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Test Et Conception De Circuits Integres Digitaux
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Book Synopsis Test et conception de circuits integres digitaux : du niveau comportemental au niveau transferts de registres by : Ricardo Pires
Download or read book Test et conception de circuits integres digitaux : du niveau comportemental au niveau transferts de registres written by Ricardo Pires and published by . This book was released on 1998 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Test et conception de circuits intégrés digitaux by : Ricardo Pires
Download or read book Test et conception de circuits intégrés digitaux written by Ricardo Pires and published by . This book was released on 1998 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: CETTE THESE A COMME SUJET LA PRISE EN COMPTE DU CRITERE DE TESTABILITE PENDANT LA SYNTHESE D'ARCHITECTURES DE CIRCUITS INTEGRES NUMERIQUES. UNE METHODE DE SYNTHESE D'ARCHITECTURES EN VUE DU TEST EST DEVELOPPEE. ELLE CONSISTE D'ABORD A SYNTHETISER DES CHEMINS DE DONNEES TOUT EN MINIMISANT LEUR NOMBRE DE FAUTES NON-TESTABLES. POUR CE FAIRE, LES PROBLEMES DE TESTABILITE DES CHEMINS DE DONNEES SONT IDENTIFIES PAR UNE METHODE D'ANALYSE DE TESTABILITE QUE NOUS AVONS DEVELOPPEE ET ILS SONT REGLES PENDANT L'ALLOCATION DE REGISTRES. ENSUITE, NOUS ETUDIONS LE PROBLEME DE LA TESTABILITE D'UN CHEMIN DE DONNEES LORSQU'IL EST CONNECTE AU CONTROLEUR. NOUS AVONS DEVELOPPE UNE METHODE DE MODIFICATION DU CONTROLEUR DE FACON A MAINTENIR LE CHEMIN DE DONNEES TRES TESTABLE.
Book Synopsis Circuits integres digitaux : outils de conception et test integre by : Christian Dufaza
Download or read book Circuits integres digitaux : outils de conception et test integre written by Christian Dufaza and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Digital Circuit Testing by : Francis C. Wong
Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Book Synopsis Test des circuits intégrés numériques by :
Download or read book Test des circuits intégrés numériques written by and published by Ed. Techniques Ingénieur. This book was released on with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Digital Integrated Circuits by : Evgeni Perelroyzen
Download or read book Digital Integrated Circuits written by Evgeni Perelroyzen and published by CRC Press. This book was released on 2006-11-02 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: A current trend in digital design-the integration of the MATLAB® components Simulink® and Stateflow® for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, for better system results. Digital Integrated Circuits: Design-for-Test Using Simulink® and Stateflow® illustrates the construction of Simulink models for digital project test benches in certain design-for-test fields. The first two chapters of the book describe the major tools used for design-for-test. The author explains the process of Simulink model building, presents the main library blocks of Simulink, and examines the development of finite-state machine modeling using Stateflow diagrams. Subsequent chapters provide examples of Simulink modeling and simulation for the latest design-for-test fields, including combinational and sequential circuits, controllability, and observability; deterministic algorithms; digital circuit dynamics; timing verification; built-in self-test (BIST) architecture; scan cell operations; and functional and diagnostic testing. The book also discusses the automatic test pattern generation (ATPG) process, the logical determinant theory, and joint test action group (JTAG) interface models. Digital Integrated Circuits explores the possibilities of MATLAB's tools in the development of application-specific integrated circuit (ASIC) design systems. The book shows how to incorporate Simulink and Stateflow into the process of modern digital design.
Book Synopsis Random Testing of Digital Circuits by : Rene David
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Book Synopsis Circuits intégrés digitaux by : Christian Dufaza
Download or read book Circuits intégrés digitaux written by Christian Dufaza and published by . This book was released on 1989 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: LA SYNTHESE D'UNE EXPERIENCE PRATIQUE DU COMPILATEUR DE SILICIUM SOLO2000 (ES2) EST ICI PRESENTEE PAR LA REALISATION EFFECTIVE D'UN CIRCUIT SPECIFIQUE DE COMMUNICATION FIPART. UNE FOIS L'ARCHITECTURE DE CE CIRCUIT ETABLIE, NOUS AVONS PU EVALUER LE LOGICIEL DE CONCEPTION ET L'ADAPTER PLUS PARTICULIEREMENT A LA RESOLUTION DES PROBLEMES DE TEST. UNE ETUDE COMPLEMENTAIRE DES MODES DE TEST INTEGRE APPROPRIES A FIPART NOUS A AMENE A PRESENTER TROIS TECHNIQUES DE GENERATION DE VECTEURS DETERMINISTES BASEES SUR LA THEORIE DES CIRCUITS SEQUENTIELS LINEAIRES
Author :Jose Luis Huertas Díaz Publisher :Springer Science & Business Media ISBN 13 :0387235213 Total Pages :310 pages Book Rating :4.3/5 (872 download)
Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz
Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Book Synopsis Digital Circuit Testing and Testability by : Parag K. Lala
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer. This book was released on 2013-04-07 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Book Synopsis Conception en vue du test pour circuits integres analogiques et mixtes by : Florence Azais
Download or read book Conception en vue du test pour circuits integres analogiques et mixtes written by Florence Azais and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Etude des différentes techniques de conception de test pour les circuits intégrés by : Christophe ECOLAN
Download or read book Etude des différentes techniques de conception de test pour les circuits intégrés written by Christophe ECOLAN and published by . This book was released on 1993 with total page 123 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Techniques avancées de test de circuits analogiques et mixtes analogiques/numériques by : Vladimir Kolarik
Download or read book Techniques avancées de test de circuits analogiques et mixtes analogiques/numériques written by Vladimir Kolarik and published by . This book was released on 1994 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt: LE TEST DE CIRCUITS INTEGRES DEVIENT DE PLUS EN PLUS COMPLIQUE AVEC LE NIVEAU CROISSANT D'INTEGRATION. LES TECHNIQUES DE CONCEPTION EN VUE DE LA TESTABILITE DOIVENT ETRE ADOPTEES TRES TOT DANS LE CYCLE DE LA CONCEPTION DE CIRCUITS NUMERIQUES. DES PROBLEMES SIMILAIRES EXISTENT DANS LE DOMAINE DE CIRCUITS ANALOGIQUES ET MIXTES ANALOGIQUES-NUMERIQUES. LE DEVELOPPEMENT DE SYSTEMES TESTABLES DOIT ETRE EFFECTUE AVEC DES PRECAUTIONS VIS-A-VIS DES PROBLEMES DE TEST. LA PREMIERE PARTIE DE CE DOCUMENT PORTE SUR LES METHODES DE TEST HORS LIGNE POUR LES CIRCUITS ANALOGIQUES ET MIXTES ANALOGIQUES-NUMERIQUES. UN RESUME DES METHODES DE TEST ET DES TECHNIQUES DE CONCEPTION EN VUE DE LA TESTABILITE SONT PRESENTES. UNE METHODE PARTICULIERE POUR LA PROPAGATION DE SIGNAL A TRAVERS DES CIRCUITS ANALOGIQUES A ETE MISE EN UVRE. LA DEUXIEME PARTIE DE LA THESE EST CONSACREE AUX METHODES DE TEST EN LIGNE. APRES UNE PRESENTATION DE LA THEORIE DES CIRCUITS AUTO-TESTABLES EN LIGNE, UNE METHODE DE CONCEPTION EST PROPOSEE POUR DES CIRCUITS EQUILIBRES TESTABLES EN LIGNE. DEUX EXEMPLES DE CONCEPTION CONCLUENT LA DEUXIEME PARTIE: UN ECHANTILLONNEUR-BLOQUEUR TESTABLE EN LIGNE ET DES CONTROLEURS AUTO-VERIFIES
Book Synopsis Test Et Diagnostic de Circuits Intégrés Programmables by : Raoul Velazco
Download or read book Test Et Diagnostic de Circuits Intégrés Programmables written by Raoul Velazco and published by . This book was released on 1990 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: Les circuits intégrés programmables, tels que microprocesseurs, microcontrôleurs et coprocesseurs, sont parmi les composants les plus complexes et se trouvent au coeur de la plupart d'applications de l'électronique digitale. Quelle que soit la nature de l'application (commerciale, industrielle, scientifique, militaire) à laquelle est destiné un composant, des contraintes de sûreté de fonctionnement et/ou économiques en exigent une très grande qualité. Des tests minutieux doivent donc être réalisés, pour garantir l'absence d'anomalies qui pourraient être introduites aux différentes étapes de la vie d'un tel composant (conception, production, utilisation). Parmi ces tests, les tests dits logiques (vérification de la fonction logique réalisée par le circuit) posent des problèmes critiques. L'objet du travail présenté ici a été d'apporter une solution globale au problème de test logique de circuits intégrés programmables sous la forme d'une méthode et d'un ensemble d'outils spécifiques : le générateur de programmes de test GAPT, les testeurs fonctionnels FUTE 8, TEMAC et FUTE 16. L'expérimentation sur divers circuits que ce soit en collaboration avec des concepteurs (validation de conception), des fabricants (aide à la localisation de défauts) ou des utilisateurs (test, diagnostic, qualification de circuits pour des environnements sévères) a permis de valider l'approche et les outils
Book Synopsis Test des circuits intégrés numériques - Conception orientée testabilité by : Leveugle
Download or read book Test des circuits intégrés numériques - Conception orientée testabilité written by Leveugle and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Conception en vue du test pour circuits integres analogiques et mixtes by : Florence Azais (physicienne).)
Download or read book Conception en vue du test pour circuits integres analogiques et mixtes written by Florence Azais (physicienne).) and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
