it is appropriate to use this method or another, or when multiple methods should be used in conjunction with TOF-SIMS is discussed in some depth. Examples of the wide range of applications of TOF-SIMS for research and problem solving in Academic Laboratories, National Laboratories, and Industrial laboratories, as it is applied to polymeric, biological, semiconductor, metallic, insulating, homogeneous, and inhomogeneous surfaces are described.

Time-of-flight Secondary Ion Mass Spectrometry

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Author :
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (82 download)

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Book Synopsis Time-of-flight Secondary Ion Mass Spectrometry by : Joanna Lee

Download or read book Time-of-flight Secondary Ion Mass Spectrometry written by Joanna Lee and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000 +; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. This thesis describes research undertaken to address the above challenges. Sample topography and field effects were evaluated experimentally using model conducting and insulating fibres and compared with computer simulations to provide recommendation to diagnose and reduce the effects. Two popular multivariate methods, principal component analysis (PCA) and multivariate curve resolution (MCR), were explored using mixed organic systems consisting of a simple polymer blend and complex hair fibres treated with a multi-component formulation to evaluate different multivariate and data preprocessing methods for the optimal identification, localisation and quantification of the chemical components. Finally, cluster ion beams C60 n+ and ArSOO-2S00 + were evaluated on an inorganic surface and an organic delta layer reference material respectively to elucidate the fundamental metrology of cluster ion sputtering and pave the way for their use in organic depth profiling. These studies provide the essential metrological foundation to address frontier issues in surface and nanoanalysis and extend the measurement capabilities ofToF-SIMS.

The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination

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Author :
Publisher :
ISBN 13 :
Total Pages : 488 pages
Book Rating : 4.:/5 (271 download)

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Book Synopsis The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination by : John Denman

Download or read book The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination written by John Denman and published by . This book was released on 2007 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (19 download)

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Book Synopsis Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data by : Negar Shahrokhesfahani

Download or read book Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data written by Negar Shahrokhesfahani and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass spectra at each pixel at an imaged area. Many ToF SIMS instruments use a type of detector that suffers from two problems that lead to non-linearity in the measured sample properties: detector saturation and dead time. Linearity in this type of system is defined as the proportionality of the measured and true ion counts. Non-linearity can influence the interpretation of the data with methods such as multivariate analysis. "Detector saturation" happens when more than one ion arrives at the detector in the time interval related to one specific channel but the detector records only a single count. "Dead time" is when one event happens at a certain channel and the detector become insensitive to subsequent ions arriving within the dead time window. These problems both lead to under-counting of ions. In this thesis, we mainly focus on correcting for the dead time effects. Using extensive simulations, we first characterize the adverse effects of dead time on the output and evaluate quality of existing ways to "correct" for dead time effects. Then, we propose a novel method using the Maximum Likelihood Estimation (MLE) to estimate the true spectrum for the measured data. Specifically, we incorporate the statistical distribution of the dead time affected data in MLE, which leads to a new method for dead time correction.

Analysis of Vehicle-derived Particulate Matter Emissions Using Pyrolysis-gas Chromatography-mass Spectrometry and Laser Desorption/ionization Time-of-flight Mass Spectrometry

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Publisher :
ISBN 13 :
Total Pages : 266 pages
Book Rating : 4.:/5 (66 download)

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Book Synopsis Analysis of Vehicle-derived Particulate Matter Emissions Using Pyrolysis-gas Chromatography-mass Spectrometry and Laser Desorption/ionization Time-of-flight Mass Spectrometry by : Saskia Katherine Bianca Van Bergen

Download or read book Analysis of Vehicle-derived Particulate Matter Emissions Using Pyrolysis-gas Chromatography-mass Spectrometry and Laser Desorption/ionization Time-of-flight Mass Spectrometry written by Saskia Katherine Bianca Van Bergen and published by . This book was released on 2003 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files

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Author :
Publisher :
ISBN 13 :
Total Pages : 43 pages
Book Rating : 4.:/5 (957 download)

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Book Synopsis Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files by :

Download or read book Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files written by and published by . This book was released on 2007 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Analysis of Atmospheric Aerosol Processes Using Single Particle Mass Spectrometry

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Publisher :
ISBN 13 :
Total Pages : 644 pages
Book Rating : 4.3/5 (121 download)

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Book Synopsis Analysis of Atmospheric Aerosol Processes Using Single Particle Mass Spectrometry by : Jeffrey Robert Whiteaker

Download or read book Analysis of Atmospheric Aerosol Processes Using Single Particle Mass Spectrometry written by Jeffrey Robert Whiteaker and published by . This book was released on 2002 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)

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Publisher :
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.:/5 (565 download)

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Book Synopsis Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) by : James A. Ohlhausen

Download or read book Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) written by James A. Ohlhausen and published by . This book was released on 2004 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Secondary Ion Mass Spectrometry by Time-of-flight

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Publisher :
ISBN 13 :
Total Pages : 129 pages
Book Rating : 4.:/5 (184 download)

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Book Synopsis Secondary Ion Mass Spectrometry by Time-of-flight by : Erich Werner Ens

Download or read book Secondary Ion Mass Spectrometry by Time-of-flight written by Erich Werner Ens and published by . This book was released on 1984 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Source Profiling and Apportionment of Airborne Particles

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Publisher :
ISBN 13 :
Total Pages : 904 pages
Book Rating : 4.3/5 (121 download)

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Book Synopsis Source Profiling and Apportionment of Airborne Particles by : Philip Joseph Silva

Download or read book Source Profiling and Apportionment of Airborne Particles written by Philip Joseph Silva and published by . This book was released on 2000 with total page 904 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials

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Publisher :
ISBN 13 :
Total Pages : 82 pages
Book Rating : 4.:/5 (758 download)

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Book Synopsis Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials by : Karsten Iltgen

Download or read book Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials written by Karsten Iltgen and published by . This book was released on 1997 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (113 download)

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Book Synopsis Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections by : Lothar Veith

Download or read book Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections written by Lothar Veith and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Secondary Ion Mass Spectrometry for Particulate Analysis

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Publisher :
ISBN 13 :
Total Pages : 32 pages
Book Rating : 4.:/5 (921 download)

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Book Synopsis Secondary Ion Mass Spectrometry for Particulate Analysis by :

Download or read book Secondary Ion Mass Spectrometry for Particulate Analysis written by and published by . This book was released on 1978 with total page 32 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces

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Publisher :
ISBN 13 :
Total Pages : 85 pages
Book Rating : 4.:/5 (762 download)

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Book Synopsis Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces by : Dietmar Stapel

Download or read book Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces written by Dietmar Stapel and published by . This book was released on 2000 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt: