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Analysis Of Aluminum Oxide Films On Silicon
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Book Synopsis Backscattering Spectrometry by : Wei-Kan Chu
Download or read book Backscattering Spectrometry written by Wei-Kan Chu and published by Elsevier. This book was released on 2012-12-02 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Backscattering Spectrometry reviews developments in backscattering spectrometry and covers topics ranging from instrumentation and experimental techniques to beam parameters and energy loss measurements. Backscattering spectrometry of thin films is also considered, and examples of backscattering analysis are given. This book is comprised of 10 chapters and begins with an introduction to backscattering spectrometry, what it can and what it cannot accomplish, and some ""rules of thumb"" for interpreting or reading spectra. The relative strengths and weaknesses of backscattering spectrometry in the framework of materials analysis are outlined. The following chapters focus on kinematics, scattering cross sections, energy loss, and energy straggling; backscattering analysis of thin films of various degrees of complications; the influence of beam parameters; and mass and depth resolutions and their relationships to the mass and energy of projectiles. Many examples of backscattering analysis are also presented to illustrate the capability and limitation of backscattering. Backscattering applications when combined with channeling effects are considered as well. The final chapter provides a list of references on the applications of backscattering spectrometry. This monograph will be a useful resource for physicists.
Book Synopsis Bibliography, with Abstracts, of AFCRL Publications from 1 July to 30 September 1972 by : Air Force Cambridge Research Laboratories (U.S.)
Download or read book Bibliography, with Abstracts, of AFCRL Publications from 1 July to 30 September 1972 written by Air Force Cambridge Research Laboratories (U.S.) and published by . This book was released on 1972 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: This bibliography lists all AFCRL in-house reports, journal articles, and contractor reports issued during the reporting period. The DD Form 1473 (Document Control Data - R & D) for each publication is included. In Part I, the 1473's for in-house reports are arranged numerically by the series in which they were issued: in Part II, the 1473's for journal articles are arranged alphabetically by author; in Part III, the 1473's for contractor reports are arranged alphabetically by corporate author. For cross-reference purposes, an index is included, listing the publications numerically by the AFCRL document number.
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis High Efficiency Silicon Solar Cells by : Martin A. Green
Download or read book High Efficiency Silicon Solar Cells written by Martin A. Green and published by Trans Tech Publications Ltd. This book was released on 1987-01-01 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: The early chapters comprehensively review the optical and transport properties of silicon. Light trapping is described in detail. Limits on the efficiency of silicon cells are discussed as well as material requirements necessary to approach these limits. The status of current approaches to passifying surfaces, contacts and bulk regions is reviewed. The final section of the book describes the most practical approaches to the fabrication of high-efficiency cells capable of meeting the efficiency targets for both concentrated and non-concentrated sunlight, including a discussion of design and processing approaches for non-crystalline silicon.
Book Synopsis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis by : Alvin W. Czanderna
Download or read book Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis written by Alvin W. Czanderna and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 447 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Book Synopsis ASTIA Subject Headings by : Defense Documentation Center (U.S.)
Download or read book ASTIA Subject Headings written by Defense Documentation Center (U.S.) and published by . This book was released on 1959 with total page 780 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1969 with total page 1084 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Solid State Technology written by and published by . This book was released on 1973 with total page 936 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Probe Quantitation by : K.F.J. Heinrich
Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 1991-06-30 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Book Synopsis Atomic Layer Deposition for Semiconductors by : Cheol Seong Hwang
Download or read book Atomic Layer Deposition for Semiconductors written by Cheol Seong Hwang and published by Springer Science & Business Media. This book was released on 2013-10-18 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.
Book Synopsis Optical Characterization of Real Surfaces and Films by : K. Vedam
Download or read book Optical Characterization of Real Surfaces and Films written by K. Vedam and published by Academic Press. This book was released on 2013-10-22 with total page 345 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Book Synopsis Journal of Applied Physics & Applied Physics Letters by : Nichigai Asoshiētsu
Download or read book Journal of Applied Physics & Applied Physics Letters written by Nichigai Asoshiētsu and published by . This book was released on 1974 with total page 1272 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Standard Methods of Chemical Analysis by : Wilfred Welday Scott
Download or read book Standard Methods of Chemical Analysis written by Wilfred Welday Scott and published by . This book was released on 1925 with total page 1390 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Book Synopsis Corrosion of Aluminium by : Christian Vargel
Download or read book Corrosion of Aluminium written by Christian Vargel and published by Elsevier. This book was released on 2004-10-02 with total page 659 pages. Available in PDF, EPUB and Kindle. Book excerpt: Corrosion of Aluminium highlights the practical and general aspects of the corrosion of aluminium alloys with many illustrations and references. In addition to that, the first chapter allows the reader who is not very familiar with aluminium to understand the metallurgical, chemical and physical features of the aluminium alloys. The author Christian Vargel, has adopted a practitioner approach, based on the expertise and experience gained from a 40 year career in aluminium corrosion This approach is most suitable for assessing the corrosion resistance of aluminium- an assessment which is one of the main conditions for the development of many uses of aluminium in transport, construction, power transmission etc. - 600 bibliographic references provide a comprehensive guide to over 100 years of related study - Providing practical applications to the reader across many industries - Accessible to both the beginner and the expert
Book Synopsis Electrochemical Industry by : Eugene Franz Roeber
Download or read book Electrochemical Industry written by Eugene Franz Roeber and published by . This book was released on 1904 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Photoelectrochemical Solar Conversion Systems by : Andrés G. Muñoz
Download or read book Photoelectrochemical Solar Conversion Systems written by Andrés G. Muñoz and published by CRC Press. This book was released on 2016-04-19 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing new insights into the molecular and electronic processes involved in the conversion of sunlight into chemical products, Photoelectrochemical Solar Conversion Systems: Molecular and Electronic Aspects begins with an historical overview and a survey of recent developments in the electrochemistry of semiconductors and spectroscopic technique
