Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Download Structural Imperfections In Silicon P N Junctions full books in PDF, epub, and Kindle. Read online Structural Imperfections In Silicon P N Junctions ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Author :
Publisher :
ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (947 download)
Download or read book Structural Imperfections in Silicon P-n Junctions written by and published by . This book was released on 1963 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : H. Queisser
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (947 download)
Download or read book Structural Imperfections in Silicon P-n Junctions written by H. Queisser and published by . This book was released on 1961 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Goetzberger
Publisher :
ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (947 download)
Download or read book Structural Imperfections in Silicon P-n Junctions written by A. Goetzberger and published by . This book was released on 1961 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : V. I. Talanin
Publisher : Cambridge Scholars Publishing
ISBN 13 : 152752342X
Total Pages : 281 pages
Book Rating : 4.5/5 (275 download)
Download or read book The Formation of Structural Imperfections in Semiconductor Silicon written by V. I. Talanin and published by Cambridge Scholars Publishing. This book was released on 2018-12-14 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today, it is difficult to imagine all spheres of human activity without personal computers, solid-state electronic devices, micro- and nanoelectronics, photoconverters, and mobile communication devices. The basic material of modern electronics and for all of these industries is semiconductor silicon. Its properties and applications are determined by defects in its crystal structure. However, until now, there has been no complete and reliable description of the creation and transformation of such a defective structure. This book solves this mystery through two different approaches to semiconductor silicon: the classical and the probabilistic. This book brings together, for the first time, all existing experimental and theoretical information on the internal structure of semiconductor silicon. It will appeal to a wide range of readers, from materials scientists and practical engineers to students.
Author :
Publisher :
ISBN 13 :
Total Pages : 484 pages
Book Rating : 4.3/5 (91 download)
Download or read book NBS Special Publication written by and published by . This book was released on 1970 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : James H. Crawford
Publisher : Springer Science & Business Media
ISBN 13 : 1468409042
Total Pages : 494 pages
Book Rating : 4.4/5 (684 download)
Download or read book Point Defects in Solids written by James H. Crawford and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume 1 of Point Defects in Solids has as its major emphasis defects in ionic solids. Volume 2 now extends this emphasis to semiconductors. The first four chapters treat in some detail the creation, kinetic behavior, inter actions, and physical properties of both simple and composite defects in a variety of semiconducting systems. Also included, as in Vol. 1, are chapters on special topics, namely phonon-defect interactions and defects in organic crystals. Defect behavior in semiconductors has been a subject of considerable interest since the discovery some twenty-five years ago that fast neutron irradiation profoundly affected the electrical characteristics of germanium and silicon. Present-day interest has been stimulated by such semiconductor applications as solar cell power plants for space stations and satellites and semiconductor particle and y-ray detectors, since in both radiation damage can cause serious deterioration. Of even greater practical concern is the need to understand particle damage in order to capitalize upon the develop ing technique of ion implantation as a means of device fabrication. Although the periodic international conferences on radiation effects in semiconductors have served the valuable function of summarizing the extensive work being done in this field, these proceedings are much too detailed and lack the background discussion needed to make them useful to the novice.
Author : Peter Pichler
Publisher : Springer Science & Business Media
ISBN 13 : 3709105978
Total Pages : 576 pages
Book Rating : 4.7/5 (91 download)
Download or read book Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon written by Peter Pichler and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Author : United States. National Aeronautics and Space Administration
Publisher :
ISBN 13 :
Total Pages : 1100 pages
Book Rating : 4.3/5 (126 download)
Download or read book Technical Publications Announcements with Indexes written by United States. National Aeronautics and Space Administration and published by . This book was released on 1962 with total page 1100 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : K. V. Ravi
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 408 pages
Book Rating : 4.3/5 (91 download)
Download or read book Imperfections and Impurities in Semiconductor Silicon written by K. V. Ravi and published by John Wiley & Sons. This book was released on 1981 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 40 pages
Book Rating : 4.:/5 (31 download)
Download or read book Planar Test Structures for Characterizing Impurities in Silicon written by and published by . This book was released on 1976 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 712 pages
Book Rating : 4.3/5 (243 download)
Download or read book U.S. Government Research Reports written by and published by . This book was released on 1964 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Giorgio Benedek
Publisher : Springer Science & Business Media
ISBN 13 : 1468457098
Total Pages : 286 pages
Book Rating : 4.4/5 (684 download)
Download or read book Point and Extended Defects in Semiconductors written by Giorgio Benedek and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.
Author : Victor A. Perevostchikov
Publisher : Springer Science & Business Media
ISBN 13 : 3540294996
Total Pages : 400 pages
Book Rating : 4.5/5 (42 download)
Download or read book Gettering Defects in Semiconductors written by Victor A. Perevostchikov and published by Springer Science & Business Media. This book was released on 2005-12-12 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.
Author : Peter A. Barnes
Publisher :
ISBN 13 :
Total Pages : 552 pages
Book Rating : 4.:/5 (318 download)
Download or read book Semiconductor Characterization Techniques written by Peter A. Barnes and published by . This book was released on 1978 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Morton E. Goldberg
Publisher :
ISBN 13 :
Total Pages : 696 pages
Book Rating : 4.:/5 (318 download)
Download or read book Physics of Failure in Electronics written by Morton E. Goldberg and published by . This book was released on 1965 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 716 pages
Book Rating : 4.E/5 ( download)
Download or read book U.S. Government Research Reports written by and published by . This book was released on 1964 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Aeronautics and Space Administration
Publisher :
ISBN 13 :
Total Pages : 720 pages
Book Rating : 4.:/5 (318 download)
Download or read book Guide to Annual Subject Index for Technical Publications Announcements, Apr.-Dec. 1962 written by United States. National Aeronautics and Space Administration and published by . This book was released on 1962 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt:
