Secondary Ion Mass Spectroscopy Of Solid Surfaces

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Secondary Ion Mass Spectroscopy of Solid Surfaces

Author : V. T. Cherepin
Publisher : CRC Press
ISBN 13 : 1466563737
Total Pages : 150 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Secondary Ion Mass Spectroscopy of Solid Surfaces by : V. T. Cherepin

Download or read book Secondary Ion Mass Spectroscopy of Solid Surfaces written by V. T. Cherepin and published by CRC Press. This book was released on 2020-04-28 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Author : Sarah Fearn
Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681740885
Total Pages : 67 pages
Book Rating : 4.6/5 (817 download)

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Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn

Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Secondary Ion Mass Spectrometry

Author : J. C. Vickerman
Publisher : Oxford University Press, USA
ISBN 13 :
Total Pages : 368 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Secondary Ion Mass Spectrometry by : J. C. Vickerman

Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.

ToF-SIMS

Author : J. C. Vickerman
Publisher : IM Publications
ISBN 13 : 1906715173
Total Pages : 742 pages
Book Rating : 4.9/5 (67 download)

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Book Synopsis ToF-SIMS by : J. C. Vickerman

Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Secondary Ion Mass Spectrometry

Author : Paul van der Heide
Publisher : John Wiley & Sons
ISBN 13 : 1118916778
Total Pages : 412 pages
Book Rating : 4.1/5 (189 download)

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Book Synopsis Secondary Ion Mass Spectrometry by : Paul van der Heide

Download or read book Secondary Ion Mass Spectrometry written by Paul van der Heide and published by John Wiley & Sons. This book was released on 2014-08-19 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Secondary Ion Mass Spectrometry

Author : Fred Stevie
Publisher : Momentum Press
ISBN 13 : 1606505890
Total Pages : 233 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis Secondary Ion Mass Spectrometry by : Fred Stevie

Download or read book Secondary Ion Mass Spectrometry written by Fred Stevie and published by Momentum Press. This book was released on 2015-09-15 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Ion Spectroscopies for Surface Analysis

Author : Alvin W. Czanderna
Publisher : Springer Science & Business Media
ISBN 13 : 1461537088
Total Pages : 479 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Ion Spectroscopies for Surface Analysis by : Alvin W. Czanderna

Download or read book Ion Spectroscopies for Surface Analysis written by Alvin W. Czanderna and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.

Smaller Chemical Analysis

Author : George S. Newth
Publisher :
ISBN 13 :
Total Pages : 164 pages
Book Rating : 4.A/5 ( download)

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Book Synopsis Smaller Chemical Analysis by : George S. Newth

Download or read book Smaller Chemical Analysis written by George S. Newth and published by . This book was released on 1906 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Secondary Ion Mass Spectrometry

Author : Robert G. Wilson
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 392 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Secondary Ion Mass Spectrometry by : Robert G. Wilson

Download or read book Secondary Ion Mass Spectrometry written by Robert G. Wilson and published by Wiley-Interscience. This book was released on 1989-11-16 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.

Ambient Ionization Mass Spectrometry

Author : Marek Domin
Publisher : Royal Society of Chemistry
ISBN 13 : 1849739269
Total Pages : 528 pages
Book Rating : 4.8/5 (497 download)

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Book Synopsis Ambient Ionization Mass Spectrometry by : Marek Domin

Download or read book Ambient Ionization Mass Spectrometry written by Marek Domin and published by Royal Society of Chemistry. This book was released on 2014-11-25 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ambient ionization has emerged as one of the hottest and fastest growing topics in mass spectrometry enabling sample analysis with minimal sample preparation. Introducing the subject and explaining the basic concepts and terminology, this book will provide a comprehensive, unique treatise devoted to the subject. Written by acknowledged experts, there are full descriptions on how new ionization techniques work, with an overview of their strengths, weaknesses and applications. This title will bring the reader right up to date, with both applications and theory, and will be suitable as a tutorial text for those starting in the field from a variety of disciplines.

Modern Techniques of Surface Science

Author : D. P. Woodruff
Publisher : Cambridge University Press
ISBN 13 : 9780521424981
Total Pages : 612 pages
Book Rating : 4.4/5 (249 download)

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Book Synopsis Modern Techniques of Surface Science by : D. P. Woodruff

Download or read book Modern Techniques of Surface Science written by D. P. Woodruff and published by Cambridge University Press. This book was released on 1994-03-03 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt: Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.

Encyclopedia of Tribology

Author : Q. Jane Wang
Publisher : Springer
ISBN 13 : 9780387928982
Total Pages : 4139 pages
Book Rating : 4.9/5 (289 download)

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Book Synopsis Encyclopedia of Tribology by : Q. Jane Wang

Download or read book Encyclopedia of Tribology written by Q. Jane Wang and published by Springer. This book was released on 2013-09-26 with total page 4139 pages. Available in PDF, EPUB and Kindle. Book excerpt: TRIBOLOGY – the study of friction, wear and lubrication – impacts almost every aspect of our daily lives. The Springer Encyclopedia of Tribology is an authoritative and comprehensive reference covering all major aspects of the science and engineering of tribology that are relevant to researchers across all engineering industries and related scientific disciplines. This is the first major reference that brings together the science, engineering and technological aspects of tribology of this breadth and scope in a single work. Developed and written by leading experts in the field, the Springer Encyclopedia of Tribology covers the fundamentals as well as advanced applications across material types, different length and time scales, and encompassing various engineering applications and technologies. Exciting new areas such as nanotribology, tribochemistry and biotribology have also been included. As a six-volume set, the Springer Encyclopedia of Tribology comprises 1630 entries written by authoritative experts in each subject area, under the guidance of an international panel of key researchers from academia, national laboratories and industry. With alphabetically-arranged entries, concept diagrams and cross-linking features, this comprehensive work provides easy access to essential information for both researchers and practicing engineers in the fields of engineering (aerospace, automotive, biomedical, chemical, electrical, and mechanical) as well as materials science, physics, and chemistry.

Research on Nitrification and Related Processes, Part A

Author : Martin G. Klotz
Publisher : Academic Press
ISBN 13 : 0123812941
Total Pages : 602 pages
Book Rating : 4.1/5 (238 download)

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Book Synopsis Research on Nitrification and Related Processes, Part A by : Martin G. Klotz

Download or read book Research on Nitrification and Related Processes, Part A written by Martin G. Klotz and published by Academic Press. This book was released on 2011-01-10 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: State-of-the-art update on methods and protocols dealing with the detection, isolation and characterization of macromolecules and their hosting organisms that facilitate nitrification and related processes in the nitrogen cycle as well as the challenges of doing so in very diverse environments. Provides state-of-the-art update on methods and protocols Deals with the detection, isolation and characterization of macromolecules and their hosting organisms Deals with the challenges of very diverse environments

Methods of Surface Analysis

Author : A.W. Czanderna
Publisher : Elsevier
ISBN 13 : 0444596453
Total Pages : 496 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis Methods of Surface Analysis by : A.W. Czanderna

Download or read book Methods of Surface Analysis written by A.W. Czanderna and published by Elsevier. This book was released on 2012-12-02 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid, the effect of the ion etching on generating an output signal of electrons, ions, or neutrals. The text also describes the effect of the residual gases in the vacuum environment. The book considers the influence of the sample geometry, of the type (metal, insulator, semiconductor, organic), and of the atomic number can have on surface analysis. The text describes in detail low energy ion scattering spectroscopy, X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectroscopy, and infrared reflection-absorption spectroscopy. The book can prove useful for researchers, technicians, and scientists whose works involve organic chemistry, analytical chemistry, and other related fields of chemistry, such as physical chemistry or inorganic chemistry.

Secondary Ion Mass Spectrometry: SIMS VII

Author : A. Benninghoven
Publisher : Wiley
ISBN 13 : 9780471927389
Total Pages : 992 pages
Book Rating : 4.9/5 (273 download)

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Book Synopsis Secondary Ion Mass Spectrometry: SIMS VII by : A. Benninghoven

Download or read book Secondary Ion Mass Spectrometry: SIMS VII written by A. Benninghoven and published by Wiley. This book was released on 1990-06-28 with total page 992 pages. Available in PDF, EPUB and Kindle. Book excerpt: Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.

Radiation in Art and Archeometry

Author : D.C. Creagh
Publisher : Elsevier
ISBN 13 : 0080540198
Total Pages : 519 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Radiation in Art and Archeometry by : D.C. Creagh

Download or read book Radiation in Art and Archeometry written by D.C. Creagh and published by Elsevier. This book was released on 2000-06-14 with total page 519 pages. Available in PDF, EPUB and Kindle. Book excerpt: /inca/publications/misc/creaghcov.htmAbout the cover This book contains twenty chapters covering a wide range of research in the fields of scientific conservation of art and archaeometry. The common thread is the use of radiation in these analyses. The term "radiation" is used in the widest possible sense. The book encompasses the use of electromagnetic radiation in its microwave, infrared, visible, ultraviolet, x ray and &ggr; ray forms and the use of particulate forms such as electrons, neutrons and charged particles for which the Planck's Law relation applies. In many cases there is an interplay between the two forms: for example, proton induced x ray emission (PIXE), secondary ion mass spectrometry (SIMS). As far as possible the chapters have been arranged in order of ascending particle energy. Thus it commences with the use of microwaves and finishes with the use of &ggr; rays. The authors were chosen on the basis of their expertise as practitioners of their particular field of study. This means that, for example, the mature fields of study such as the IR and UV study of paintings have been written by senior researchers, whereas for the emerging fields of synchrotron and neutron techniques the chapters have been written by talented researchers at the commencement of their careers.

Photoionization and Photo-Induced Processes in Mass Spectrometry

Author : Ralf Zimmermann
Publisher : John Wiley & Sons
ISBN 13 : 3527335102
Total Pages : 448 pages
Book Rating : 4.5/5 (273 download)

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Book Synopsis Photoionization and Photo-Induced Processes in Mass Spectrometry by : Ralf Zimmermann

Download or read book Photoionization and Photo-Induced Processes in Mass Spectrometry written by Ralf Zimmermann and published by John Wiley & Sons. This book was released on 2021-07-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides comprehensive coverage of laser-induced ionization processes for mass spectrometry analysis Drawing on the expertise of the leading academic and industrial research groups involved in the development of photoionization methods for mass spectrometry, this reference for analytical scientists covers both the theory and current applications of photo-induced ionization processes. It places widely used techniques such as MALDI side by side with more specialist approaches such as REMPI and RIMS, and discusses leading edge developments in ultrashort laser pulse desorption, to give readers a complete picture of the state of the technology. Photoionization and Photo-Induced Processes in Mass Spectrometry: Fundamentals and Applications starts with a complete overview of the fundamentals of the technique, covering the basics of the gas phase ionization as well as those of laser desorption and ablation, pulse photoionization, and single particle ionization. Numerous application examples from different analytical fields are described that showcase the power and the wide scope of photo ionization in mass spectrometry. -The first general reference book on photoionization techniques for mass spectrometry -Examines technologies and applications of gas phase resonance-enhanced multiphoton ionization mass spectrometry (REMPI-MS) and gas phase resonance ionization mass spectrometry (RIMS) -Provides complete coverage of popular techniques like MALDI -Discusses the current and potential applications of each technology, focusing on process and environmental analysis Photoionization and Photo-Induced Processes in Mass Spectrometry: Fundamentals and Applications is an excellent book for spectroscopists, analytical chemists, photochemists, physical chemists, and laser specialists.