X Ray Analysis

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X-Ray Diffraction Crystallography

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Author : Yoshio Waseda
Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda

Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Thin Film Analysis by X-Ray Scattering

Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz

Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Handbook of Practical X-Ray Fluorescence Analysis

Author : Burkhard Beckhoff
Publisher : Springer Science & Business Media
ISBN 13 : 3540367225
Total Pages : 897 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Handbook of Practical X-Ray Fluorescence Analysis by : Burkhard Beckhoff

Download or read book Handbook of Practical X-Ray Fluorescence Analysis written by Burkhard Beckhoff and published by Springer Science & Business Media. This book was released on 2007-05-18 with total page 897 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

X-Ray Line Profile Analysis in Materials Science

Author : Gubicza, Jen?
Publisher : IGI Global
ISBN 13 : 1466658533
Total Pages : 359 pages
Book Rating : 4.4/5 (666 download)

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Book Synopsis X-Ray Line Profile Analysis in Materials Science by : Gubicza, Jen?

Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Principles and Practice of X-Ray Spectrometric Analysis

Author : E.P. Bertin
Publisher : Springer Science & Business Media
ISBN 13 : 1461344166
Total Pages : 1098 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Principles and Practice of X-Ray Spectrometric Analysis by : E.P. Bertin

Download or read book Principles and Practice of X-Ray Spectrometric Analysis written by E.P. Bertin and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.

X-Ray Diffraction

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Author : C. Suryanarayana
Publisher : Springer Science & Business Media
ISBN 13 : 1489901485
Total Pages : 275 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis X-Ray Diffraction by : C. Suryanarayana

Download or read book X-Ray Diffraction written by C. Suryanarayana and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.

X-Ray Diffraction for Materials Research

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Author : Myeongkyu Lee
Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.3/5 (153 download)

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Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee

Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Modern X-Ray Analysis on Single Crystals

Author : Peter Luger
Publisher : Walter de Gruyter
ISBN 13 : 3110370611
Total Pages : 370 pages
Book Rating : 4.1/5 (13 download)

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Book Synopsis Modern X-Ray Analysis on Single Crystals by : Peter Luger

Download or read book Modern X-Ray Analysis on Single Crystals written by Peter Luger and published by Walter de Gruyter. This book was released on 2014-04-01 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: An excellent book for professional crystallographers! In 2012 the crystallographic community celebrated 100 years of X-ray diffraction in honour of the pioneering experiment in 1912 by Max von Laue, Friedrich and Knipping. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. This completely revised edition is a guide for practical work in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Emphasis is placed on understanding results and avoiding pitfalls. Essential reading for researchers from the student to the professional level interested in understanding the structure of molecules.

X-ray Analysis and the Structure of Organic Molecules

Author : Jack D. Dunitz
Publisher : Wiley-VCH
ISBN 13 :
Total Pages : 520 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis X-ray Analysis and the Structure of Organic Molecules by : Jack D. Dunitz

Download or read book X-ray Analysis and the Structure of Organic Molecules written by Jack D. Dunitz and published by Wiley-VCH. This book was released on 1995 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second corrected reprint of â2X-Ray Analysisâ2, published in 1979 and consists of two parts. Part one is about Crystal Structure Analysis, part two deals with Molecular Structure. All the information in this volume is of considerable value especially to those engaged in, or about to embark upon, X-ray crystal structure analysis.

Fundamentals of Energy Dispersive X-Ray Analysis

Author : John C. Russ
Publisher : Butterworth-Heinemann
ISBN 13 : 1483164004
Total Pages : 315 pages
Book Rating : 4.4/5 (831 download)

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Book Synopsis Fundamentals of Energy Dispersive X-Ray Analysis by : John C. Russ

Download or read book Fundamentals of Energy Dispersive X-Ray Analysis written by John C. Russ and published by Butterworth-Heinemann. This book was released on 2013-10-22 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Structure Analysis by Small-Angle X-Ray and Neutron Scattering

Author : L.A. Feigin
Publisher : Springer Science & Business Media
ISBN 13 : 1475766246
Total Pages : 339 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Structure Analysis by Small-Angle X-Ray and Neutron Scattering by : L.A. Feigin

Download or read book Structure Analysis by Small-Angle X-Ray and Neutron Scattering written by L.A. Feigin and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 339 pages. Available in PDF, EPUB and Kindle. Book excerpt: Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.

Introduction to X-Ray Spectrometric Analysis

Author : Eugene P. Bertin
Publisher : Springer Science & Business Media
ISBN 13 : 1489922040
Total Pages : 494 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Introduction to X-Ray Spectrometric Analysis by : Eugene P. Bertin

Download or read book Introduction to X-Ray Spectrometric Analysis written by Eugene P. Bertin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu facturers; the one- or two-week summer courses offered by a few uni versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin ner's level, this material is distributed throughout a mass of detail and more advanced material.

Three-Dimensional X-Ray Diffraction Microscopy

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Author : Henning Friis Poulsen
Publisher : Springer Science & Business Media
ISBN 13 : 9783540223306
Total Pages : 176 pages
Book Rating : 4.2/5 (233 download)

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Book Synopsis Three-Dimensional X-Ray Diffraction Microscopy by : Henning Friis Poulsen

Download or read book Three-Dimensional X-Ray Diffraction Microscopy written by Henning Friis Poulsen and published by Springer Science & Business Media. This book was released on 2004-08-31 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

X-Ray Diffraction

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Author : B. E. Warren
Publisher : Courier Corporation
ISBN 13 : 0486141616
Total Pages : 402 pages
Book Rating : 4.4/5 (861 download)

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Book Synopsis X-Ray Diffraction by : B. E. Warren

Download or read book X-Ray Diffraction written by B. E. Warren and published by Courier Corporation. This book was released on 2012-05-23 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.

The Development of X-ray Analysis

Author : Lawrence Bragg
Publisher :
ISBN 13 : 9780486673165
Total Pages : 270 pages
Book Rating : 4.6/5 (731 download)

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Book Synopsis The Development of X-ray Analysis by : Lawrence Bragg

Download or read book The Development of X-ray Analysis written by Lawrence Bragg and published by . This book was released on 1975 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reprint of the G. Bell and Sons (London) edition of 1975 with a new foreword (part of a page) by Bragg. The classic work is here printed on permanent paper. Annotation copyright by Book News, Inc., Portland, OR

Structure Determination by X-Ray Crystallography

Author : M. F. C. Ladd
Publisher : Springer Science & Business Media
ISBN 13 : 1461579333
Total Pages : 404 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Structure Determination by X-Ray Crystallography by : M. F. C. Ladd

Download or read book Structure Determination by X-Ray Crystallography written by M. F. C. Ladd and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.

Two-dimensional X-ray Diffraction

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Author : Bob B. He
Publisher : John Wiley & Sons
ISBN 13 : 1119356067
Total Pages : 492 pages
Book Rating : 4.1/5 (193 download)

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Book Synopsis Two-dimensional X-ray Diffraction by : Bob B. He

Download or read book Two-dimensional X-ray Diffraction written by Bob B. He and published by John Wiley & Sons. This book was released on 2018-05-18 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.