Soft Errors In Modern Electronic Systems

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Soft Errors in Modern Electronic Systems

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1441969934
Total Pages : 331 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis

Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Soft Error Reliability of VLSI Circuits

Author : Behnam Ghavami
Publisher : Springer Nature
ISBN 13 : 3030516105
Total Pages : 114 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability of VLSI Circuits by : Behnam Ghavami

Download or read book Soft Error Reliability of VLSI Circuits written by Behnam Ghavami and published by Springer Nature. This book was released on 2020-10-13 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 1351831550
Total Pages : 439 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 439 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Author : Ronald D Schrimpf
Publisher : World Scientific
ISBN 13 : 9814482153
Total Pages : 349 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices by : Ronald D Schrimpf

Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 146659084X
Total Pages : 432 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Dependability in Electronic Systems

Author : Nobuyasu Kanekawa
Publisher : Springer
ISBN 13 : 9781441967145
Total Pages : 204 pages
Book Rating : 4.9/5 (671 download)

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Book Synopsis Dependability in Electronic Systems by : Nobuyasu Kanekawa

Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer. This book was released on 2010-11-24 with total page 204 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

Soft Error Reliability Using Virtual Platforms

Author : Felipe Rocha da Rosa
Publisher : Springer Nature
ISBN 13 : 3030557049
Total Pages : 142 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability Using Virtual Platforms by : Felipe Rocha da Rosa

Download or read book Soft Error Reliability Using Virtual Platforms written by Felipe Rocha da Rosa and published by Springer Nature. This book was released on 2020-11-02 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

FPGAs and Parallel Architectures for Aerospace Applications

Author : Fernanda Kastensmidt
Publisher : Springer
ISBN 13 : 3319143522
Total Pages : 319 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis FPGAs and Parallel Architectures for Aerospace Applications by : Fernanda Kastensmidt

Download or read book FPGAs and Parallel Architectures for Aerospace Applications written by Fernanda Kastensmidt and published by Springer. This book was released on 2015-12-07 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 800 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Design and Applications of Emerging Computer Systems

Author : Weiqiang Liu
Publisher : Springer Nature
ISBN 13 : 3031424786
Total Pages : 745 pages
Book Rating : 4.0/5 (314 download)

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Book Synopsis Design and Applications of Emerging Computer Systems by : Weiqiang Liu

Download or read book Design and Applications of Emerging Computer Systems written by Weiqiang Liu and published by Springer Nature. This book was released on with total page 745 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Numerical Simulation

Author : Mykhaylo Andriychuk
Publisher : BoD – Books on Demand
ISBN 13 : 9535107496
Total Pages : 662 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis Numerical Simulation by : Mykhaylo Andriychuk

Download or read book Numerical Simulation written by Mykhaylo Andriychuk and published by BoD – Books on Demand. This book was released on 2012-09-19 with total page 662 pages. Available in PDF, EPUB and Kindle. Book excerpt: Numerical Simulation - from Theory to Industry is the edited book containing 25 chapters and divided into four parts. Part 1 is devoted to the background and novel advances of numerical simulation; second part contains simulation applications in the macro- and micro-electrodynamics. Part 3 includes contributions related to fluid dynamics in the natural environment and scientific applications; the last, fourth part is dedicated to simulation in the industrial areas, such as power engineering, metallurgy and building. Recent numerical techniques, as well as software the most accurate and advanced in treating the physical phenomena, are applied in order to explain the investigated processes in terms of numbers. Since the numerical simulation plays a key role in both theoretical and industrial research, this book related to simulation of many physical processes, will be useful for the pure research scientists, applied mathematicians, industrial engineers, and post-graduate students.

Microelectronics, Circuits and Systems

Author : Abhijit Biswas
Publisher : Springer Nature
ISBN 13 : 9811615705
Total Pages : 251 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Microelectronics, Circuits and Systems by : Abhijit Biswas

Download or read book Microelectronics, Circuits and Systems written by Abhijit Biswas and published by Springer Nature. This book was released on 2021-08-03 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a collection of peer-reviewed articles from the 7th International Conference on Microelectronics, Circuits, and Systems – Micro 2020. The volume covers the latest development and emerging research topics of material sciences, devices, microelectronics, circuits, nanotechnology, system design and testing, simulation, sensors, photovoltaics, optoelectronics, and its different applications. This book also deals with several tools and techniques to match the theme of the conference. It will be a valuable resource for researchers, professionals, Ph.D. scholars, undergraduate and postgraduate students working in Electronics, Microelectronics, Electrical, and Computer Engineering.

Applied Informatics and Cybernetics in Intelligent Systems

Author : Radek Silhavy
Publisher : Springer Nature
ISBN 13 : 3030519740
Total Pages : 650 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Applied Informatics and Cybernetics in Intelligent Systems by : Radek Silhavy

Download or read book Applied Informatics and Cybernetics in Intelligent Systems written by Radek Silhavy and published by Springer Nature. This book was released on 2020-08-07 with total page 650 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers the refereed proceedings of the Applied Informatics and Cybernetics in Intelligent Systems Section of the 9th Computer Science On-line Conference 2020 (CSOC 2020), held on-line in April 2020. Modern cybernetics and computer engineering in connection with intelligent systems are an essential aspect of ongoing research. This book addresses these topics, together with automation and control theory, cybernetic applications, and the latest research trends.

Advances in Dependability Engineering of Complex Systems

Author : Wojciech Zamojski
Publisher : Springer
ISBN 13 : 331959415X
Total Pages : 488 pages
Book Rating : 4.3/5 (195 download)

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Book Synopsis Advances in Dependability Engineering of Complex Systems by : Wojciech Zamojski

Download or read book Advances in Dependability Engineering of Complex Systems written by Wojciech Zamojski and published by Springer. This book was released on 2017-05-29 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers the proceedings of the 2017 DepCoS-RELCOMEX, an annual conference series that has been organized by the Department of Computer Engineering at the Faculty of Electronics, Wrocław University of Science and Technology, since 2006. Its mission is to continue the heritage of the other two cycles of events – the RELCOMEX conferences (1977–89) and Microcomputer Schools (1985–95) – so this year we can celebrate the 40th anniversary of its origins. In contrast to those preceding series, which were focused on conventional reliability analysis, the goal of DepCoS is to promote a more comprehensive approach to system performability, which is now commonly called dependability. This innovative research area provides answers to the latest challenges in reliability evaluation for contemporary complex systems. Its novelty is based on a multi-disciplinary approach to system theory, technology and maintenance of systems operating in real environments. Dependability analyses concentrate on the efficient completion of tasks, services and jobs by a system considered as a combination of technical, information and human assets, in contrast to “classical” reliability, which is generally limited to the analysis of technical resources and associated components and structures. The selection of papers for this volume illustrates the diversity of topics that need to be considered, from mathematical models and design methodologies through software engineering and data security issues, to practical engineering problems in technical systems. In addition, this edition of the conference hosted the 7th CrISS-DESSERT Workshop, which was devoted to the analysis and assurance of safety and cyber security in critical infrastructure and computer systems.

Resilient Computer System Design

Author : Victor Castano
Publisher : Springer
ISBN 13 : 3319150693
Total Pages : 271 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis Resilient Computer System Design by : Victor Castano

Download or read book Resilient Computer System Design written by Victor Castano and published by Springer. This book was released on 2015-04-15 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.

Rad-hard Semiconductor Memories

Author : Cristiano Calligaro
Publisher : CRC Press
ISBN 13 : 1000793060
Total Pages : 417 pages
Book Rating : 4.0/5 (7 download)

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Book Synopsis Rad-hard Semiconductor Memories by : Cristiano Calligaro

Download or read book Rad-hard Semiconductor Memories written by Cristiano Calligaro and published by CRC Press. This book was released on 2022-09-01 with total page 417 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components. Technical topics discussed in the book include:  Radiation effects on semiconductor components (TID, SEE) Radiation Hardening by Design (RHBD) Techniques Rad-hard SRAMs Rad-hard PROMs Rad-hard Flash NVMs Rad-hard ReRAMs Rad-hard emerging technologies

Radiation Tolerant Electronics

Author : Paul Leroux
Publisher : MDPI
ISBN 13 : 3039212796
Total Pages : 210 pages
Book Rating : 4.0/5 (392 download)

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Book Synopsis Radiation Tolerant Electronics by : Paul Leroux

Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.