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Author : Christopher L. Henderson
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (83 download)
Download or read book Semiconductor Reliability Manual written by Christopher L. Henderson and published by . This book was released on 2001 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zhenghao Gan
Publisher : McGraw Hill Professional
ISBN 13 : 007175427X
Total Pages : 624 pages
Book Rating : 4.0/5 (717 download)
Download or read book Semiconductor Process Reliability in Practice written by Zhenghao Gan and published by McGraw Hill Professional. This book was released on 2012-10-10 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proven processes for ensuring semiconductor device reliability Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics and theory. The book covers initial specification definition, test structure design, analysis of test structure data, and final qualification of the process. Real-world examples of test structure designs to qualify front-end-of-line devices and back-end-of-line interconnects are provided in this practical, comprehensive guide. Coverage includes: Basic device physics Process flow for MOS manufacturing Measurements useful for device reliability characterization Hot carrier injection Gate-oxide integrity (GOI) and time-dependent dielectric breakdown (TDDB) Negative bias temperature instability Plasma-induced damage Electrostatic discharge protection of integrated circuits Electromigration Stress migration Intermetal dielectric breakdown
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 890 pages
Book Rating : 4.E/5 ( download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Christou
Publisher : Springer Science & Business Media
ISBN 13 : 9400924828
Total Pages : 571 pages
Book Rating : 4.4/5 (9 download)
Download or read book Semiconductor Device Reliability written by A. Christou and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 571 pages. Available in PDF, EPUB and Kindle. Book excerpt: This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 286 pages
Book Rating : 4.:/5 (833 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael Pecht
Publisher : CRC Press
ISBN 13 : 1351443569
Total Pages : 228 pages
Book Rating : 4.3/5 (514 download)
Download or read book Guidebook for Managing Silicon Chip Reliability written by Michael Pecht and published by CRC Press. This book was released on 2017-11-22 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 275 pages
Book Rating : 4.:/5 (19 download)
Download or read book Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1979 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Santa Clara NATIONAL SEMICONDUCTOR CORPORATION (CA, Estados Unidos)
Publisher :
ISBN 13 :
Total Pages : 286 pages
Book Rating : 4.:/5 (71 download)
Download or read book The Reliability Handbook written by Santa Clara NATIONAL SEMICONDUCTOR CORPORATION (CA, Estados Unidos) and published by . This book was released on 1982 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and the die; Reliability and internal construction; MIL-STD-883; MIL-M-38510; Reliability and the hybrid device; Reliability and VLSI/VHSIC devices; Reliability and the radiation environment; Reliability and the discrete device; Reliability and standardization; Quality assurance and reliability engineering; reliability and documentation; Reliability and the commercial grade device; European reliability programs; Reliability and the cost of semiconductor; The total military/aerospace standadization program; 883B/RETS tm products from National Semiconductor; 883S/RETS tm products from National Semicondutor; 883S/RETS tm hybrids from national semiconductor; MIL-M-38510 class B products from National Semiconductor; Radiation hardened technology from National Semiconductor; Military leadless chip carriers from National Semiconductor; Appendix: Wafer fabrication; Semiconductor assembly and packaging; Glossary of terms; Key governement agencies; AN/NUMBERS and acronyms; Bibbliography; MIL-M-38510 cross reference.
Author : Intel Corporation
Publisher :
ISBN 13 :
Total Pages : 276 pages
Book Rating : 4.:/5 (45 download)
Download or read book Components Quality/reliability Handbook written by Intel Corporation and published by . This book was released on 1985 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (633 download)
Download or read book Semiconductor Reliability written by United States and published by . This book was released on 1961 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 480 pages
Book Rating : 4.0/5 ( download)
Download or read book Electronic Reliability Design Handbook written by and published by . This book was released on 1984 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation (U.S.). Military/Aerospace Products Division
Publisher :
ISBN 13 :
Total Pages : 281 pages
Book Rating : 4.:/5 (12 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation (U.S.). Military/Aerospace Products Division and published by . This book was released on 1986 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Corporation
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (462 download)
Download or read book The Reliability Handbook written by National Semiconductor Corporation and published by . This book was released on 1982 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Automotive Electronic Systems Reliability Standards
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (137 download)
Download or read book Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications written by Automotive Electronic Systems Reliability Standards and published by . This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook.Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defects in component manufacturing and product use it is strongly recommended to apply this handbook. If it gets adopted as a standard, the term "shall" will represent a binding requirement.This document does not relieve the supplier of the responsibility to assure that a product meets the complete set of its requirements. Error and issue corrections with latest state of art updates.
Author : Shāpu Kabushiki Kaisha
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (343 download)
Download or read book Sharp Semiconductor Reliability Handbook written by Shāpu Kabushiki Kaisha and published by . This book was released on 1991 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Friedrich Beck
Publisher : John Wiley & Sons
ISBN 13 : 9780471974017
Total Pages : 198 pages
Book Rating : 4.9/5 (74 download)
Download or read book Integrated Circuit Failure Analysis written by Friedrich Beck and published by John Wiley & Sons. This book was released on 1998-02-04 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt: Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.
Author : Sharp Corporation
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (96 download)
Download or read book Semiconductor Reliability Handbook written by Sharp Corporation and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
