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X Ray Diffraction By Polycrystalline Materials
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Book Synopsis X-Ray Diffraction by Polycrystalline Materials by : René Guinebretière
Download or read book X-Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Book Synopsis X-ray Diffraction by Polycrystalline Materials by : Herbert Steffen Peiser
Download or read book X-ray Diffraction by Polycrystalline Materials written by Herbert Steffen Peiser and published by . This book was released on 1955 with total page 734 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-Ray Diffraction Procedures by : Harold P. Klug
Download or read book X-Ray Diffraction Procedures written by Harold P. Klug and published by Wiley-Interscience. This book was released on 1974-05-28 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt: Elementary crystallography. The production and properties of X-rays. Fundamental principles of X-ray diffraction. Photographic powder techniques. Diffractometric powder technique. The interpretation of powder diffraction data. Qualitative and quantitative analysis of crystalline powders. The precision determination of lattice constants. Crystallite size and lattice strains from line broadening. Investigation of preferred orientation and texture. Stress measurements in metals. Radial-distribution studies of noncrystalline materials. Layout for a diffraction laboratory. The handling and processing of X-ray film. Miscellaneous constants and numerical data. International atomic weights. Mass absorption coefficients u/p of the elements (Z=1 to 83) for a selection of wavelenghts. Quadratic forms for the cubic system. Atomic and ionic scattering factors. Lorentz and polarization factors. Temperature factor table. Warren's powder pattern power theorem.
Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda
Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Book Synopsis X-ray Diffraction by Polycrystalline Materials by : Jimmy Delloyd Kempton
Download or read book X-ray Diffraction by Polycrystalline Materials written by Jimmy Delloyd Kempton and published by . This book was released on 1959 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-Ray Diffraction by Polycrystalline Materials by : HS Peiser (ed)
Download or read book X-Ray Diffraction by Polycrystalline Materials written by HS Peiser (ed) and published by . This book was released on 1955 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray Diffraction by Polycrystalline Materials by : Institute of Physics (Great Britain). X-ray Analysis Group
Download or read book X-ray Diffraction by Polycrystalline Materials written by Institute of Physics (Great Britain). X-ray Analysis Group and published by . This book was released on 1955 with total page 725 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray diffraction by polycrystalline materials by : Herbert S. Peiser
Download or read book X-ray diffraction by polycrystalline materials written by Herbert S. Peiser and published by . This book was released on 1960 with total page 725 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz
Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Book Synopsis Diffraction Analysis of the Microstructure of Materials by : Eric J. Mittemeijer
Download or read book Diffraction Analysis of the Microstructure of Materials written by Eric J. Mittemeijer and published by Springer Science & Business Media. This book was released on 2013-11-21 with total page 557 pages. Available in PDF, EPUB and Kindle. Book excerpt: Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Book Synopsis Polycrystalline Materials by : Zaharii Zakhariev
Download or read book Polycrystalline Materials written by Zaharii Zakhariev and published by BoD – Books on Demand. This book was released on 2012-01-20 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book "Polycrystalline Materials - Theoretical and Practical Aspects" is focused on contemporary investigations of plastic deformation, strength and grain-scale approaches, methods of synthesis, structurals, properties, and application of some polycrystalline materials. It is intended for students, post-graduate students, and scientists in the field of polycrystalline materials.
Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee
Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Book Synopsis X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials by : Harold Philip Klug
Download or read book X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials written by Harold Philip Klug and published by . This book was released on 1970 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Handbook of X-Ray Analysis of Polycrystalline Materials by : Lev. I. Mirkin
Download or read book Handbook of X-Ray Analysis of Polycrystalline Materials written by Lev. I. Mirkin and published by Springer. This book was released on 1964-12 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi nation of stresses, phase analysis, and so on) is solved with the aid of the tables and nomo grams given in the second part of the book. The nomograms can be enlarged for use if necessary. This is not the only mode of use; in particular, the material in the appropriate chapter may be sufficient for a particular type of routine analysis. I have had the benefit of valuable advice from workers in various laboratories (Moscow State University, Moscow Steel Institute, the Institute of Crystallography, the Central Research Institute for Ferrous Metallurgy, the Technological Research Institute of the Automobile Industry, the Karpov Institute of Physical Chemistry, the All-Union Hard Alloys K~search Institute, and so on). In addition, I am deeply indebted for much assistance to Professor Ya. S. Umanskii (scientific editor), Professor V. I. Iveronova, Professor A. I. Kitaigorodskii, G. A. Gol'der, and V. I. Rydnik. I recognize that this work cannot be free from deficiencies, and I should like to thank in advance workers in x-ray laboratories who may offer criticisms.
Book Synopsis Physics in Industry: X-Ray Diffraction by Polycrystalline Materials by : H. S. Peiser
Download or read book Physics in Industry: X-Ray Diffraction by Polycrystalline Materials written by H. S. Peiser and published by . This book was released on 1960 with total page 725 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray Diffraction by Polycrystalline Materials. Technical Editors by : H. S. ed Peiser
Download or read book X-ray Diffraction by Polycrystalline Materials. Technical Editors written by H. S. ed Peiser and published by . This book was released on 1960 with total page 725 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-Ray Line Profile Analysis in Materials Science by : Gubicza, Jen?
Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
