Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

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Publisher :
ISBN 13 : 9781424409594
Total Pages : 263 pages
Book Rating : 4.4/5 (95 download)

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Book Synopsis Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium by : Components, Packaging, and Manufacturing Technology Society

Download or read book Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium written by Components, Packaging, and Manufacturing Technology Society and published by . This book was released on 2007 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt:

2007 Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

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Publisher : IEEE
ISBN 13 : 9781424409587
Total Pages : 261 pages
Book Rating : 4.4/5 (95 download)

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Book Synopsis 2007 Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium by :

Download or read book 2007 Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium written by and published by IEEE. This book was released on 2007-01-01 with total page 261 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE.

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (812 download)

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Book Synopsis Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE. by :

Download or read book Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE. written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium

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Author :
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (232 download)

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Download or read book Twenty Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Thermal Analysis of Power Electronic Devices Used in Renewable Energy Systems

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Publisher : Springer
ISBN 13 : 3319598287
Total Pages : 224 pages
Book Rating : 4.3/5 (195 download)

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Book Synopsis Thermal Analysis of Power Electronic Devices Used in Renewable Energy Systems by : Alhussein Albarbar

Download or read book Thermal Analysis of Power Electronic Devices Used in Renewable Energy Systems written by Alhussein Albarbar and published by Springer. This book was released on 2017-07-19 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book analyzes the thermal characteristics of power electronic devices (PEDs) with a focus on those used in wind and solar energy systems. The authors focus on the devices used in such applications, for example boost converters and inverters under different operating conditions. The book explains in detail finite element modeling techniques, setting up measuring systems, data analysis, and PEDs’ lifetime calculations. It is appropriate reading for graduate students and researchers who focus on the design and reliability of power electronic devices.

The Industrial Electronics Handbook - Five Volume Set

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Publisher : CRC Press
ISBN 13 : 0429584776
Total Pages : 5483 pages
Book Rating : 4.4/5 (295 download)

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Book Synopsis The Industrial Electronics Handbook - Five Volume Set by : Bogdan M. Wilamowski

Download or read book The Industrial Electronics Handbook - Five Volume Set written by Bogdan M. Wilamowski and published by CRC Press. This book was released on 2011-03-04 with total page 5483 pages. Available in PDF, EPUB and Kindle. Book excerpt: Industrial electronics systems govern so many different functions that vary in complexity-from the operation of relatively simple applications, such as electric motors, to that of more complicated machines and systems, including robots and entire fabrication processes. The Industrial Electronics Handbook, Second Edition combines traditional and new

Nanoelectronics

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Publisher : Elsevier
ISBN 13 : 0128133546
Total Pages : 476 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Nanoelectronics by :

Download or read book Nanoelectronics written by and published by Elsevier. This book was released on 2018-10-05 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics: Devices, Circuits and Systems explores current and emerging trends in the field of nanoelectronics, from both a devices-to-circuits and circuits-to-systems perspective. It covers a wide spectrum and detailed discussion on the field of nanoelectronic devices, circuits and systems. This book presents an in-depth analysis and description of electron transport phenomenon at nanoscale dimensions. Both qualitative and analytical approaches are taken to explore the devices, circuit functionalities and their system applications at deep submicron and nanoscale levels. Recent devices, including FinFET, Tunnel FET, and emerging materials, including graphene, and its applications are discussed. In addition, a chapter on advanced VLSI interconnects gives clear insight to the importance of these nano-transmission lines in determining the overall IC performance. The importance of integration of optics with electronics is elucidated in the optoelectronics and photonic integrated circuit sections of this book. This book provides valuable resource materials for scientists and electrical engineers who want to learn more about nanoscale electronic materials and how they are used. Shows how electronic transport works at the nanoscale level Demonstrates how nanotechnology can help engineers create more effective circuits and systems Assesses the most commonly used nanoelectronic devices, explaining which is best for different situations

Nonlinear Systems in Heat Transfer

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Publisher : Elsevier
ISBN 13 : 0128120207
Total Pages : 289 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Nonlinear Systems in Heat Transfer by : Davood Domairry Ganji

Download or read book Nonlinear Systems in Heat Transfer written by Davood Domairry Ganji and published by Elsevier. This book was released on 2017-09-15 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nonlinear Heat Transfer: Mathematical Modeling and Analytical Methods addresses recent progress and original research in nonlinear science and its application in the area of heat transfer, with a particular focus on the most important advances and challenging applications. The importance of understanding analytical methods for solving linear and nonlinear constitutive equations is essential in studying engineering problems. This book provides a comprehensive range of (partial) differential equations, applied in the field of heat transfer, tackling a comprehensive range of nonlinear mathematical problems in heat radiation, heat conduction, heat convection, heat diffusion and non-Newtonian fluid systems. Providing various innovative analytical techniques and their practical application in nonlinear engineering problems is the unique point of this book. Drawing a balance between theory and practice, the different chapters of the book focus not only on the broader linear and nonlinear problems, but also applied examples of practical solutions by the outlined methodologies. Demonstrates applied mathematical techniques in the engineering applications, especially in nonlinear phenomena Exhibits a complete understanding of analytical methods and nonlinear differential equations in heat transfer Provides the tools to model and interpret applicable methods in heat transfer processes or systems to solve related complexities

Thermal and Electro-Thermal System Simulation

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Publisher : MDPI
ISBN 13 : 3039217364
Total Pages : 222 pages
Book Rating : 4.0/5 (392 download)

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Book Synopsis Thermal and Electro-Thermal System Simulation by : Márta Rencz

Download or read book Thermal and Electro-Thermal System Simulation written by Márta Rencz and published by MDPI. This book was released on 2019-11-18 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: With increasing power levels and power densities in electronics systems, thermal issues are becoming more and more critical. The elevated temperatures result in changing electrical system parameters, changing the operation of devices, and sometimes even the destruction of devices. To prevent this, the thermal behavior has to be considered in the design phase. This can be done with thermal end electro-thermal design and simulation tools. This Special Issue of Energies, edited by two well-known experts of the field, Prof. Marta Rencz, Budapest University of Technology and Economics, and by Prof. Lorenzo Codecasa, Politecnico di Milano, collects twelve papers carefully selected for the representation of the latest results in thermal and electro-thermal system simulation. These contributions present a good survey of the latest results in one of the most topical areas in the field of electronics: The thermal and electro-thermal simulation of electronic components and systems. Several papers of this issue are extended versions of papers presented at the THERMINIC 2018 Workshop, held in Stockholm in the fall of 2018. The papers presented here deal with modeling and simulation of state-of-the-art applications that are highly critical from the thermal point of view, and around which there is great research activity in both industry and academia. Contributions covered the thermal simulation of electronic packages, electro-thermal advanced modeling in power electronics, multi-physics modeling and simulation of LEDs, and the characterization of interface materials, among other subjects.

Thirty-Fourth Annual Semiconductor Thermal Measurement and Management Symposium

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (15 download)

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Download or read book Thirty-Fourth Annual Semiconductor Thermal Measurement and Management Symposium written by and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor thermal management and modeling.

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis

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Publisher : ASM International
ISBN 13 : 1615030905
Total Pages : 372 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis by : ASM International

Download or read book ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2007-01-01 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session

Thirty-third Annual Semiconductor Thermal Measurement and Management Symposium

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Publisher :
ISBN 13 : 9781538615317
Total Pages : pages
Book Rating : 4.6/5 (153 download)

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Book Synopsis Thirty-third Annual Semiconductor Thermal Measurement and Management Symposium by : Paul Wesling

Download or read book Thirty-third Annual Semiconductor Thermal Measurement and Management Symposium written by Paul Wesling and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015)

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Publisher : Springer
ISBN 13 : 9811317992
Total Pages : 646 pages
Book Rating : 4.8/5 (113 download)

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Book Synopsis Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015) by : Jemal H. Abawajy

Download or read book Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015) written by Jemal H. Abawajy and published by Springer. This book was released on 2019-08-09 with total page 646 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings gather outstanding research papers presented at the Second International Conference on Data Engineering 2015 (DaEng-2015) and offer a consolidated overview of the latest developments in databases, information retrieval, data mining and knowledge management. The conference brought together researchers and practitioners from academia and industry to address key challenges in these fields, discuss advanced data engineering concepts and form new collaborations. The topics covered include but are not limited to: • Data engineering • Big data • Data and knowledge visualization • Data management • Data mining and warehousing • Data privacy & security • Database theory • Heterogeneous databases • Knowledge discovery in databases • Mobile, grid and cloud computing • Knowledge management • Parallel and distributed data • Temporal data • Web data, services and information engineering • Decision support systems • E-Business engineering and management • E-commerce and e-learning • Geographical information systems • Information management • Information quality and strategy • Information retrieval, integration and visualization • Information security • Information systems and technologies

Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE.

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (847 download)

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Download or read book Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE. written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Failure Analysis

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Publisher : John Wiley & Sons
ISBN 13 : 1119990009
Total Pages : 372 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Failure Analysis by : Marius Bazu

Download or read book Failure Analysis written by Marius Bazu and published by John Wiley & Sons. This book was released on 2011-03-08 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.

2014 IEEE/CPMT 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM 2014)

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Publisher :
ISBN 13 : 9781479943746
Total Pages : 251 pages
Book Rating : 4.9/5 (437 download)

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Download or read book 2014 IEEE/CPMT 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM 2014) written by and published by . This book was released on 2014 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Theory and Practice of Thermal Transient Testing of Electronic Components

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Publisher : Springer Nature
ISBN 13 : 3030861740
Total Pages : 389 pages
Book Rating : 4.0/5 (38 download)

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Book Synopsis Theory and Practice of Thermal Transient Testing of Electronic Components by : Marta Rencz

Download or read book Theory and Practice of Thermal Transient Testing of Electronic Components written by Marta Rencz and published by Springer Nature. This book was released on 2023-01-23 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.