The Influence of Clamping and Residual Stress on Scaling Effects in Pb(Zr0.3Ti0.7)O3 Thin Films for PiezoMEMS Applications

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Book Synopsis The Influence of Clamping and Residual Stress on Scaling Effects in Pb(Zr0.3Ti0.7)O3 Thin Films for PiezoMEMS Applications by : Lyndsey Denis

Download or read book The Influence of Clamping and Residual Stress on Scaling Effects in Pb(Zr0.3Ti0.7)O3 Thin Films for PiezoMEMS Applications written by Lyndsey Denis and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Ferroelectric thin films such as lead zirconate titanate (PZT) have high dielectric and piezoelectric properties which can be utilized in actuators, sensors, transducers, and energy harvesters in microelectromechanical systems (MEMS). A small film thickness enables low voltage operation of such devices; however, property degradation limits the extent that the film thickness can be reduced while maintaining performance. This dissertation describes the impact that different electrical and mechanical boundary conditions have on the dielectric properties of PZT thin films for a variety of thicknesses (ranging from 0.27 to 1.11 m). Specifically, variations in elastic layer thickness, substrate clamping, residual stress and domain state were investigated. A novel approach to quantitatively deconstruct the relative permittivity into three contributions (intrinsic, reversible extrinsic and irreversible extrinsic) was developed using a combination of X-ray diffraction and Rayleigh analysis. This work aims to determine which factors are associated with scaling effects in tetragonal {001} textured Pb0.99(Zr0.3Ti0.7)0.98Nb0.02O3 (PZT 30/70) thin films.It is generally accepted that scaling effects play a key role in the suppression of ferroelectric responses in thin films (

Residual Stress Development and Effect on the Piezoelectric Performance of Sol -Gel Derived Lead Zirconate Titanate (Pzt) Thin Films

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Book Synopsis Residual Stress Development and Effect on the Piezoelectric Performance of Sol -Gel Derived Lead Zirconate Titanate (Pzt) Thin Films by :

Download or read book Residual Stress Development and Effect on the Piezoelectric Performance of Sol -Gel Derived Lead Zirconate Titanate (Pzt) Thin Films written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Influence of Solute Additions on Intrinsic Stress in Thin Films

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ISBN 13 :
Total Pages : 300 pages
Book Rating : 4.:/5 (131 download)

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Book Synopsis The Influence of Solute Additions on Intrinsic Stress in Thin Films by : Tyler Kaub

Download or read book The Influence of Solute Additions on Intrinsic Stress in Thin Films written by Tyler Kaub and published by . This book was released on 2018 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt: During physical vapor deposition of thin films, strong intrinsic stresses develop during film growth. These stresses along with the film microstructure are typically controlled through altering the film's processing conditions. A possible technique to predict how processing influences film stress uses a proposed kinetic model for thin film stress evolution, where contributions to the total stress of the film from individual mechanisms can be elucidated. To determine the application space of the model a series of Cu films was sputter deposited under various deposition conditions to fit the intrinsic stress measurements to the model. Pressure and growth rate stress dependence emerged, which fit well with the model predictions. Expanding upon elemental Cu the influence of a solute additions on the intrinsic stress evolution was examined. Utilizing the Cu(Ni) system as the first case study revealed small Ni additions of 5 at. % resulted in increased compressive stress with further Ni additions showing a reduction in the compressive stress. Noting the stress dependence on solute additions two strongly segregating systems Cu(Ag) and Cu(V) were deposited under similar processing parameters to explore the effect of solute mobility on stress. The addition of Ag, the high atomic mobility solute, or V the low atomic mobility solute, both resulted in the alloy films undergoing grain refinement that scaled with solute content. This grain refinement was attributed to solute segregation and was associated with increased tensile stresses in both systems. Noting the role of solutes on stress in these Cu based alloy systems, further study in another alloy system was conducted to determine if similar mechanisms are present. Using W(Ti) the addition of Ti was observed to reduce the compressive stress of W. Upon examination of the microstructure, Ti additions did not alter the film's grain size, but increased the fraction of low angle grain boundaries. Collectively, these studies demonstrate solute additions can be used to control the residual stresses, specific grain boundary formations, grain sizes and phase transformations in thin films. This indicates that solutes can be used as another processing tool to tune a thin film to the desired microstructure and stress state.

Measurement of Residual Stress in Thin Films

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Total Pages : 94 pages
Book Rating : 4.:/5 (613 download)

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Book Synopsis Measurement of Residual Stress in Thin Films by : Gaelle Teresa Belot

Download or read book Measurement of Residual Stress in Thin Films written by Gaelle Teresa Belot and published by . This book was released on 2005 with total page 94 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Microstructural and Residual Stress Development in Thin Films

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Total Pages : 62 pages
Book Rating : 4.:/5 (698 download)

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Book Synopsis Microstructural and Residual Stress Development in Thin Films by : David Regniet

Download or read book Microstructural and Residual Stress Development in Thin Films written by David Regniet and published by . This book was released on 2009 with total page 62 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Residual Stresses in MEMS Thin Films

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ISBN 13 :
Total Pages : 320 pages
Book Rating : 4.:/5 (47 download)

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Book Synopsis Residual Stresses in MEMS Thin Films by : Xin Zhang

Download or read book Residual Stresses in MEMS Thin Films written by Xin Zhang and published by . This book was released on 1998 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Technologia, Właściwości i Zastosowania Cienkich Warstw PZT

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ISBN 13 : 9788322611845
Total Pages : 166 pages
Book Rating : 4.6/5 (118 download)

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Book Synopsis Technologia, Właściwości i Zastosowania Cienkich Warstw PZT by : Dionizy Czekaj

Download or read book Technologia, Właściwości i Zastosowania Cienkich Warstw PZT written by Dionizy Czekaj and published by . This book was released on 2002 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt: