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Surface And Interface Characterization By Electron Optical Methods
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Book Synopsis Surface and Interface Characterization by Electron Optical Methods by : Ugo Valdre
Download or read book Surface and Interface Characterization by Electron Optical Methods written by Ugo Valdre and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.
Book Synopsis Handbook of Surface and Interface Analysis by : John C. Riviere
Download or read book Handbook of Surface and Interface Analysis written by John C. Riviere and published by CRC Press. This book was released on 2009-06-24 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Book Synopsis Surfaces and Interfaces of Solids by : Hans Lüth
Download or read book Surfaces and Interfaces of Solids written by Hans Lüth and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 497 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Surfaces and Interfaces of Solids" emphasizes both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties ofinterfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductorinterfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.
Book Synopsis Surfaces and Interfaces of Solid Materials by : Hans Lüth
Download or read book Surfaces and Interfaces of Solid Materials written by Hans Lüth and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surfaces and Interfaces of Solid Materials emphasises both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties of interfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductor interfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.
Book Synopsis The Handbook of Surface Imaging and Visualization by : Arthur T. Hubbard
Download or read book The Handbook of Surface Imaging and Visualization written by Arthur T. Hubbard and published by CRC Press. This book was released on 1995-08-31 with total page 950 pages. Available in PDF, EPUB and Kindle. Book excerpt: This exciting new handbook investigates the characterization of surfaces. It emphasizes experimental techniques for imaging of solid surfaces and theoretical strategies for visualization of surfaces, areas in which rapid progress is currently being made. This comprehensive, unique volume is the ideal reference for researchers needing quick access to the latest developments in the field and an excellent introduction to students who want to acquaint themselves with the behavior of electrons, atoms, molecules, and thin-films at surfaces. It's all here, under one cover! The Handbook of Surface Imaging and Visualization is filled with sixty-four of the most powerful techniques for characterization of surfaces and interfaces in the material sciences, medicine, biology, geology, chemistry, and physics. Each discussion is easy to understand, succinct, yet incredibly informative. Data illustrate present research in each area of study. A wide variety of the latest experimental and theoretical approaches are included with both practical and fundamental objectives in mind. Key references are included for the reader's convenience for locating the most recent and useful work on each topic. Readers are encouraged to contact the authors or consult the references for additional information. This is the best ready reference available today. It is a perfect source book or supplemental text on the subject.
Book Synopsis Surface Analysis Methods in Materials Science by : D.J. O'Connor
Download or read book Surface Analysis Methods in Materials Science written by D.J. O'Connor and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt: This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Book Synopsis Characterization of Solid Surfaces by : Philip F. Kane
Download or read book Characterization of Solid Surfaces written by Philip F. Kane and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 675 pages. Available in PDF, EPUB and Kindle. Book excerpt: Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Book Synopsis Principles of Electron Optics, Volume 3 by : Peter W. Hawkes
Download or read book Principles of Electron Optics, Volume 3 written by Peter W. Hawkes and published by Academic Press. This book was released on 2022-02-21 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster
Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques
Book Synopsis Surface Microscopy with Low Energy Electrons by : Ernst Bauer
Download or read book Surface Microscopy with Low Energy Electrons written by Ernst Bauer and published by Springer. This book was released on 2014-07-10 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Book Synopsis Kinetics of Ordering and Growth at Surfaces by : Max G. Lagally
Download or read book Kinetics of Ordering and Growth at Surfaces written by Max G. Lagally and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 519 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the papers presented at the NATO Advanced Research Workshop on "Kinetics of Ordering and Growth at Surfaces", held in Acquafredda di Maratea, Italy, September 18-22, 1989. The workshop's goal was to bring together theorists and experimentalists from two related fields, surface science and thin-film growth, to highlight their common interests and overcome a lack of communication between these two communities. Typically surface scientists are only concerned with the microscopic (atomic) description of solids within one monolayer of the surface. Thin-film growers are usually considered more empirical in their approach, concerned primarily with the "quality of their product", and have not necessarily found it useful to incorporate surface science understanding into their art. This workshop aimed to counter at least in some measure these stereotypes. Its focus was on generating dialogue on the fundamental structural and kinetic processes that lead to the initial stages of film growth, from both the surface science and crystal growth perspectives. To achieve this, alternate days emphasized the view of surface science and thin-film growth, with considerable time for discussion, a format that appeared to succeed well. The success of the workshop is in large measure due to the efforts of the organizing committee, L. C. Feldman, P. K. Larsen, J. A. Venables, and J. Villain, whose advice on the constitution of the program was invaluable.
Book Synopsis Surface Characterization by : Dag Brune
Download or read book Surface Characterization written by Dag Brune and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 715 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Surface Characterization" provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribological, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included. "Surface Characterization" is addressed to both academic and industrial audiences. Scientists and engineers working on the production and development of new materials will find it an invaluable reference source. Physicist, chemists, chemical engineers, material scientists and engineers from every area of materials research will benefit from the wealth of practical advice the book provides.
Book Synopsis Electron Microscopy by : S. Amelinckx
Download or read book Electron Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 527 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Download or read book Magnetic Domains written by Alex Hubert and published by Springer Science & Business Media. This book was released on 2008-10-10 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book offers systematic and up-to-date treatment of the whole area of magnetic domains. It contains many contributions that have not been published before. The comprehensive survey of this important area gives a good introduction to students and is also interesting to researchers.
Download or read book Physical Structure written by and published by Elsevier. This book was released on 1996-12-06 with total page 881 pages. Available in PDF, EPUB and Kindle. Book excerpt: The primary goal of this book is to summarize the current level of accumulated knowledge about the physical structure of solid surfaces with emphasis on well-defined surfaces at the gas-solid and vacuum-solid interfaces. The intention is not only to provide a standard reference for practitioners, but also to provide a good starting point for scientists who are just entering the field. The presentation in most of the chapters therefore assumes that the typical reader will have a good undergraduate background in chemistry, physics, or materials science. At the same time, coverage is comprehensive and at a high technical level with emphasis on fundamental physical principles. This first volume in a new series is appropriately devoted to the physical structure of surfaces, knowledge of which will be essential for a complete understanding of electronic properties and dynamical processes, the topics of the next two volumes in the series. The volume is divided into four parts. Part I describes the equilibrium properties of surfaces with emphasis on clean surfaces of bulk materials. Part II provides an introduction to some of the primary experimental methods that are used to determine surface crystal structures. Part III gives an overview of the vast topic of the structure of adsorbed layers. The concluding Part IV deals with the topics of defects in surface structures and phase transitions.
Author :Karl Wolfgang Böer Publisher :Springer Science & Business Media ISBN 13 :9780442006723 Total Pages :1496 pages Book Rating :4.0/5 (67 download)
Book Synopsis Survey of Semiconductor Physics by : Karl Wolfgang Böer
Download or read book Survey of Semiconductor Physics written by Karl Wolfgang Böer and published by Springer Science & Business Media. This book was released on 1990 with total page 1496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Taking up where the first volume left off, this work provides coverage of the inhomogeneous semiconductor. It deals mainly with Si and GaAs, but also investigates other materials of theoretical and practical interest, such as Ge, other III-V and II-VI compounds, and amorphous SiH. Equipped with this source, physicists, semiconductor engineers, device engineers and fabrication engineers will have access to a vast reservoir of practical information on the design, production and operations of semiconductor devices.
Book Synopsis Survey of Semiconductor Physics by : Karl W. Böer
Download or read book Survey of Semiconductor Physics written by Karl W. Böer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 1477 pages. Available in PDF, EPUB and Kindle. Book excerpt: Any book that covers a large variety of subjects and is written by one author lacks by necessity the depth provided by an expert in his or her own field of specialization. This book is no exception. It has been written with the encouragement of my students and colleagues, who felt that an extensive card file I had accumulated over the years of teaching solid state and semiconductor physics would be helpful to more than just a few of us. This file, updated from time to time, contained lecture notes and other entries that were useful in my research and permitted me to give to my students a broader spectrum of information than is available in typical textbooks. When assembling this material into a book, I divided the top ics into material dealing with the homogeneous semiconductor, the subject of the previously published Volume 1, and the inhomoge neous semiconductor, the subject of this Volume 2. In order to keep the book to a manageable size, sections of tutorial character which can be used as text for a graduate level class had to be interwoven with others written in shorter, reference style. The pointers at the right-hand page header will assist in distinguishing the more diffi cult reference parts of the book (with the pointer to the right) from the more easy-to-read basic educational sections (with the pointer tending to the left).
