X Ray And Neutron Reflectivity Principles And Applications

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X-ray and Neutron Reflectivity

Author : Jean Daillant
Publisher : Springer
ISBN 13 : 3540885889
Total Pages : 360 pages
Book Rating : 4.5/5 (48 download)

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Book Synopsis X-ray and Neutron Reflectivity by : Jean Daillant

Download or read book X-ray and Neutron Reflectivity written by Jean Daillant and published by Springer. This book was released on 2008-11-19 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .

X-Ray and Neutron Reflectivity: Principles and Applications

Author : Jean Daillant
Publisher : Springer Science & Business Media
ISBN 13 : 3540486968
Total Pages : 347 pages
Book Rating : 4.5/5 (44 download)

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Book Synopsis X-Ray and Neutron Reflectivity: Principles and Applications by : Jean Daillant

Download or read book X-Ray and Neutron Reflectivity: Principles and Applications written by Jean Daillant and published by Springer Science & Business Media. This book was released on 2003-07-01 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

X-ray and Neutron Reflectivity

Author : Jean Daillant
Publisher : Springer Science & Business Media
ISBN 13 : 3540885870
Total Pages : 360 pages
Book Rating : 4.5/5 (48 download)

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Book Synopsis X-ray and Neutron Reflectivity by : Jean Daillant

Download or read book X-ray and Neutron Reflectivity written by Jean Daillant and published by Springer Science & Business Media. This book was released on 2008-11-21 with total page 360 pages. Available in PDF, EPUB and Kindle. Book excerpt: ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .

Liquid Surfaces and Interfaces

Author : Peter S. Pershan
Publisher : Cambridge University Press
ISBN 13 : 0521814014
Total Pages : 335 pages
Book Rating : 4.5/5 (218 download)

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Book Synopsis Liquid Surfaces and Interfaces by : Peter S. Pershan

Download or read book Liquid Surfaces and Interfaces written by Peter S. Pershan and published by Cambridge University Press. This book was released on 2012-08-02 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide for graduate students and researchers on all aspects of x-ray scattering experiments on liquid surfaces and interfaces.

Neutron and X-ray Spectroscopy

Author : Françoise Hippert
Publisher : Springer Science & Business Media
ISBN 13 : 1402033370
Total Pages : 580 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Neutron and X-ray Spectroscopy by : Françoise Hippert

Download or read book Neutron and X-ray Spectroscopy written by Françoise Hippert and published by Springer Science & Business Media. This book was released on 2006-07-08 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: - Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books

Elements of Modern X-ray Physics

Author : Jens Als-Nielsen
Publisher : John Wiley & Sons
ISBN 13 : 1119970156
Total Pages : 440 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Elements of Modern X-ray Physics by : Jens Als-Nielsen

Download or read book Elements of Modern X-ray Physics written by Jens Als-Nielsen and published by John Wiley & Sons. This book was released on 2011-04-20 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: "The publication of Jens Als-Nielsen and Des McMorrow's Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation... a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics...." —Physics Today, 2002

Surface Structure Determination by LEED and X-rays

Author : Wolfgang Moritz
Publisher : Cambridge University Press
ISBN 13 : 1108418090
Total Pages : 475 pages
Book Rating : 4.1/5 (84 download)

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Book Synopsis Surface Structure Determination by LEED and X-rays by : Wolfgang Moritz

Download or read book Surface Structure Determination by LEED and X-rays written by Wolfgang Moritz and published by Cambridge University Press. This book was released on 2022-08-25 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: Discover exciting new developments and applications of LEED and X-ray diffraction, alongside detailed introductory material.

Ion Correlations at Electrified Soft Matter Interfaces

Author : Nouamane Laanait
Publisher : Springer Science & Business Media
ISBN 13 : 3319009001
Total Pages : 122 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Ion Correlations at Electrified Soft Matter Interfaces by : Nouamane Laanait

Download or read book Ion Correlations at Electrified Soft Matter Interfaces written by Nouamane Laanait and published by Springer Science & Business Media. This book was released on 2013-07-30 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ion Correlations at Electrified Soft Matter Interfaces presents an investigation that combines experiments, theory, and computer simulations to demonstrate that the interdependency between ion correlations and other ion interactions in solution can explain the distribution of ions near an electrified liquid/liquid interface. The properties of this interface are exploited to vary the coupling strength of ion-ion correlations from weak to strong while monitoring their influence on ion distributions at the nanometer scale with X-ray reflectivity and on the macroscopic scale with interfacial tension measurements. This thesis demonstrates that a parameter-free density functional theory that includes ion-ion correlations and ion-solvent interactions is in agreement with the data over the entire range of experimentally tunable correlation coupling strengths. The reported findings represent a significant advance towards understanding the nature and role of ion correlations in charged soft-matter. Ion distributions underlie many scientific phenomena and technological applications, including electrostatic interactions between charged biomolecules and the efficiency of energy storage devices. These distributions are determined by interactions dictated by the chemical properties of the ions and their environment, as well as the long-range nature of the electrostatic force. The presence of strong correlations between ions is responsible for counterintuitive effects such as like-charge attraction.

X-Ray Diffraction

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Author : Oliver H. Seeck
Publisher : CRC Press
ISBN 13 : 9814303607
Total Pages : 438 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis X-Ray Diffraction by : Oliver H. Seeck

Download or read book X-Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Metrology and Diagnostic Techniques for Nanoelectronics

Author : Zhiyong Ma
Publisher : CRC Press
ISBN 13 : 135173394X
Total Pages : 889 pages
Book Rating : 4.3/5 (517 download)

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Book Synopsis Metrology and Diagnostic Techniques for Nanoelectronics by : Zhiyong Ma

Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 889 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Multilayer Thin Films

Author : Gero Decher
Publisher : John Wiley & Sons
ISBN 13 : 3527316485
Total Pages : 1157 pages
Book Rating : 4.5/5 (273 download)

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Book Synopsis Multilayer Thin Films by : Gero Decher

Download or read book Multilayer Thin Films written by Gero Decher and published by John Wiley & Sons. This book was released on 2012-06-11 with total page 1157 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second, comprehensive edition of the pioneering book in this fi eld has been completely revised and extended, now stretching to two volumes. The result is a comprehensive summary of layer-by-layer assembled, truly hybrid nanomaterials and thin fi lms, covering organic, inorganic, colloidal, macromolecular, and biological components, as well as the assembly of nanoscale fi lms derived from them on surfaces. These two volumes are essential for anyone working in the field, as well as scientists and researchers active in materials development, who needs the key knowledge provided herein for linking the field of molecular self-assembly with the bio- and materials sciences.

Bioelectrochemistry

Author : Richard C. Alkire
Publisher : John Wiley & Sons
ISBN 13 : 3527644121
Total Pages : 411 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Bioelectrochemistry by : Richard C. Alkire

Download or read book Bioelectrochemistry written by Richard C. Alkire and published by John Wiley & Sons. This book was released on 2013-09-25 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: Bioelectrochemistry is a fast growing field at the interface between electrochemistry and other sciences such as biochemistry, analytical chemistry and medicinal chemistry. In the recent years, the methods and the understanding of the fundamentals have seen significant progress, which has led to rapid development in the field. Here, the expert editors have carefully selected contributions to best reflect the latest developments in this hot and rapidly growing interdisciplinary topic. The resulting excellent and timely overview of this multifaceted field covers recent methodological advances, as well as a range of new applications for analytical detection, drug screening, tumor therapy, and for energy conversion in biofuel cells. This book is a must-have for all Electrochemists, Biochemists, Analytical Chemists, and Medicinal Chemists.

Two-dimensional X-ray Diffraction

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Author : Bob B. He
Publisher : John Wiley & Sons
ISBN 13 : 1119356105
Total Pages : 488 pages
Book Rating : 4.1/5 (193 download)

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Book Synopsis Two-dimensional X-ray Diffraction by : Bob B. He

Download or read book Two-dimensional X-ray Diffraction written by Bob B. He and published by John Wiley & Sons. This book was released on 2018-06-26 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.

High-Resolution X-Ray Scattering

Author : Ullrich Pietsch
Publisher : Springer Science & Business Media
ISBN 13 : 1475740506
Total Pages : 410 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis High-Resolution X-Ray Scattering by : Ullrich Pietsch

Download or read book High-Resolution X-Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.

Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons

Author : Sunil K Sinha
Publisher : World Scientific
ISBN 13 : 9811231524
Total Pages : 430 pages
Book Rating : 4.8/5 (112 download)

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Book Synopsis Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons by : Sunil K Sinha

Download or read book Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons written by Sunil K Sinha and published by World Scientific. This book was released on 2021-03-23 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

Handbook of Nanophysics

Author : Klaus D. Sattler
Publisher : CRC Press
ISBN 13 : 1420075411
Total Pages : 816 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Handbook of Nanophysics by : Klaus D. Sattler

Download or read book Handbook of Nanophysics written by Klaus D. Sattler and published by CRC Press. This book was released on 2010-09-17 with total page 816 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering the key theories, tools, and techniques of this dynamic field, Handbook of Nanophysics: Principles and Methods elucidates the general theoretical principles and measurements of nanoscale systems. Each peer-reviewed chapter contains a broad-based introduction and enhances understanding of the state-of-the-art scientific content through fund

Combined Analysis

Author : Daniel Chateigner
Publisher : John Wiley & Sons
ISBN 13 : 1118622642
Total Pages : 382 pages
Book Rating : 4.1/5 (186 download)

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Book Synopsis Combined Analysis by : Daniel Chateigner

Download or read book Combined Analysis written by Daniel Chateigner and published by John Wiley & Sons. This book was released on 2013-03-04 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology.