Variation Aware Advanced Cmos Devices And Sram

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Variation-Aware Advanced CMOS Devices and SRAM

Author : Changhwan Shin
Publisher : Springer
ISBN 13 : 9401775974
Total Pages : 141 pages
Book Rating : 4.4/5 (17 download)

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Book Synopsis Variation-Aware Advanced CMOS Devices and SRAM by : Changhwan Shin

Download or read book Variation-Aware Advanced CMOS Devices and SRAM written by Changhwan Shin and published by Springer. This book was released on 2016-06-06 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications of novel CMOS devices to cache memory (or Static Random Access Memory, SRAM). The author places emphasis on the physical understanding of process-induced random variation as well as the introduction of novel CMOS device structures and their application to SRAM. The book outlines the technical predicament facing state-of-the-art CMOS technology development, due to the effect of ever-increasing process-induced random/intrinsic variation in transistor performance at the sub-30-nm technology nodes. Therefore, the physical understanding of process-induced random/intrinsic variations and the technical solutions to address these issues plays a key role in new CMOS technology development. This book aims to provide the reader with a deep understanding of the major random variation sources, and the characterization of each random variation source. Furthermore, the book presents various CMOS device designs to surmount the random variation in future CMOS technology, emphasizing the applications to SRAM.

Timing Performance of Nanometer Digital Circuits Under Process Variations

Author : Victor Champac
Publisher : Springer
ISBN 13 : 3319754653
Total Pages : 195 pages
Book Rating : 4.3/5 (197 download)

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Book Synopsis Timing Performance of Nanometer Digital Circuits Under Process Variations by : Victor Champac

Download or read book Timing Performance of Nanometer Digital Circuits Under Process Variations written by Victor Champac and published by Springer. This book was released on 2018-04-18 with total page 195 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

Nanoscale Devices

Author : Brajesh Kumar Kaushik
Publisher : CRC Press
ISBN 13 : 1351670212
Total Pages : 414 pages
Book Rating : 4.3/5 (516 download)

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Book Synopsis Nanoscale Devices by : Brajesh Kumar Kaushik

Download or read book Nanoscale Devices written by Brajesh Kumar Kaushik and published by CRC Press. This book was released on 2018-11-16 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt: The primary aim of this book is to discuss various aspects of nanoscale device design and their applications including transport mechanism, modeling, and circuit applications. . Provides a platform for modeling and analysis of state-of-the-art devices in nanoscale regime, reviews issues related to optimizing the sub-nanometer device performance and addresses simulation aspect and/or fabrication process of devices Also, includes design problems at the end of each chapter

Cybernetics and Mathematics Applications in Intelligent Systems

Author : Radek Silhavy
Publisher : Springer
ISBN 13 : 3319572644
Total Pages : 458 pages
Book Rating : 4.3/5 (195 download)

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Book Synopsis Cybernetics and Mathematics Applications in Intelligent Systems by : Radek Silhavy

Download or read book Cybernetics and Mathematics Applications in Intelligent Systems written by Radek Silhavy and published by Springer. This book was released on 2017-04-07 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents new methods for and approaches to real-world problems as well as exploratory research describing novel mathematics and cybernetics applications in intelligent systems. It focuses on modern trends in selected fields of technological systems and automation control theory. It also introduces new algorithms, methods and applications of intelligent systems in automation, technological and industrial applications. This book constitutes the refereed proceedings of the Cybernetics and Mathematics Applications in Intelligent Systems Section of the 6th Computer Science On-line Conference 2017 (CSOC 2017), held in April 2017.

Advances in Smart Communication Technology and Information Processing

Author : Soumen Banerjee
Publisher : Springer Nature
ISBN 13 : 9811594333
Total Pages : 484 pages
Book Rating : 4.8/5 (115 download)

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Book Synopsis Advances in Smart Communication Technology and Information Processing by : Soumen Banerjee

Download or read book Advances in Smart Communication Technology and Information Processing written by Soumen Banerjee and published by Springer Nature. This book was released on 2021-02-15 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a collection of best selected research papers presented at the 6th International Conference on Opto-Electronics and Applied Optics (OPTRONIX 2020) organized by the University of Engineering & Management, Kolkata, India, in June 2020. The primary focus is to address issues and developments in optoelectronics with particular emphasis on communication technology, IoT and intelligent systems, information processing and its different kinds. The theme of the book is in alignment with the theme of the conference “Advances in Smart Communication Technology and Information Processing.” The purpose of this book is to inform the scientists and researchers of this field in India and abroad about the latest developments in the relevant field and to raise awareness among the academic fraternity to get them involved in different activities in the years ahead – an effort to realize knowledge-based society.

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

Author : ASM International
Publisher : ASM International
ISBN 13 : 1627080996
Total Pages : 593 pages
Book Rating : 4.6/5 (27 download)

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Book Synopsis ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis by : ASM International

Download or read book ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2018-12-01 with total page 593 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

Comprehensive Nanoscience and Nanotechnology

Author :
Publisher : Academic Press
ISBN 13 : 012812296X
Total Pages : 1881 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Comprehensive Nanoscience and Nanotechnology by :

Download or read book Comprehensive Nanoscience and Nanotechnology written by and published by Academic Press. This book was released on 2019-01-02 with total page 1881 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive Nanoscience and Technology, Second Edition, Five Volume Set allows researchers to navigate a very diverse, interdisciplinary and rapidly-changing field with up-to-date, comprehensive and authoritative coverage of every aspect of modern nanoscience and nanotechnology. Presents new chapters on the latest developments in the field Covers topics not discussed to this degree of detail in other works, such as biological devices and applications of nanotechnology Compiled and written by top international authorities in the field

Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies

Author : Michael Fulde
Publisher : Springer Science & Business Media
ISBN 13 : 9048132800
Total Pages : 131 pages
Book Rating : 4.0/5 (481 download)

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Book Synopsis Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies by : Michael Fulde

Download or read book Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies written by Michael Fulde and published by Springer Science & Business Media. This book was released on 2009-10-27 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and device concepts. Multi-gate devices employing high-k gate dielectrics are considered as promising solution overcoming these scaling limitations of conventional planar bulk CMOS. Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies provides a technology oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies.

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Author : Bhupendra Singh Reniwal
Publisher : CRC Press
ISBN 13 : 1000985156
Total Pages : 213 pages
Book Rating : 4.0/5 (9 download)

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Book Synopsis Energy Efficient and Reliable Embedded Nanoscale SRAM Design by : Bhupendra Singh Reniwal

Download or read book Energy Efficient and Reliable Embedded Nanoscale SRAM Design written by Bhupendra Singh Reniwal and published by CRC Press. This book was released on 2023-11-30 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.

Integrated Devices for Artificial Intelligence and VLSI

Author : Balwinder Raj
Publisher : John Wiley & Sons
ISBN 13 : 1394205139
Total Pages : 388 pages
Book Rating : 4.3/5 (942 download)

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Book Synopsis Integrated Devices for Artificial Intelligence and VLSI by : Balwinder Raj

Download or read book Integrated Devices for Artificial Intelligence and VLSI written by Balwinder Raj and published by John Wiley & Sons. This book was released on 2024-08-01 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: With its in-depth exploration of the close connection between microelectronics, AI, and VLSI technology, this book offers valuable insights into the cutting-edge techniques and tools used in VLSI design automation, making it an essential resource for anyone seeking to stay ahead in the rapidly evolving field of VLSI design. Very large-scale integration (VLSI) is the inter-disciplinary science of utilizing advanced semiconductor technology to create various functions of computer system. This book addresses the close link of microelectronics and artificial intelligence (AI). By combining VLSI technology, a very powerful computer architecture confinement is possible. To overcome problems at different design stages, researchers introduced artificial intelligent (AI) techniques in VLSI design automation. AI techniques, such as knowledge-based and expert systems, first try to define the problem and then choose the best solution from the domain of possible solutions. These days, several CAD technologies, such as Synopsys and Mentor Graphics, are specifically created to increase the automation of VLSI design. When a task is completed using the appropriate tool, each stage of the task design produces outcomes that are more productive than typical. However, combining all of these tools into a single package offer has drawbacks. We can’t really use every outlook without sacrificing the efficiency and usefulness of our output. The researchers decided to include AI approaches into VLSI design automation in order to get around these obstacles. AI is one of the fastest growing tools in the world of technology and innovation that helps to make computers more reliable and easy to use. Artificial Intelligence in VLSI design has provided high-end and more feasible solutions to the difficulties faced by the VLSI industry. Physical design, RTL design, STA, etc. are some of the most in-demand courses to enter the VLSI industry. These courses help develop a better understanding of the many tools like Synopsis. With each new dawn, artificial intelligence in VLSI design is continually evolving, and new opportunities are being investigated.

Nanoscale VLSI

Author : Rohit Dhiman
Publisher : Springer Nature
ISBN 13 : 9811579377
Total Pages : 319 pages
Book Rating : 4.8/5 (115 download)

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Book Synopsis Nanoscale VLSI by : Rohit Dhiman

Download or read book Nanoscale VLSI written by Rohit Dhiman and published by Springer Nature. This book was released on 2020-10-03 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes methodologies in the design of VLSI devices, circuits and their applications at nanoscale levels. The book begins with the discussion on the dominant role of power dissipation in highly scaled devices.The 15 Chapters of the book are classified under four sections that cover design, modeling, and simulation of electronic, magnetic and compound semiconductors for their applications in VLSI devices, circuits, and systems. This comprehensive volume eloquently presents the design methodologies for ultra–low power VLSI design, potential post–CMOS devices, and their applications from the architectural and system perspectives. The book shall serve as an invaluable reference book for the graduate students, Ph.D./ M.S./ M.Tech. Scholars, researchers, and practicing engineers working in the frontier areas of nanoscale VLSI design.

Stochastic Process Variation in Deep-Submicron CMOS

Author : Amir Zjajo
Publisher : Springer Science & Business Media
ISBN 13 : 9400777817
Total Pages : 207 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Stochastic Process Variation in Deep-Submicron CMOS by : Amir Zjajo

Download or read book Stochastic Process Variation in Deep-Submicron CMOS written by Amir Zjajo and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.

Compact Models for Integrated Circuit Design

Author : Samar K. Saha
Publisher : CRC Press
ISBN 13 : 1351831070
Total Pages : 385 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Compact Models for Integrated Circuit Design by : Samar K. Saha

Download or read book Compact Models for Integrated Circuit Design written by Samar K. Saha and published by CRC Press. This book was released on 2018-09-03 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond provides a modern treatise on compact models for circuit computer-aided design (CAD). Written by an author with more than 25 years of industry experience in semiconductor processes, devices, and circuit CAD, and more than 10 years of academic experience in teaching compact modeling courses, this first-of-its-kind book on compact SPICE models for very-large-scale-integrated (VLSI) chip design offers a balanced presentation of compact modeling crucial for addressing current modeling challenges and understanding new models for emerging devices. Starting from basic semiconductor physics and covering state-of-the-art device regimes from conventional micron to nanometer, this text: Presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models Discusses the major issue of process variability, which severely impacts device and circuit performance in advanced technologies and requires statistical compact models Promotes further research of the evolution and development of compact models for VLSI circuit design and analysis Supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices Includes exercise problems at the end of each chapter and extensive references at the end of the book Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond is intended for senior undergraduate and graduate courses in electrical and electronics engineering as well as for researchers and practitioners working in the area of electron devices. However, even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts from this book.

Power-Aware Testing and Test Strategies for Low Power Devices

Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Power-Aware Testing and Test Strategies for Low Power Devices by : Patrick Girard

Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Low-Power Variation-Tolerant Design in Nanometer Silicon

Author : Swarup Bhunia
Publisher : Springer Science & Business Media
ISBN 13 : 1441974180
Total Pages : 444 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Low-Power Variation-Tolerant Design in Nanometer Silicon by : Swarup Bhunia

Download or read book Low-Power Variation-Tolerant Design in Nanometer Silicon written by Swarup Bhunia and published by Springer Science & Business Media. This book was released on 2010-11-10 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Advanced MOS Devices and their Circuit Applications

Author : Ankur Beohar
Publisher : CRC Press
ISBN 13 : 1003831125
Total Pages : 161 pages
Book Rating : 4.0/5 (38 download)

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Book Synopsis Advanced MOS Devices and their Circuit Applications by : Ankur Beohar

Download or read book Advanced MOS Devices and their Circuit Applications written by Ankur Beohar and published by CRC Press. This book was released on 2024-01-08 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text comprehensively discusses the advanced MOS devices and their circuit applications with reliability concerns. Further, an energy-efficient Tunnel FET-based circuit application will be investigated in terms of the output voltage, power efficiency, energy consumption, and performances using the device circuit co-design approach. The book: Discusses advanced MOS devices and their circuit design for energy- efficient systems on chips (SoCs) Covers MOS devices, materials, and related semiconductor transistor technologies for the next-generation ultra-low-power applications Examines the use of field-effect transistors for biosensing circuit applications and covers reliability design considerations and compact modeling of advanced low-power MOS transistors Includes research problem statements with specifications and commercially available industry data in the appendix Presents Verilog-A model-based simulations for circuit analysis The volume provides detailed discussions of DC and analog/RF characteristics, effects of trap-assisted tunneling (TAT) for reliability analysis, spacer-underlap engineering methodology, doping profile analysis, and work-function techniques. It further covers novel MOS devices including FinFET, Graphene field-effect transistor, Tunnel FETS, and Flash memory devices. It will serve as an ideal design book for senior undergraduate students, graduate students, and academic researchers in the fields including electrical engineering, electronics and communication engineering, computer engineering, materials science, nanoscience, and nanotechnology.

VLSI-SoC: Advanced Topics on Systems on a Chip

Author : Ricardo Reis
Publisher : Springer
ISBN 13 : 0387895582
Total Pages : 315 pages
Book Rating : 4.3/5 (878 download)

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Book Synopsis VLSI-SoC: Advanced Topics on Systems on a Chip by : Ricardo Reis

Download or read book VLSI-SoC: Advanced Topics on Systems on a Chip written by Ricardo Reis and published by Springer. This book was released on 2009-04-05 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.