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Author : Sharp Corporation
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (96 download)
Download or read book Semiconductor Reliability Handbook written by Sharp Corporation and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Shāpu Kabushiki Kaisha
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (343 download)
Download or read book Sharp Semiconductor Reliability Handbook written by Shāpu Kabushiki Kaisha and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Osamu Ueda
Publisher : Springer Science & Business Media
ISBN 13 : 1461443377
Total Pages : 618 pages
Book Rating : 4.4/5 (614 download)
Download or read book Materials and Reliability Handbook for Semiconductor Optical and Electron Devices written by Osamu Ueda and published by Springer Science & Business Media. This book was released on 2012-09-22 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author : Yoshio Nishi
Publisher : CRC Press
ISBN 13 : 1351829823
Total Pages : 3276 pages
Book Rating : 4.3/5 (518 download)
Download or read book Handbook of Semiconductor Manufacturing Technology written by Yoshio Nishi and published by CRC Press. This book was released on 2017-12-19 with total page 3276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.0/5 ( download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 275 pages
Book Rating : 4.:/5 (19 download)
Download or read book Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (462 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 281 pages
Book Rating : 4.:/5 (639 download)
Download or read book The Reliability Handbook written by and published by . This book was released on 1987 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation (U.S.). Military/Aerospace Products Division
Publisher :
ISBN 13 :
Total Pages : 281 pages
Book Rating : 4.:/5 (12 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation (U.S.). Military/Aerospace Products Division and published by . This book was released on 1986 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Intel Corporation
Publisher :
ISBN 13 :
Total Pages : 276 pages
Book Rating : 4.:/5 (45 download)
Download or read book Components Quality/reliability Handbook written by Intel Corporation and published by . This book was released on 1985 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Intel Staff
Publisher :
ISBN 13 : 9781555120467
Total Pages : 288 pages
Book Rating : 4.1/5 (24 download)
Download or read book Components Quality-Reliability Handbook written by Intel Staff and published by . This book was released on 1989-01-01 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Christopher L. Henderson
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (83 download)
Download or read book Semiconductor Reliability Manual written by Christopher L. Henderson and published by . This book was released on 2001 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 890 pages
Book Rating : 4.E/5 ( download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 800 pages
Book Rating : 4.:/5 (116 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Peter W. Epperlein
Publisher : John Wiley & Sons
ISBN 13 : 1118481860
Total Pages : 522 pages
Book Rating : 4.1/5 (184 download)
Download or read book Semiconductor Laser Engineering, Reliability and Diagnostics written by Peter W. Epperlein and published by John Wiley & Sons. This book was released on 2013-01-25 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author : Santa Clara NATIONAL SEMICONDUCTOR CORPORATION (CA, Estados Unidos)
Publisher :
ISBN 13 :
Total Pages : 286 pages
Book Rating : 4.:/5 (71 download)
Download or read book The Reliability Handbook written by Santa Clara NATIONAL SEMICONDUCTOR CORPORATION (CA, Estados Unidos) and published by . This book was released on 1982 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and the die; Reliability and internal construction; MIL-STD-883; MIL-M-38510; Reliability and the hybrid device; Reliability and VLSI/VHSIC devices; Reliability and the radiation environment; Reliability and the discrete device; Reliability and standardization; Quality assurance and reliability engineering; reliability and documentation; Reliability and the commercial grade device; European reliability programs; Reliability and the cost of semiconductor; The total military/aerospace standadization program; 883B/RETS tm products from National Semiconductor; 883S/RETS tm products from National Semicondutor; 883S/RETS tm hybrids from national semiconductor; MIL-M-38510 class B products from National Semiconductor; Radiation hardened technology from National Semiconductor; Military leadless chip carriers from National Semiconductor; Appendix: Wafer fabrication; Semiconductor assembly and packaging; Glossary of terms; Key governement agencies; AN/NUMBERS and acronyms; Bibbliography; MIL-M-38510 cross reference.
Author : Automotive Electronic Systems Reliability Standards
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (137 download)
Download or read book Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications written by Automotive Electronic Systems Reliability Standards and published by . This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook.Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defects in component manufacturing and product use it is strongly recommended to apply this handbook. If it gets adopted as a standard, the term "shall" will represent a binding requirement.This document does not relieve the supplier of the responsibility to assure that a product meets the complete set of its requirements. Error and issue corrections with latest state of art updates.
