X-ray Scattering Studies of Compound Semiconductors

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (596 download)

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Book Synopsis X-ray Scattering Studies of Compound Semiconductors by : Caroline Dale Moore

Download or read book X-ray Scattering Studies of Compound Semiconductors written by Caroline Dale Moore and published by . This book was released on 1997 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-ray Scattering from Semiconductors

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Author :
Publisher : World Scientific
ISBN 13 : 1860941591
Total Pages : 303 pages
Book Rating : 4.8/5 (69 download)

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Book Synopsis X-ray Scattering from Semiconductors by : Paul F. Fewster

Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.

X-Ray Scattering from Semiconductors and Other Materials

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Publisher : World Scientific
ISBN 13 : 9814436933
Total Pages : 510 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis X-Ray Scattering from Semiconductors and Other Materials by : Paul F. Fewster

Download or read book X-Ray Scattering from Semiconductors and Other Materials written by Paul F. Fewster and published by World Scientific. This book was released on 2015 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

Analytical Techniques for the Characterization of Compound Semiconductors

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Publisher : Elsevier
ISBN 13 : 0444596720
Total Pages : 554 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis Analytical Techniques for the Characterization of Compound Semiconductors by : G. Bastard

Download or read book Analytical Techniques for the Characterization of Compound Semiconductors written by G. Bastard and published by Elsevier. This book was released on 1991-07-26 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.

Inelastic X-ray Scattering Studies on Organic Semiconductors and Organic Superconductors

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Publisher :
ISBN 13 : 9780549082286
Total Pages : 79 pages
Book Rating : 4.0/5 (822 download)

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Book Synopsis Inelastic X-ray Scattering Studies on Organic Semiconductors and Organic Superconductors by : Chaminda Nalaka Kodituwakku

Download or read book Inelastic X-ray Scattering Studies on Organic Semiconductors and Organic Superconductors written by Chaminda Nalaka Kodituwakku and published by . This book was released on 2007 with total page 79 pages. Available in PDF, EPUB and Kindle. Book excerpt: We have developed a new preparation procedure of medium energy resolution (120 meV) Ge (733) analyzer for IXS spectrometers at APS.

High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (66 download)

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Book Synopsis High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors by : Wen-Jih Lin

Download or read book High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors written by Wen-Jih Lin and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Absorption Spectroscopy of Semiconductors

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Publisher : Springer
ISBN 13 : 3662443627
Total Pages : 367 pages
Book Rating : 4.6/5 (624 download)

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Book Synopsis X-Ray Absorption Spectroscopy of Semiconductors by : Claudia S. Schnohr

Download or read book X-Ray Absorption Spectroscopy of Semiconductors written by Claudia S. Schnohr and published by Springer. This book was released on 2014-11-05 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

High-Resolution X-Ray Scattering

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Publisher : Springer Science & Business Media
ISBN 13 : 1475740506
Total Pages : 410 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis High-Resolution X-Ray Scattering by : Ullrich Pietsch

Download or read book High-Resolution X-Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540201793
Total Pages : 224 pages
Book Rating : 4.2/5 (17 download)

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Book Synopsis X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by : Martin Schmidbauer

Download or read book X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures written by Martin Schmidbauer and published by Springer Science & Business Media. This book was released on 2004-01-09 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

X-ray Scattering Studies of Self-organized Nanoscale-structures on Semiconductor Surfaces

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ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (39 download)

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Book Synopsis X-ray Scattering Studies of Self-organized Nanoscale-structures on Semiconductor Surfaces by : Mirang Yoon

Download or read book X-ray Scattering Studies of Self-organized Nanoscale-structures on Semiconductor Surfaces written by Mirang Yoon and published by . This book was released on 1998 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Compound Semiconductors 1994, Proceedings of the Twenty-First INT Symposium on Compound Semiconductors held in San Diego, California, 18-22 September 1994

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Publisher : CRC Press
ISBN 13 : 9780750302265
Total Pages : 946 pages
Book Rating : 4.3/5 (22 download)

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Book Synopsis Compound Semiconductors 1994, Proceedings of the Twenty-First INT Symposium on Compound Semiconductors held in San Diego, California, 18-22 September 1994 by : Herb Goronkin

Download or read book Compound Semiconductors 1994, Proceedings of the Twenty-First INT Symposium on Compound Semiconductors held in San Diego, California, 18-22 September 1994 written by Herb Goronkin and published by CRC Press. This book was released on 1995-01-01 with total page 946 pages. Available in PDF, EPUB and Kindle. Book excerpt: Compound Semiconductors 1994 provides a comprehensive overview of research and applications of gallium arsenide, indium phosphide, silicon carbide, and other compound semiconducting materials. Contributed by leading experts, the book discusses growth, characterization, processing techniques, device applications, high-power, high-temperature semiconductor devices, visible emitters and optoelectronic integrated circuits (OEICs), heterojunction transistors, nanoelectronics, and nanophotonics, and simulation and modeling. The book is an essential reference for researchers working on the fabrication of semiconductors, characterization of materials, and their applications for devices, such as lasers, photodiodes, sensors, and transistors, particularly in the high-speed telecommunications industries.

Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)

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Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors by : D. L. Williamson

Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors written by D. L. Williamson and published by . This book was released on 1994 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Our general objectives are to provide new details of the microstructure for the size scale from about 1 to 30 nm in high-quality a-Si:H and related alloys prepared by current state-of-the-art deposition methods as well as by new and emerging deposition technologies and thereby help determine the role of microvoids and other density fluctuations in controlling the opto-electronic properties.

Basic X-ray Scattering for Soft Matter

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Publisher : Oxford University Press
ISBN 13 : 0198728662
Total Pages : 149 pages
Book Rating : 4.1/5 (987 download)

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Book Synopsis Basic X-ray Scattering for Soft Matter by : Wilhelmus Hendrikus Jeu

Download or read book Basic X-ray Scattering for Soft Matter written by Wilhelmus Hendrikus Jeu and published by Oxford University Press. This book was released on 2016 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is a well-established technique in materials science. The aim of this text is to explain basic principles and applications of x-ray scattering in a simple way using many practical examples followed by more elaborate case studies. It contains a separate chapter on the different types of order/disorder in soft matter that play such an important role in modern self-assembling systems. Finally the last chapter treats soft matter surfaces and thin film that are increasingly used in coatings and in many technological applications, such as liquid crystal displays and nanostructured block copolymer films

High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (66 download)

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Book Synopsis High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors by : Wen-Jih Lin

Download or read book High-resolution X-ray Scattering Studies of Thin Film Superconductors and Semiconductors written by Wen-Jih Lin and published by . This book was released on 1998 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report

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Publisher :
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4.:/5 (727 download)

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Book Synopsis X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report by :

Download or read book X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report written by and published by . This book was released on 1993 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: A summary of research work performed from 11/1/86 to 4/10/93 is presented. Synchrotron x rays were used to probe the short-range-order (SRO) structures in these materials, especially layered semiconductors and high-{Tc} oxide superconductors. X-ray absorption fine structure spectroscopy, grazing incidence x-ray scattering and fluorescence, and total electron yield as probe for surfaces and interfaces were used. A new soft x-ray detector was developed.

Synchrotron Light Sources and Free-Electron Lasers

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Publisher : Springer
ISBN 13 : 9783319143934
Total Pages : 0 pages
Book Rating : 4.1/5 (439 download)

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Book Synopsis Synchrotron Light Sources and Free-Electron Lasers by : Eberhard J. Jaeschke

Download or read book Synchrotron Light Sources and Free-Electron Lasers written by Eberhard J. Jaeschke and published by Springer. This book was released on 2016-05-27 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardly any other discovery of the nineteenth century did have such an impact on science and technology as Wilhelm Conrad Röntgen’s seminal find of the X-rays. X-ray tubes soon made their way as excellent instruments for numerous applications in medicine, biology, materials science and testing, chemistry and public security. Developing new radiation sources with higher brilliance and much extended spectral range resulted in stunning developments like the electron synchrotron and electron storage ring and the freeelectron laser. This handbook highlights these developments in fifty chapters. The reader is given not only an inside view of exciting science areas but also of design concepts for the most advanced light sources. The theory of synchrotron radiation and of the freeelectron laser, design examples and the technology basis are presented. The handbook presents advanced concepts like seeding and harmonic generation, the booming field of Terahertz radiation sources and upcoming brilliant light sources driven by laser-plasma accelerators. The applications of the most advanced light sources and the advent of nanobeams and fully coherent x-rays allow experiments from which scientists in the past could not even dream. Examples are the diffraction with nanometer resolution, imaging with a full 3D reconstruction of the object from a diffraction pattern, measuring the disorder in liquids with high spatial and temporal resolution. The 20th century was dedicated to the development and improvement of synchrotron light sources with an ever ongoing increase of brilliance. With ultrahigh brilliance sources, the 21st century will be the century of x-ray lasers and their applications. Thus, we are already close to the dream of condensed matter and biophysics: imaging single (macro)molecules and measuring their dynamics on the femtosecond timescale to produce movies with atomic resolution.

Processing and Properties of Compound Semiconductors

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Publisher : Elsevier
ISBN 13 : 0080541011
Total Pages : 333 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Processing and Properties of Compound Semiconductors by :

Download or read book Processing and Properties of Compound Semiconductors written by and published by Elsevier. This book was released on 2001-10-20 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The Willardson and Beer series, as it is widely known, has succeeded in producing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise that this tradition will be maintained and even expanded.