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Small Angle X Ray Scattering Studies Of Microvoids In Amorphous Silicon Based Semiconductors
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Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors by : D. L. Williamson
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors written by D. L. Williamson and published by . This book was released on 1994 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors by : D. L. Williamson
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors written by D. L. Williamson and published by . This book was released on 1994 with total page 49 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors. Annual Subcontract Report, 1 February 1992--31 January 1993 by :
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors. Annual Subcontract Report, 1 February 1992--31 January 1993 written by and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes work to provide now details of the microstructure for the size scale from about 1 nm to 30 nm in high-quality a-Si:H and related alloys prepared by current state-of-the-art deposition methods as well as by now and emerging deposition technologies to help determine the role of microvoids and other density fluctuations in controlling the opto-electronic properties. The objectives are to determine whether the presence of microstructure as detected by small-angle X-ray scattering (SAXS) (1) limits the photovoltaic (PV) properties of device-quality a-Si:H; (2) plays a role in determine the photostability of a-Si:H; and (3) is responsible for degradation of the PV properties due to alloying with Ge, C, and other constituents. We collaborated with several groups that can supply relevant systematic sets of samples and the associated opto-electronic data to help address these issues. The project also included developing a method to standardize the procedures, minimize substrate influences, and implement improved data reduction and modeling methodology.
Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors. Annual Subcontract Report, February 1, 1992--January 31, 1993 by :
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors. Annual Subcontract Report, February 1, 1992--January 31, 1993 written by and published by . This book was released on 1994 with total page 50 pages. Available in PDF, EPUB and Kindle. Book excerpt: Our general objectives are to provide new details of the microstructure for the size scale from about 1 to 30 nm in high-quality a-Si:H and related alloys prepared by current state-of-the-art deposition methods as well as by new and emerging deposition technologies and thereby help determine the role of microvoids and other density fluctuations in controlling the opto-electronic properties. More specifically, the objectives are to determine whether the presence of microstructure as detected by small-angle x-ray scattering (SAXS) (1) limits the photovoltaic properties of device-quality a-Si:H, (2) plays a role in determining the photo-stability of a-Si:H, and (3) is responsible for degradation of the photovoltaic properties due to alloying with Ge, C and other constituents. The approach involves collaboration with several groups that can supply relevant systematic sets of samples and the associated opto-electronic data to help address these issues. Since the SAXS technique has not been a standard characterization technique for thin-film materials, and was recently set up at CSM with support by NREL, the project involves considerable development of the method with regard to standardizing the procedures, minimizing substrate influences and implementing improved data reduction and modeling methodology. Precise, highly reproducible, and accurate results are being sought in order to allow useful, reliable, and sensitive comparisons of materials deposited under different conditions, by different methods, and by different systems that represent the same nominal method.
Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors. Final Subcontract Report, 1 February 1991--31 January 1994 by :
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous-silicon-based Semiconductors. Final Subcontract Report, 1 February 1991--31 January 1994 written by and published by . This book was released on 1994 with total page 41 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes work performed to provide new details of the microstructure for the size scale from about 1 nm to 30 nm in high-quality hydrogenated amorphous-silicon and related alloys prepared by current state-of-the-art deposition methods as well as by new and emerging deposition technologies. The purpose of this work is to help determine the role of microvoids and other density fluctuations in controlling the opto-electronic and photovoltaic properties. The approach involved collaboration with several groups that supplied relevant systematic sets of samples and the associated opto-electronic/photovoltaic data to help address particular issues. The small-angle X-ray scattering (SAXS) technique, as developed during this project, was able to provide microstructural information with a high degree of sensitivity not available from other methods. It is particularly sensitive to microvoids or H-rich microdomains and to the presence of oriented microstructures. The latter is readily associated with columnar-type growth and can even be observed in premature stages not detectable by transmission electron microscopy. Flotation density measurements provided important complementary data. Systematic correlations demonstrated that material with more SAXS-detected microstructure has to-electronic and photovoltaic properties and increased degradation under light soaking. New results related to alloy randomness emerged from our ability to measure the difffuse scattering component of the SAXS.
Book Synopsis Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors by : D. L. Williamson
Download or read book Small-angle X-ray Scattering Studies of Microvoids in Amorphous Silicon-based Semiconductors written by D. L. Williamson and published by . This book was released on 1994 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Our general objectives are to provide new details of the microstructure for the size scale from about 1 to 30 nm in high-quality a-Si:H and related alloys prepared by current state-of-the-art deposition methods as well as by new and emerging deposition technologies and thereby help determine the role of microvoids and other density fluctuations in controlling the opto-electronic properties.
Download or read book Energy Research Abstracts written by and published by . This book was released on 1995 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Government Reports Annual Index by :
Download or read book Government Reports Annual Index written by and published by . This book was released on 1994 with total page 1690 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Government Reports Announcements & Index by :
Download or read book Government Reports Announcements & Index written by and published by . This book was released on 1995 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray Scattering From Semiconductors (2nd Edition) by : Paul F Fewster
Download or read book X-ray Scattering From Semiconductors (2nd Edition) written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Download or read book Physics Briefs written by and published by . This book was released on 1994 with total page 1248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Anomalous Small Angle X-ray Scattering Studies of Amorphous Metal-germanium Alloys by : Marybeth Rice
Download or read book Anomalous Small Angle X-ray Scattering Studies of Amorphous Metal-germanium Alloys written by Marybeth Rice and published by . This book was released on 1994 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Anomalous Small-angle X-ray Scattering Studies of Phase Separation in Bulk Amorphous by :
Download or read book Anomalous Small-angle X-ray Scattering Studies of Phase Separation in Bulk Amorphous written by and published by . This book was released on 2000 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Amorphous Silicon Technology, 1992 by : M. J. Thompson
Download or read book Amorphous Silicon Technology, 1992 written by M. J. Thompson and published by . This book was released on 1992 with total page 1274 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis International Aerospace Abstracts by :
Download or read book International Aerospace Abstracts written by and published by . This book was released on 1990 with total page 944 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Monumenta Corbeiensia ... written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
