X Ray Scattering From Semiconductors

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X-ray Scattering From Semiconductors And Other Materials (3rd Edition)

Author : Fewster Paul F
Publisher : World Scientific
ISBN 13 : 9814436941
Total Pages : 512 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis X-ray Scattering From Semiconductors And Other Materials (3rd Edition) by : Fewster Paul F

Download or read book X-ray Scattering From Semiconductors And Other Materials (3rd Edition) written by Fewster Paul F and published by World Scientific. This book was released on 2015-02-12 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

X-Ray Scattering from Semiconductors and Other Materials

Author : Paul F. Fewster
Publisher : World Scientific
ISBN 13 : 9814436933
Total Pages : 510 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis X-Ray Scattering from Semiconductors and Other Materials by : Paul F. Fewster

Download or read book X-Ray Scattering from Semiconductors and Other Materials written by Paul F. Fewster and published by World Scientific. This book was released on 2015 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

X-Ray Scattering from Semiconductors (2n

Author : Paul F. Fewster
Publisher : Imperial College Pr
ISBN 13 : 9781860943607
Total Pages : 299 pages
Book Rating : 4.9/5 (436 download)

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Book Synopsis X-Ray Scattering from Semiconductors (2n by : Paul F. Fewster

Download or read book X-Ray Scattering from Semiconductors (2n written by Paul F. Fewster and published by Imperial College Pr. This book was released on 2003 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.

X-Ray Metrology in Semiconductor Manufacturing

Author : D. Keith Bowen
Publisher : CRC Press
ISBN 13 : 9781420005653
Total Pages : 304 pages
Book Rating : 4.0/5 (56 download)

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Book Synopsis X-Ray Metrology in Semiconductor Manufacturing by : D. Keith Bowen

Download or read book X-Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Author : Martin Schmidbauer
Publisher : Springer Science & Business Media
ISBN 13 : 9783540201793
Total Pages : 224 pages
Book Rating : 4.2/5 (17 download)

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Book Synopsis X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by : Martin Schmidbauer

Download or read book X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures written by Martin Schmidbauer and published by Springer Science & Business Media. This book was released on 2004-01-09 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

X-ray Scattering From Semiconductors

Author : Paul F Fewster
Publisher : World Scientific
ISBN 13 : 1783262079
Total Pages : 304 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis X-ray Scattering From Semiconductors by : Paul F Fewster

Download or read book X-ray Scattering From Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2000-10-27 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a

X-Ray Scattering from Semiconductors

Author : Paul F Fewster
Publisher : World Scientific
ISBN 13 : 178326098X
Total Pages : 316 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis X-Ray Scattering from Semiconductors by : Paul F Fewster

Download or read book X-Ray Scattering from Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented. Contents:An Introduction to Semiconductor MaterialsAn Introduction to X-Ray ScatteringEquipment for Measuring Diffraction PatternsA Practical Guide to the Evaluation of Structural Parameters Readership: Postgraduate researchers in crystallography, materials science, semiconductors and physics. Keywords:X-Ray;Diffraction;Scattering;Semiconductors;Rocking Curve;Reciprocal Space;Topography;High Resolution;Thin Films;Reflectometry;Dynamical Theory

Semiconductor X-Ray Detectors

Author : B. G. Lowe
Publisher : CRC Press
ISBN 13 : 1466554010
Total Pages : 610 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Semiconductor X-Ray Detectors by : B. G. Lowe

Download or read book Semiconductor X-Ray Detectors written by B. G. Lowe and published by CRC Press. This book was released on 2013-12-07 with total page 610 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the history and development of Si(Li) X-Ray Detectors, while providing an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters summarize relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the manufacture and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

Gamma- and X-ray Spectrometry with Semiconductor Detectors

Author : Klaus Debertin
Publisher : North Holland
ISBN 13 :
Total Pages : 420 pages
Book Rating : 4.:/5 (5 download)

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Book Synopsis Gamma- and X-ray Spectrometry with Semiconductor Detectors by : Klaus Debertin

Download or read book Gamma- and X-ray Spectrometry with Semiconductor Detectors written by Klaus Debertin and published by North Holland. This book was released on 1988 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.

High-Resolution X-Ray Scattering

Author : Ullrich Pietsch
Publisher : Springer Science & Business Media
ISBN 13 : 1475740506
Total Pages : 410 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis High-Resolution X-Ray Scattering by : Ullrich Pietsch

Download or read book High-Resolution X-Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.

Characterization of Semiconductor Heterostructures and Nanostructures

Author : Tobias Schülli
Publisher : Elsevier Inc. Chapters
ISBN 13 : 0128083379
Total Pages : 828 pages
Book Rating : 4.1/5 (28 download)

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Book Synopsis Characterization of Semiconductor Heterostructures and Nanostructures by : Tobias Schülli

Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Tobias Schülli and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 828 pages. Available in PDF, EPUB and Kindle. Book excerpt:

III-V Compound Semiconductors

Author : Tingkai Li
Publisher : CRC Press
ISBN 13 : 1439815232
Total Pages : 588 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis III-V Compound Semiconductors by : Tingkai Li

Download or read book III-V Compound Semiconductors written by Tingkai Li and published by CRC Press. This book was released on 2016-04-19 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon-based microelectronics has steadily improved in various performance-to-cost metrics. But after decades of processor scaling, fundamental limitations and considerable new challenges have emerged. The integration of compound semiconductors is the leading candidate to address many of these issues and to continue the relentless pursuit of more

Physics Of Semiconductors - Proceedings Of The 20th International Conference (In 3 Volumes)

Author : E M Anastassakis
Publisher : World Scientific
ISBN 13 : 9814583634
Total Pages : 2768 pages
Book Rating : 4.8/5 (145 download)

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Book Synopsis Physics Of Semiconductors - Proceedings Of The 20th International Conference (In 3 Volumes) by : E M Anastassakis

Download or read book Physics Of Semiconductors - Proceedings Of The 20th International Conference (In 3 Volumes) written by E M Anastassakis and published by World Scientific. This book was released on 1990-11-29 with total page 2768 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gathering top experts in the field, the 20th ICPS proceedings reviews the progress in all aspects of semiconductor physics. The proceedings will include state-of-the-art lectures with special emphasis on exciting new developments. It should serve as excellent material for researchers in this and related fields.

X-Ray Absorption Spectroscopy of Semiconductors

Author : Claudia S. Schnohr
Publisher : Springer
ISBN 13 : 3662443627
Total Pages : 367 pages
Book Rating : 4.6/5 (624 download)

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Book Synopsis X-Ray Absorption Spectroscopy of Semiconductors by : Claudia S. Schnohr

Download or read book X-Ray Absorption Spectroscopy of Semiconductors written by Claudia S. Schnohr and published by Springer. This book was released on 2014-11-05 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

Analytical Techniques for the Characterization of Compound Semiconductors

Author : G. Bastard
Publisher : Elsevier
ISBN 13 : 0444596720
Total Pages : 554 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis Analytical Techniques for the Characterization of Compound Semiconductors by : G. Bastard

Download or read book Analytical Techniques for the Characterization of Compound Semiconductors written by G. Bastard and published by Elsevier. This book was released on 1991-07-26 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.

X-Ray and Neutron Dynamical Diffraction

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Author : André Authier
Publisher : Springer Science & Business Media
ISBN 13 : 1461558794
Total Pages : 419 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis X-Ray and Neutron Dynamical Diffraction by : André Authier

Download or read book X-Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

X-Ray Metrology in Semiconductor Manufacturing

Author : D. Keith Bowen
Publisher : CRC Press
ISBN 13 : 1420005650
Total Pages : 296 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis X-Ray Metrology in Semiconductor Manufacturing by : D. Keith Bowen

Download or read book X-Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.